| # CEC Certified PV Module Database: Sandia / CEC 5-parameter single-diode model |
|
|
| > **Contamination tier: high.** The single-diode PV-cell I-V equation |
| > (Shockley 1949 diode + series/shunt resistance, reformulated by De |
| > Soto, Klein & Beckman 2006) is *the* textbook equation of module-level |
| > PV performance — in every solar-energy textbook, in Wikipedia, and in |
| > every arXiv preprint on PV modelling. An LLM will almost certainly |
| > recite the functional form from memory. What is **not** in the |
| > textbooks is a certified snapshot of 21 535 real commercial modules |
| > with per-module fitted parameters; and what is not trivial is the |
| > cross-module aggregate scaling (`P_mp ~ eta * A * G_STC`) that an SR |
| > method should *also* rediscover. **Track roles:** Track-C red-team |
| > for the single-diode form (tests whether an LLM is memorizing De |
| > Soto 2006) and Track-A / Track-B discovery for the aggregate and |
| > technology-conditional scalings. A useful number on this benchmark |
| > only reports both together. |
|
|
| ## The dataset at a glance |
|
|
| The California Energy Commission (CEC) maintains the most widely-used |
| public registry of PV modules eligible for incentive programs in |
| California. Each listed module has been put through an I-V sweep at an |
| accredited test laboratory (TUV Rheinland, SGS, ETL/Intertek, PV |
| Evolution Labs, ...) under Standard Test Conditions |
|
|
| $$ |
| \text{STC} : \quad G = 1000\,\mathrm{W/m^2}, \; T_{cell} = 25^\circ\mathrm{C}, \; \text{AM1.5 spectrum} |
| $$ |
| |
| and under the Nominal Operating Cell Temperature (NOCT) test |
| |
| $$ |
| \text{NOCT} : \quad G = 800\,\mathrm{W/m^2}, \; T_{air} = 20^\circ\mathrm{C}, \; v_{wind} = 1\,\mathrm{m/s}, |
| $$ |
| |
| from which the lab reports the five I-V-curve key points |
| $(I_{sc}, V_{oc}, I_{mp}, V_{mp}, P_{mp})$ at STC plus the temperature |
| coefficients $(\alpha_{sc}, \beta_{oc}, \gamma_r)$. NREL's System Advisor |
| Model (SAM) then **fits** the five-parameter De Soto model |
| $(a, I_L, I_o, R_s, R_{sh})$ so that the resulting single-diode I-V |
| curve reproduces those measured key points. Both the lab measurements |
| and the fitted single-diode parameters are what CEC certifies and what |
| ships in the `data.csv` here. |
| |
| The snapshot used in this entry contains **21 535 modules** across five |
| technologies: |
| |
| | Technology | n | |
| |---------------|--------| |
| | Multi-c-Si | 11 221 | |
| | Mono-c-Si | 9 725 | |
| | Thin Film | 561 | |
| | CdTe | 20 | |
| | CIGS | 8 | |
| |
| ## Ground-truth physics |
| |
| ### The De Soto 5-parameter single-diode model |
| |
| At the heart of module-level PV modelling is the ideal-diode equation |
| with a series and a shunt resistor added to account for lumped |
| non-idealities: |
| |
| $$ |
| I(V) \;=\; I_L \;-\; I_o\!\left[\exp\!\left(\frac{V + I R_s}{a}\right) - 1\right] \;-\; \frac{V + I R_s}{R_{sh}}, |
| \qquad a \equiv \frac{n N_s k T_{cell}}{q}. |
| $$ |
|
|
| Five per-module parameters completely determine the I-V curve under |
| STC: |
|
|
| | Symbol | CEC column | Unit | Meaning | |
| |---------|-------------|-------|---------| |
| | $I_L$ | `I_L_ref` | A | light-generated (photo) current | |
| | $I_o$ | `I_o_ref` | A | diode reverse-saturation current | |
| | $R_s$ | `R_s` | Ohm | lumped series resistance | |
| | $R_{sh}$ | `R_sh_ref` | Ohm | shunt resistance | |
| | $a$ | `a_ref` | V | modified ideality factor $n N_s k T/q$ | |
| |
| Equation (I) is implicit in $I$ and has no closed-form solution; the |
| max-power point $(V_{mp}, I_{mp})$ is found by maximizing $V I(V)$ |
| numerically (e.g. Newton on $\partial P / \partial V = 0$, or by |
| enumerating the I-V curve). `formulas/single_diode_pmp.py` uses |
| `pvlib.pvsystem.singlediode` (a vectorized implementation by |
| Jain & Kapoor 2004 of the Lambert-W closed form for $I(V)$) with a |
| plain-scipy fallback. |
| |
| ### Why parameter fitting is nontrivial |
| |
| SAM's fit matches six datasheet constraints |
| |
| $$ |
| I_{sc}^{meas},\; V_{oc}^{meas},\; I_{mp}^{meas},\; V_{mp}^{meas},\; |
| \alpha_{sc}^{meas},\; \beta_{oc}^{meas} |
| $$ |
| |
| against five parameters $(I_L, I_o, R_s, R_{sh}, a)$ and one residual |
| temperature-adjustment factor `Adjust`. De Soto 2004 / 2006 sets up the |
| boundary conditions at $(V=0, I=I_{sc})$, $(V=V_{oc}, I=0)$, |
