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README.md
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Upload your own PCB image or pick from built-in test images. The confidence threshold is adjustable in the sidebar.
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## Model
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### Architecture: RT-DETRv4 X
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| AP large (>96² px) | 0.754 |
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| AR @ maxDets=100 | 0.686 |
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### Per-Class AP @ IoU=0.50:0.95
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| Class | Full Name | AP |
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| BMFO | Base Material Foreign Object | 0.478 |
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| Mean | | 0.522 |
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### Per-Class F1 @ Conf≥0.5, IoU≥0.5
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| Class | Precision | Recall | F1 |
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RT-DETRv4 X matches or exceeds all compared methods at only 10 epochs on a single T4. PCB-FS, for comparison, used 100+ epochs with more resources.
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## Dataset: DsPCBSD+
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DsPCBSD+ is a 2024 open dataset for PCB copper-layer defect detection, captured by a professional AOI system (AGLE'OL AOI-100 V8, 16K camera, controlled LED lighting). Nine defect categories, annotated at instance level:
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| Code | Defect | Description |
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| SH | Short | Conductive bridge between two traces |
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| SP | Spur | Anomalous copper spike from a trace |
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| SC | Spurious Copper | Unwanted copper on board surface |
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| OP | Open Circuit | Break in a conductive trace |
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| MB | Mouse Bite | Edge notch or chip in the trace |
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| HB | Hole Breakout | Damage to material around a drill hole |
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| CS | Conductor Scratch | Scratch mark on a conductive trace |
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| CFO | Conductor Foreign Object | Foreign particle on a trace |
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| BMFO | Base Material Foreign Object | Foreign particle in substrate material |
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> S. Lv et al., "A dataset for deep learning based detection of printed circuit board surface defect," *Scientific Data*, vol. 11, no. 1, p. 811, 2024. https://doi.org/10.1038/s41597-024-03656-8
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## Files
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| File | Description |
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| `last.pth` | Fine-tuned checkpoint (EMA weights) |
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| `test_image/` | 12 example PCB images for inference testing |
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## Running Locally
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Clone the Space and install dependencies:
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Upload your own PCB image or pick from built-in test images. The confidence threshold is adjustable in the sidebar.
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## Dataset: DsPCBSD+
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DsPCBSD+ is a 2024 open dataset for PCB copper-layer defect detection, captured by a professional AOI system (AGLE'OL AOI-100 V8, 16K camera, controlled LED lighting). Nine defect categories, annotated at instance level:
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| Code | Defect | Description |
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|---|---|---|
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| SH | Short | Conductive bridge between two traces |
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| SP | Spur | Anomalous copper spike from a trace |
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| SC | Spurious Copper | Unwanted copper on board surface |
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| OP | Open Circuit | Break in a conductive trace |
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| MB | Mouse Bite | Edge notch or chip in the trace |
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| HB | Hole Breakout | Damage to material around a drill hole |
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| CS | Conductor Scratch | Scratch mark on a conductive trace |
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| CFO | Conductor Foreign Object | Foreign particle on a trace |
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| BMFO | Base Material Foreign Object | Foreign particle in substrate material |
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> S. Lv et al., "A dataset for deep learning based detection of printed circuit board surface defect," *Scientific Data*, vol. 11, no. 1, p. 811, 2024. https://doi.org/10.1038/s41597-024-03656-8
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## Model
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### Architecture: RT-DETRv4 X
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| AP large (>96² px) | 0.754 |
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| AR @ maxDets=100 | 0.686 |
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### Per-Class AP @ IoU=0.50:0.95
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| Class | Full Name | AP |
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| BMFO | Base Material Foreign Object | 0.478 |
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| Mean | | 0.522 |
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### Per-Class F1 @ Conf≥0.5, IoU≥0.5
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| Class | Precision | Recall | F1 |
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RT-DETRv4 X matches or exceeds all compared methods at only 10 epochs on a single T4. PCB-FS, for comparison, used 100+ epochs with more resources.
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## Running Locally
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Clone the Space and install dependencies:
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