{
  "schema_version": "1.0",
  "name": "srtio3_mean_dp",
  "technique": "diffraction",
  "description": "SrTiO3 FIB lamella, mean diffraction pattern from 4D-STEM",
  "data": {
    "shape": [
      96,
      96
    ],
    "dtype": "float32",
    "size_mb": 0.04
  },
  "instrument": {
    "detector": "Dectris ARINA CZT",
    "voltage_kv": 300,
    "microscope": "TEM",
    "detector_pixels": [
      192,
      192
    ]
  },
  "calibration": {},
  "processing": {
    "derived_from": "arina_64x64_96x96",
    "method": "mean over all scan positions, then detector binned 2x",
    "source_shape": [
      256,
      256,
      192,
      192
    ],
    "detector_bin_factor": 2
  },
  "attribution": {
    "contributor": "Stephanie Ribet, NCEM",
    "institution": "National Center for Electron Microscopy, LBNL",
    "license": "CC-BY-4.0",
    "date": "2024-11-15"
  }
}