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yuanchuan
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annotated_reference_strings

Dataset card Data Studio Files
xet
Community
2
source
stringclasses
1 value
lang
stringclasses
1 value
entry_type
stringclasses
1 value
doi_prefix
stringclasses
15 values
csl_style
stringclasses
17 values
content
stringlengths
95
1.87k
crossref
en
article
10.1051
cambridge-university-press-author-date
<author>Willich, P.</author> <year>(1984).</year> <title>ELECTRON PROBE MICROANALYSIS OF SUBMICRON ALLOY FILMS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–621.</page>
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en
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cambridge-university-press-author-date
<author>Zierold, K.</author> <year>(1984).</year> <title>QUANTITATIVE X-RAY MICROANALYSIS OF BIOLOGICAL CRYOSECTIONS DEPENDS ON ICE CRYSTAL DAMAGE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–447.</page>
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<author>Černuško, V., Fröhlich, K., Jergel, M., … Cheremnykh, P. A.</author> <year>(1984).</year> <title>PROPERTIES OF Nb3Ge TAPE SUPERCONDUCTOR PREPARED BY CVD METHOD.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C1),</issue> <page>C1–429.</page>
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article
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<author>Alfonsi, S., Barnaba, P., Fioravanti, S., Gelli, J., Modena, C., & Pareto, G.</author> <year>(1984).</year> <title>APPLICATION DE LA MICROSONDE ÉLECTRONIQUE À LANALYSE QUANTITATIVE DES PHASES MINÉRALOGIQUES DES AGGLOMÉRÉS DE MINERAIS DE FER.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–735.</page>
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cambridge-university-press-author-date
<author>Alshwaikh, A. A.</author> <year>(1984).</year> <title>CHROMATIC CHANGE IN MAGNIFICATION AND IN ROTATION FOR MAGNETIC LENSES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–165.</page>
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<author>Archambault, J., Lautie, A., & Lefevre, R.</author> <year>(1984).</year> <title>LA MICROANALYSE PAR EFFET RAMAN DES SÉDIMENTS CARBONATÉS : PROBLÈMES DINTERPRÉTATION DES SPECTRES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–805.</page>
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<author>Atkin, P., & Smith, K. C. A.</author> <year>(1984).</year> <title>COMPUTER TECHNIQUES FOR TOPOGRAPHICAL ANALYSIS IN THE SCANNING ELECTRON MICROSCOPE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–219.</page>
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<author>Balk, L. J., & Kultscher, N.</author> <year>(1984).</year> <title>NONLINEAR SCANNING ELECTRON ACOUSTIC MICROSCOPY.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–869.</page>
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<author>Barbillat, J., Dhamelincourt, P., & Delhaye, M.</author> <year>(1984).</year> <title>LE MICRODIL 28 : MICROSONDE RAMAN À DÉTECTION MULTICANALE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–255.</page>
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article
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cambridge-university-press-author-date
<author>Beaman, D. R., Klassen, H. E., Solosky, L. F., & File, D. M.</author> <year>(1984).</year> <title>DEPTH PROFILING AND MICROANALYSIS OF HYDROGEN IN TITANIUM.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–721.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Bernds, A., Löhnert, K., & Kubalek, E.</author> <year>(1984).</year> <title>SEM EBIC INVESTIGATIONS OF ZnO VARISTOR CERAMICS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–861.</page>
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article
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<author>Bernsen, P., & Reimer, L.</author> <year>(1984).</year> <title>TOTAL RATE IMAGING WITH X-RAYS IN A SCANNING ELECTRON MICROSCOPE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–297.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Bigler, E., & Polack, F.</author> <year>(1984).</year> <title>LARGE FIELD X-RAY ABSORPTION MICRO-ANALYSIS NEAR AN ABSORPTION EDGE BY IMAGE PROCESSING.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–83.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Blaise, G., Castaing, R., & Quettier, R.</author> <year>(1984).</year> <title>MÉTHODE DANALYSE FONDÉE SUR LIONISATION PAR ÉLECTRONS DES PRODUITS DE PULVÉRISATION THERMALISÉS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–125.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Bloomfield, D. J., Love, G., & Scott, V. D.</author> <year>(1984).</year> <title>QUANTITATIVE LIGHT ELEMENT ANALYSIS USING EDS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–181.</page>
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article
10.1051
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<author>Borchardt, G., Weber, S., Scherrer, H., & Scherrer, S.</author> <year>(1984).</year> <title>ANALYSE DES SURFACES SOLIDES PAR S.I.M.S. UTILISANT UN FAISCEAU PRIMAIRE DE PARTICULES NEUTRALISÉES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–801.</page>
