{ "dataset_id": "27_microscopy_techniques", "title": "Microscopy Technique Reference", "domain": "analytical_instrumentation", "primary_entity_field": "technique", "field_guide": { "technique": "Technique", "typical_resolution_nm": "Typical Resolution (nm)", "sample_requirement": "Sample Requirement", "imaging_signal": "Imaging Signal", "common_application": "Common Application", "live_cell_friendly": "Live Cell Friendly" }, "record_count": 6, "records": [ { "record_id": "27_microscopy_techniques_01", "technique": "Bright-field microscopy", "typical_resolution_nm": 200, "sample_requirement": "Thin specimen, often stained", "imaging_signal": "Transmitted visible light", "common_application": "Histology overview", "live_cell_friendly": "Yes", "entity_name": "Bright-field microscopy", "summary": "Bright-field microscopy appears in the Microscopy Technique Reference dataset with technique=Bright-field microscopy; typical_resolution_nm=200; sample_requirement=Thin specimen, often stained; imaging_signal=Transmitted visible light; common_application=Histology overview; live_cell_friendly=Yes." }, { "record_id": "27_microscopy_techniques_02", "technique": "Fluorescence microscopy", "typical_resolution_nm": 180, "sample_requirement": "Fluorescent labels or autofluorescence", "imaging_signal": "Emitted light", "common_application": "Protein localization", "live_cell_friendly": "Yes", "entity_name": "Fluorescence microscopy", "summary": "Fluorescence microscopy appears in the Microscopy Technique Reference dataset with technique=Fluorescence microscopy; typical_resolution_nm=180; sample_requirement=Fluorescent labels or autofluorescence; imaging_signal=Emitted light; common_application=Protein localization; live_cell_friendly=Yes." }, { "record_id": "27_microscopy_techniques_03", "technique": "Confocal microscopy", "typical_resolution_nm": 120, "sample_requirement": "Fluorescent labeling", "imaging_signal": "Laser-scanned fluorescence", "common_application": "Optical sectioning and 3D imaging", "live_cell_friendly": "Yes", "entity_name": "Confocal microscopy", "summary": "Confocal microscopy appears in the Microscopy Technique Reference dataset with technique=Confocal microscopy; typical_resolution_nm=120; sample_requirement=Fluorescent labeling; imaging_signal=Laser-scanned fluorescence; common_application=Optical sectioning and 3D imaging; live_cell_friendly=Yes." }, { "record_id": "27_microscopy_techniques_04", "technique": "Scanning electron microscopy", "typical_resolution_nm": 1.0, "sample_requirement": "Vacuum-compatible conductive surface", "imaging_signal": "Secondary or backscattered electrons", "common_application": "Surface topology", "live_cell_friendly": "No", "entity_name": "Scanning electron microscopy", "summary": "Scanning electron microscopy appears in the Microscopy Technique Reference dataset with technique=Scanning electron microscopy; typical_resolution_nm=1.0; sample_requirement=Vacuum-compatible conductive surface; imaging_signal=Secondary or backscattered electrons; common_application=Surface topology; live_cell_friendly=No." }, { "record_id": "27_microscopy_techniques_05", "technique": "Transmission electron microscopy", "typical_resolution_nm": 0.1, "sample_requirement": "Ultrathin specimen in vacuum", "imaging_signal": "Transmitted electrons", "common_application": "Internal ultrastructure", "live_cell_friendly": "No", "entity_name": "Transmission electron microscopy", "summary": "Transmission electron microscopy appears in the Microscopy Technique Reference dataset with technique=Transmission electron microscopy; typical_resolution_nm=0.1; sample_requirement=Ultrathin specimen in vacuum; imaging_signal=Transmitted electrons; common_application=Internal ultrastructure; live_cell_friendly=No." }, { "record_id": "27_microscopy_techniques_06", "technique": "Atomic force microscopy", "typical_resolution_nm": 1.0, "sample_requirement": "Surface accessible to probe tip", "imaging_signal": "Cantilever deflection", "common_application": "Nanoscale surface mapping", "live_cell_friendly": "Limited", "entity_name": "Atomic force microscopy", "summary": "Atomic force microscopy appears in the Microscopy Technique Reference dataset with technique=Atomic force microscopy; typical_resolution_nm=1.0; sample_requirement=Surface accessible to probe tip; imaging_signal=Cantilever deflection; common_application=Nanoscale surface mapping; live_cell_friendly=Limited." } ] }