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diffraction/srtio3_mean_dp.json

@@ -2,7 +2,7 @@
   "schema_version": "1.0",
   "name": "srtio3_mean_dp",
   "technique": "diffraction",
-  "description": "Mean diffraction pattern from ARINA 4D-STEM dataset, 2x binned detector",
+  "description": "SrTiO3 FIB lamella, mean diffraction pattern from 4D-STEM",
   "data": {
     "shape": [
       96,
@@ -13,17 +13,29 @@
   },
   "instrument": {
     "detector": "Dectris ARINA CZT",
-    "voltage_kv": 300
+    "voltage_kv": 300,
+    "microscope": "TEM",
+    "detector_pixels": [
+      192,
+      192
+    ]
   },
   "calibration": {},
   "processing": {
     "derived_from": "arina_64x64_96x96",
-    "method": "mean over all scan positions"
+    "method": "mean over all scan positions, then detector binned 2x",
+    "source_shape": [
+      256,
+      256,
+      192,
+      192
+    ],
+    "detector_bin_factor": 2
   },
   "attribution": {
-    "contributor": "Bob Lee",
-    "institution": "NCEM, LBNL",
+    "contributor": "Stephanie Ribet, NCEM",
+    "institution": "National Center for Electron Microscopy, LBNL",
     "license": "CC-BY-4.0",
-    "date": "2025-11-15"
+    "date": "2024-11-15"
   }
 }