MSLE
type: Ontology
comment: The current ontology describes Material Science Lab Equipment
version info: 1.1

EsB
type: Class
subclass of: Detectors
alternative label: Energy selective Backscattered
definition: The Energy selective Backscattered (EsB) Detector is suitable for clear compositional contrast. It is an annular shaped incolumn detector that is located above the In-lens detector. The ability to detect BSE makes sub-surface information and nano-scale composition visible.

SESI
type: Class
subclass of: Detectors
alternative label: Secondary Electrons Secondary Ions
definition: The Secondary Electrons Secondary Ions (SESI) Detector is a new type of detector available for Crossbeam workstations .This detector allows the acquisition of FIB secondary ion images or electron images.

Energy dispersive X-ray
type: Class
subclass of: X ray Spectrometer
disjoint with: Focused Ion Beam
disjoint with: Infrared Spectrometer
disjoint with: Light Microscope
disjoint with: Mass Spectrometer
disjoint with: Microscope
disjoint with: Microwave Spectrometer
disjoint with: Nuclear Magnetic Resonance Spectrometer
disjoint with: Raman Spectrometers
disjoint with: Scanning Coils
disjoint with: Single Beam
disjoint with: Single Beam Electron Microscope
disjoint with: Single Beam Ion
disjoint with: Software
disjoint with: Stage
disjoint with: Transmission Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: x-ray photoelectron Spectrometer
alternative label: EDX
definition: Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample.

Focused Ion Beam
type: Class
subclass of: Single Beam Ion
disjoint with: Infrared Spectrometer
disjoint with: Light Microscope
disjoint with: Mass Spectrometer
disjoint with: Microwave Spectrometer
disjoint with: Nuclear Magnetic Resonance Spectrometer
disjoint with: Raman Spectrometers
disjoint with: Scanning Coils
disjoint with: Single Beam Electron Microscope
disjoint with: Software
disjoint with: Spectrometer
disjoint with: Spectrophotometer
disjoint with: Stage
disjoint with: Transmission Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer
alternative label: FIB
definition: Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials.

Infrared Spectrometer
type: Class
subclass of: Spectrometer
disjoint with: Light Microscope
disjoint with: Mass Spectrometer
disjoint with: Microscope
disjoint with: Microwave Spectrometer
disjoint with: Nuclear Magnetic Resonance Spectrometer
disjoint with: Raman Spectrometers
disjoint with: Scanning Coils
disjoint with: Single Beam
disjoint with: Single Beam Electron Microscope
disjoint with: Single Beam Ion
disjoint with: Software
disjoint with: Stage
disjoint with: Transmission Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer
alternative label: IR
definition: An infrared spectrophotometer is an analytical instrument used to identify materials including organic polymers.

Mass Spectrometer
type: Class
subclass of: Spectrometer
disjoint with: Microscope
disjoint with: Microwave Spectrometer
disjoint with: Nuclear Magnetic Resonance Spectrometer
disjoint with: Raman Spectrometers
disjoint with: Scanning Coils
disjoint with: Single Beam
disjoint with: Single Beam Electron Microscope
disjoint with: Single Beam Ion
disjoint with: Software
disjoint with: Stage
disjoint with: Transmission Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer
alternative label: MS
definition: Mass spectrometry (MS) is an analytical technique that is used to measure the mass-to-charge ratio of ions. The results are typically presented as a mass spectrum, a plot of intensity as a function of the mass-to-charge ratio. Mass spectrometry is used in many different fields and is applied to pure samples as well as complex mixtures.

Microscope
type: Class
subclass of: Equipment
disjoint with: Microwave Spectrometer
disjoint with: Nuclear Magnetic Resonance Spectrometer
disjoint with: Raman Spectrometers
disjoint with: Scanning Coils
disjoint with: Software
disjoint with: Spectrometer
disjoint with: Spectrophotometer
disjoint with: Stage
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer
definition: A microscope is a laboratory instrument used to examine objects that are too small to be seen by the naked eye.

Microwave Spectrometer
type: Class
subclass of: Spectrometer
disjoint with: Nuclear Magnetic Resonance Spectrometer
disjoint with: Raman Spectrometers
disjoint with: Scanning Coils
disjoint with: Single Beam
disjoint with: Single Beam Electron Microscope
disjoint with: Single Beam Ion
disjoint with: Software
disjoint with: Stage
disjoint with: Transmission Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer
definition: Microwave spectroscopy is the spectroscopy method that employs microwaves, i.e. electromagnetic radiation at GHz frequencies, for the study of matter.

