A Review of Benchmarks for Visual Defect Detection in the Manufacturing Industry
Paper • 2305.13261 • Published
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NEU-DET — pointer card, not a data mirror
Metadata/citation card only. NEU-DET is hosted on IEEE DataPort, which requires an account/subscription to download; no explicit redistribution license was found on the page, so it is not re-hosted here.
Access
- Official page (account required): https://ieee-dataport.org/documents/neu-det
- Related benchmark review: arXiv:2305.13261
Contents
1,800 grayscale images (200x200), 6 defect classes x 300 (crazing, inclusion, patches, pitted surface, rolled-in scale, scratches), bounding-box annotated. Bare hot-rolled steel, not painted — useful for bbox-supervised detector warmup (scratch/inclusion classes overlap with paint-defect taxonomy) but not a domain match.
Citation
Song, K., Yan, Y. "A noise robust method based on completed local binary patterns for hot-rolled steel strip surface defects." Applied Surface Science, 2013.
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