| $(V_{mp}, I_{mp})$, plus $dP/dV = 0$ at MPP and a temperature-coefficient |
| matching condition, and solves the resulting nonlinear system. Once the |
| parameters are known, evaluating the formula on the database |
| **exactly** reproduces the measured $I_{sc}, V_{oc}, I_{mp}, V_{mp}$ and |
| therefore $P_{mp}$ — hence the $R^2 \approx 1$ score of |
| `single_diode_pmp` in `reference_scores`. This is not a fluke; it is the |
| design of the certification process. |
|
|
| ### Approximate closed-form results |
|
|
| In the limit $R_s \to 0$ and $R_{sh} \to \infty$ the single-diode |
| equation yields the two classical closed forms (both reproducible from |
| the data here): |
|
|
| $$ |
| I_{sc} \;\approx\; I_L \qquad\text{(STC, shortcircuit)} |
| $$ |
|
|
| with RMS residual $0.075$ A ($R^2 = 0.997$), and |
|
|
| $$ |
| V_{oc} \;\approx\; a \, \ln\!\left(\frac{I_L}{I_o}\right) \qquad\text{(STC, opencircuit)} |
| $$ |
| |
| with RMS residual $0.11$ V ($R^2 = 0.9999$). These are left out of the |
| main `ground_truth` list (the target is $P_{mp}$, not $I_{sc}$ / $V_{oc}$) |
| but are useful physics sanity checks for a candidate SR method that |
| proposes the Shockley form — see the `__main__` reproducer hooks in |
| `formulas/`. |
| |
| ### The Sandia Array Performance Model (SAPM) connection |
| |
| King et al. 2004 (SAND2004-3535) define the PTC test |
| |
| $$ |
| \text{PTC} : \quad G = 1000\,\mathrm{W/m^2}, \; T_{air} = 20^\circ\mathrm{C}, \; v_{wind} = 1\,\mathrm{m/s} |
| $$ |
| |
| and an empirical temperature model |
| |
| $$ |
| T_{cell}^{PTC} \;\approx\; T_{air} + \frac{G}{800\,\mathrm{W/m^2}}\,(T_{NOCT} - 20^\circ\mathrm{C}) |
| \;=\; 20 + 1.25\,(T_{NOCT} - 20)\; [^\circ\mathrm{C}] |
| $$ |
| |
| from which the PTC power can be predicted by a linear |
| temperature-coefficient correction |
| |
| $$ |
| P_{PTC} \;\approx\; P_{mp}^{STC} \Bigl(1 + \tfrac{\gamma_r}{100}\,(T_{cell}^{PTC} - 25)\Bigr), |
| $$ |
| |
| reproducing the CEC `PTC` column with $R^2 \approx 0.98$, |
| RMSE $\approx 6.9$ W. We do not ship this as a ground-truth formula (the |
| target is $P_{mp}^{STC}$, not PTC) but every column needed to build it |
| is retained in `data.csv`, so it is a natural second benchmark variant |
| to add later. |
|
|
| ### Aggregate efficiency-area scaling |
|
|
| At the crudest aggregate level, by definition of module efficiency, |
|
|
| $$ |
| P_{mp}^{STC} \;=\; \eta \cdot A_c \cdot G_{STC}, \qquad G_{STC} = 1000\,\mathrm{W/m^2}. |
| $$ |
|
|
| Running a single global mean efficiency |
| $\bar{\eta} = 0.1539$ across all 21 535 modules gives |
| $R^2 \approx 0.665$ and RMSE $\approx 34$ W — the "low-information" |
| baseline a pure dimensional-analysis SR method should return. Per- |
| technology means sit at |
|
|
| | Technology | $\bar{\eta}$ | n | |
| |---------------|-------------|--------| |
| | CdTe | 0.165 | 20 | |
| | Mono-c-Si | 0.160 | 9 725 | |
| | Multi-c-Si | 0.151 | 11 221 | |
| | CIGS | 0.141 | 8 | |
| | Thin Film | 0.112 | 561 | |
|
|
| and conditioning on `Technology` sharpens the per-technology scaling |
| fits substantially (e.g. to $R^2 \approx 0.97$ for CIGS, $\approx 0.74$ |
| for mono/multi-Si). |
|
|
| ## Instance-per-row vs. cross-module framing |
|
|
| A subtle point that distinguishes this entry from most other `real-sr` |
| entries is that each **row is its own 5-parameter fitting problem** in |
| the upstream workflow. The CEC database already *contains* the fit; an |
| SR benchmark built on the database is really asking: |
|
|
| > Given a row's certified single-diode parameters and/or datasheet key |
| > points, can a symbolic regressor predict the row's $P_{mp}^{STC}$? |
| |
| Two honest answers exist: |
| |
| 1. **Per-row physics (Track-C red-team).** With the 5 fitted parameters |
| as input, the single-diode formula is tautological — $R^2$ collapses |
| to the numerical precision of the root solver. This is useful only |
| as a memorization test: an LLM-driven SR method should spot this |
| and not claim credit for "discovery". The score it reports here is |
| a lower bound on how faithfully it evaluates the formula it |
| proposes, not on its discovery ability. |
| 2. **Cross-module scaling (Track-A discovery).** Using only |
| technology-agnostic inputs (`A_c`, `N_s`, `Technology`, geometric |
| dimensions) the problem is genuinely underdetermined and the best a |
| symbolic regressor can hope for is an approximate scaling law |
| — reflected in the $R^2 \approx 0.67$ of |