Scanning Coils
type: Class
subclass of: Parameters
subclass of: Restriction
  on property:
    inverse of: Has
  max cardinality: 1
subclass of: Restriction
  on property: hasSpeed
  some values from: real
subclass of: Restriction
  on property: hasSpeed
  all values from: real
subclass of: Restriction
  on property: hasSpeed
  max qualified cardinality: 1
  on data range: real
subclass of: Restriction
  on property: hasSpeed
  max cardinality: 1
disjoint with: Single Beam
disjoint with: Single Beam Electron Microscope
disjoint with: Single Beam Ion
disjoint with: Software
disjoint with: Spectrometer
disjoint with: Spectrophotometer
disjoint with: Stage
disjoint with: Transmission Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer

Software
type: Class
subclass of: Parameters
subclass of: Restriction
  on property:
    inverse of: Has
  max cardinality: 1
disjoint with: Spectrometer
disjoint with: Spectrophotometer
disjoint with: Stage
disjoint with: Transmission Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer

Spectrometer
type: Class
subclass of: Equipment
disjoint with: Stage
disjoint with: Transmission Electron Microscope
definition: A spectrometer is any instrument used to probe a property of light as a function of its portion of the electromagnetic spectrum, typically its wavelength, frequency, or energy. ... Technically, a spectrometer can function over any range of light, but most operate in a particular region of the electromagnetic spectrum.

Stage
type: Class
subclass of: Parameters
subclass of: Restriction
  on property:
    inverse of: Has
  max cardinality: 1
disjoint with: Transmission Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: x-ray photoelectron Spectrometer
definition: The stage of a microscope is the aluminum or iron platform where the specimen, usually on a glass slide, is raised or lowered for observation under the microscope.

Transmission Electron Microscope
type: Class
subclass of: Single Beam Electron Microscope
disjoint with: UV-Vis spectrophotometer
disjoint with: Ultraviolet visible spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer
alternative label: TEM
alternative label: Transmissionselektronenmikroskopie
definition: Transmission electron microscopes (TEM) are microscopes that use a particle beam of electrons to visualize specimens and generate a highly-magnified image.

Axiom
annotated source: Transmission Electron Microscope
annotated property: altLabel
annotated target: Transmissionselektronenmikroskopie
comment: de

Ultraviolet visible spectrometer
type: Class
subclass of: Spectrometer
disjoint with: X-ray Powder Diffraction
disjoint with: X ray Spectrometer
disjoint with: nuclear magnetic resonance
disjoint with: x-ray photoelectron Spectrometer
alternative label: UV-Vis
definition: UV-Vis spectroscopy is an analytical technique that measures the amount of discrete wavelengths of UV or visible light that are absorbed by or transmitted through a sample in comparison to a reference or blank sample

X-ray Powder Diffraction
type: Class
subclass of: X ray Spectrometer
disjoint with: x-ray photoelectron Spectrometer
alternative label: XRD
definition: X-ray powder diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. The analyzed material is finely ground, homogenized, and average bulk composition is determined.

X ray Spectrometer
type: Class
subclass of: Spectrometer
disjoint with: nuclear magnetic resonance
definition: X-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray excitation.

nuclear magnetic resonance
type: Class
subclass of: Spectrometer
alternative label: NMR
definition: Nuclear magnetic resonance spectroscopy, most commonly known as NMR spectroscopy or magnetic resonance spectroscopy (MRS), is a spectroscopic technique to observe local magnetic fields around atomic nuclei.

x-ray photoelectron Spectrometer
type: Class
subclass of: X ray Spectrometer
alternative label: XPS
definition: X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material.

Zeiss Auriga 60
type: NamedIndividual
type: Dual Beam
type: Class
  union of: EsB
  union of: SESI
  union of: 4QBSD Detector
  union of: Restriction
    on property: hasDetector
    some values from: In-Lens Detector
type: Restriction
  on property: hasParameter
  some values from: HighTension
type: Restriction
  on property: hasParameter
  some values from: Magnification
at location: INTLab1
has FI bmagnification: 300 X - 500 kx
has high tension: 10
has SE mmagnification: 12 X - 1000 Kx