| { |
| "dataset_id": "27_microscopy_techniques", |
| "title": "Microscopy Technique Reference", |
| "domain": "analytical_instrumentation", |
| "primary_entity_field": "technique", |
| "field_guide": { |
| "technique": "Technique", |
| "typical_resolution_nm": "Typical Resolution (nm)", |
| "sample_requirement": "Sample Requirement", |
| "imaging_signal": "Imaging Signal", |
| "common_application": "Common Application", |
| "live_cell_friendly": "Live Cell Friendly" |
| }, |
| "record_count": 6, |
| "records": [ |
| { |
| "record_id": "27_microscopy_techniques_01", |
| "technique": "Bright-field microscopy", |
| "typical_resolution_nm": 200, |
| "sample_requirement": "Thin specimen, often stained", |
| "imaging_signal": "Transmitted visible light", |
| "common_application": "Histology overview", |
| "live_cell_friendly": "Yes", |
| "entity_name": "Bright-field microscopy", |
| "summary": "Bright-field microscopy appears in the Microscopy Technique Reference dataset with technique=Bright-field microscopy; typical_resolution_nm=200; sample_requirement=Thin specimen, often stained; imaging_signal=Transmitted visible light; common_application=Histology overview; live_cell_friendly=Yes." |
| }, |
| { |
| "record_id": "27_microscopy_techniques_02", |
| "technique": "Fluorescence microscopy", |
| "typical_resolution_nm": 180, |
| "sample_requirement": "Fluorescent labels or autofluorescence", |
| "imaging_signal": "Emitted light", |
| "common_application": "Protein localization", |
| "live_cell_friendly": "Yes", |
| "entity_name": "Fluorescence microscopy", |
| "summary": "Fluorescence microscopy appears in the Microscopy Technique Reference dataset with technique=Fluorescence microscopy; typical_resolution_nm=180; sample_requirement=Fluorescent labels or autofluorescence; imaging_signal=Emitted light; common_application=Protein localization; live_cell_friendly=Yes." |
| }, |
| { |
| "record_id": "27_microscopy_techniques_03", |
| "technique": "Confocal microscopy", |
| "typical_resolution_nm": 120, |
| "sample_requirement": "Fluorescent labeling", |
| "imaging_signal": "Laser-scanned fluorescence", |
| "common_application": "Optical sectioning and 3D imaging", |
| "live_cell_friendly": "Yes", |
| "entity_name": "Confocal microscopy", |
| "summary": "Confocal microscopy appears in the Microscopy Technique Reference dataset with technique=Confocal microscopy; typical_resolution_nm=120; sample_requirement=Fluorescent labeling; imaging_signal=Laser-scanned fluorescence; common_application=Optical sectioning and 3D imaging; live_cell_friendly=Yes." |
| }, |
| { |
| "record_id": "27_microscopy_techniques_04", |
| "technique": "Scanning electron microscopy", |
| "typical_resolution_nm": 1.0, |
| "sample_requirement": "Vacuum-compatible conductive surface", |
| "imaging_signal": "Secondary or backscattered electrons", |
| "common_application": "Surface topology", |
| "live_cell_friendly": "No", |
| "entity_name": "Scanning electron microscopy", |
| "summary": "Scanning electron microscopy appears in the Microscopy Technique Reference dataset with technique=Scanning electron microscopy; typical_resolution_nm=1.0; sample_requirement=Vacuum-compatible conductive surface; imaging_signal=Secondary or backscattered electrons; common_application=Surface topology; live_cell_friendly=No." |
| }, |
| { |
| "record_id": "27_microscopy_techniques_05", |
| "technique": "Transmission electron microscopy", |
| "typical_resolution_nm": 0.1, |
| "sample_requirement": "Ultrathin specimen in vacuum", |
| "imaging_signal": "Transmitted electrons", |
| "common_application": "Internal ultrastructure", |
| "live_cell_friendly": "No", |
| "entity_name": "Transmission electron microscopy", |
| "summary": "Transmission electron microscopy appears in the Microscopy Technique Reference dataset with technique=Transmission electron microscopy; typical_resolution_nm=0.1; sample_requirement=Ultrathin specimen in vacuum; imaging_signal=Transmitted electrons; common_application=Internal ultrastructure; live_cell_friendly=No." |
| }, |
| { |
| "record_id": "27_microscopy_techniques_06", |
| "technique": "Atomic force microscopy", |
| "typical_resolution_nm": 1.0, |
| "sample_requirement": "Surface accessible to probe tip", |
| "imaging_signal": "Cantilever deflection", |
| "common_application": "Nanoscale surface mapping", |
| "live_cell_friendly": "Limited", |
| "entity_name": "Atomic force microscopy", |
| "summary": "Atomic force microscopy appears in the Microscopy Technique Reference dataset with technique=Atomic force microscopy; typical_resolution_nm=1.0; sample_requirement=Surface accessible to probe tip; imaging_signal=Cantilever deflection; common_application=Nanoscale surface mapping; live_cell_friendly=Limited." |
| } |
| ] |
| } |