| `efficiency_area_scaling`. This is the *real* discovery benchmark |
| and is where `real-sr` expects to see a spread of methods. |
| |
| ## Known limitations of the ground-truth formulas |
| |
| 1. **Tautological by construction.** As discussed above, the upstream |
| fit makes `single_diode_pmp` exactly reproduce `P_mp_stc`. Any |
| "score" reported against this target should be explicitly labelled |
| Track-C. |
| 2. **No off-STC dependence.** The ground-truth formulas all report |
| values at Standard Test Conditions; operational performance under |
| arbitrary $(G, T_{cell})$ requires the full De Soto temperature / |
| irradiance translation equations (not covered here, but every |
| column needed is retained). |
| 3. **Technology-agnostic aggregate fit.** The shipped |
| `efficiency_area_scaling` uses a single global $\bar\eta$ and is |
| correspondingly coarse. A per-technology variant is trivial to |
| build from the `Technology` column. |
| 4. **Bifacial and BIPV oddities.** 133 rows are bifacial and the |
| reported STC power is the front-only value; a few BIPV entries |
| have non-standard aperture area definitions. These are kept |
| verbatim; any robust SR method should flag them as outliers. |
| 5. **Thin-film entries with tiny $I_o$.** A handful of older |
| thin-film rows have $I_o < 10^{-18}$ A which pushes the Lambert-W |
| solver into its numerical floor. The benchmark scorer retains |
| those rows; their residuals are negligible at aggregate level. |
| |
| ## Track / contamination framing (`data_sources_survey.md` §3-§4) |
| |
| - **Track-C red team** for the single-diode formula itself. Shockley |
| (1949), De Soto (2004 thesis / 2006 paper), Duffie & Beckman's |
| textbook, `pvlib.pvsystem.singlediode` source code, and thousands of |
| arXiv preprints all contain the formula explicitly. An LLM-SR |
| method that names it and plugs in the 5 CEC-certified per-row |
| parameters will score near-perfect; that outcome is informative |
| only as a memorization probe. |
| - **Track-A discovery** for the aggregate power-area scaling, the |
| per-technology efficiency fits, and the PTC temperature correction |
| (reachable from retained columns). These involve genuine parameter |
| identification and dimensional reasoning, not textbook recitation. |
| - **Track-B real-but-ambiguous** framing for any rule linking the |
| fitted 5 parameters back to the measured datasheet key points |
| (e.g. *predict* $I_L$ given $I_{sc}$, $V_{oc}$, $I_{mp}$, $V_{mp}$): |
| the equations De Soto 2006 uses are known but their algebraic |
| closed-form is non-unique and this is a natural "plausibility + |
| prediction" benchmark rather than a scoreable discovery task. |
| - **Recommended reporting.** When benchmarking an LLM-SR method, |
| break out the scores per ground-truth formula, flag |
| `single_diode_pmp` as Track-C by convention, and report the |
| Track-A `efficiency_area_scaling` score alongside so that memorization |
| can be quantified. |
| |
| ## References (stored in `reference/`) |
| |
| - `desoto2004_thesis.pdf`, `desoto2004_thesis.bib` — De Soto's 2004 |
| MS thesis (UW-Madison, Solar Energy Laboratory); contains the full |
| algebraic derivation of the 5-parameter fit, worked examples, and |
| the temperature/irradiance translation equations later condensed |
| into the 2006 Solar Energy paper. |
| - `desoto2006.bib` — BibTeX for De Soto, Klein & Beckman 2006, |
| *Improvement and validation of a model for photovoltaic array |
| performance*, Solar Energy 80(1):78-88, |
| doi:10.1016/j.solener.2005.06.010 (the published journal version; |
| Elsevier paywall, so only a BibTeX record is redistributed here — |
| the 2004 thesis PDF is the open-access equivalent). |
| - `king2004_sapm.pdf`, `king2004_sapm.bib` — Sandia National Labs |
| report SAND2004-3535, *Photovoltaic Array Performance Model*, the |
| authoritative reference for the PTC test conditions, the SAPM |
| empirical temperature model, and the I-V-curve key-point temperature |
| response that CEC certification enforces. |
| - `pvlib_cecmod.bib` — pvlib-python documentation entry for |
| `pvlib.pvsystem.retrieve_sam("CECMod")`, the programmatic access |
| point used by `data/download.sh`. |
| - `cec_solar_equipment_list.bib` — California Energy Commission |
| "Solar Equipment Lists -- PV Modules" (the upstream public |
| registry whose SAM snapshot is what we distribute). |
|
|