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article
10.1051
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<author>Borovskii, I. B., Gorodskii, D. D., & Sharafeev, I. M.</author> <year>(1984).</year> <title>MASS TRANSPORT AT THE LASERGLAZING OF METALS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–285.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Boulanger, L., Lorant, H., & Hugon, M. P.</author> <year>(1984).</year> <title>ÉVOLUTION DE LA COMPOSITION CHIMIQUE DACIERS INOXYDABLES SOUS IRRADIATION PAR LES NEUTRONS RAPIDES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–837.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Brachon, B., Chevallier, Y., Gariazzo, B., Marnat, J., Thévenard, M., & Lamy, P.</author> <year>(1984).</year> <title>CARACTÉRISATION DE LA MORPHOLOGIE DE CHARGES PAR MICROSCOPIE ÉLECTRONIQUE À TRANSMISSION, ANALYSE DIMAGES, ET TRAITEMENT DES DONNÉES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–235.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Bresse, J. F., & Rivière, D.</author> <year>(1984).</year> <title>MINORITY CARRIER LIFETIME MEASUREMENTS IN SEMICONDUCTOR DEVICES MONITORED BY A MICROPROCESSOR IN E.B.I.C, MODE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–865.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Browne, M. T., Burge, R. E., Charalambous, P., … Smith, W.</author> <year>(1984).</year> <title>AN IMAGING SOFT X-RAY MICROSCOPE AT THE DARESBURY SYNCHROTRON RADIATION SOURCE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–87.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Bruynseels, F., Storms, H., & Grieken, R. V.</author> <year>(1984).</year> <title>LAMMA AND ELECTRON MICROPROBE ANALYSIS OF ATMOSPHERIC AEROSOLS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–785.</page>
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article
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<author>Brytov, I. A., Obolenskii, E. A., Romashchenko, Yu. N., & Gritsenko, V. A.</author> <year>(1984).</year> <title>ELECTRONIC STRUCTURE OF AMORPHOUS Si3N4.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–887.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Carvalho, W., & Dumas, P.</author> <year>(1984).</year> <title>MICROANALYSE RAMAN DE PRÉFORMES ET FIBRES OPTIQUES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–765.</page>
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article
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<author>Cazaux, J., Gramari, D., Mouze, D., Nassiopoulos, A. G., & Perrin, J.</author> <year>(1984).</year> <title>X-RAY PHOTOELECTRON MICROPROBE ANALYSIS AND RELATED TECHNIQUES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–271.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Chambers, W. F., & Doyle, J. H.</author> <year>(1984).</year> <title>A {USER} {DESIGNED} {SOFTWARE} {SYSTEM} {FOR} {ELECTRON} {MICROPROBES} - {BASIC} {PREMISES} {AND} {THE} {CONTROL} {PROGRAM}$\mathplus$.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–223.</page>
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article
10.1051
cambridge-university-press-author-date
<author>Cheng, L. M., & Michette, A. G.</author> <year>(1984).</year> <title>THREE DIMENSIONAL IMAGING IN SCANNING SOFT X-RAY MICROSCOPY.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–97.</page>
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article
10.1051
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<author>Coquerelle, M., Knappik, P., & Perrier, Cl.</author> <year>(1984).</year> <title>INSTALLATION DUN MICROSCOPE ÉLECTRONIQUE À BALAYAGE POUR EXAMEN DE MATÉRIAUX IRRADIÉS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–845.</page>
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10.1051
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<author>Coudray, C.</author> <year>(1984).</year> <title>SHADOWING EFFECTS OBSERVED IN SLOW IONS BACKSCATTERING ON A METALLIC CRYSTAL : EXPERIMENTS AND SIMULATIONS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–133.</page>
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<author>Dartyge, E., Flank, A. M., Fontaine, A., & Jucha, A.</author> <year>(1984).</year> <title>SYNCHROTRON RADIATION PLUS PHOTODIODE ARRAY : EXAFS IN DISPERSIVE MODE FOR FAST MICROANALYSIS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–275.</page>
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<author>de Lesegno, P. V., Inglebert, R.-L., & Hennequin, J.-F.</author> <year>(1984).</year> <title>{ASPECTS} {ANALYTIQUES} {DES} {\’{E}}{MISSIONS} D{\textquotesingle}{IONS} {SECONDAIRES} {ET} D{\textquotesingle}{\’{E}}{LECTRONS} {AUGER} {PAR} {LES} {ALLIAGES} Fe-Al {ET} Cu-Al {BOMBARD}{\’{E}}S {EN} {ULTRA}-{VIDE} {PAR} {DES} {IONS} Ar$\mathplus$.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–139.</page>
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<author>Dhamelincourt, P., Barbillat, J., & Delhaye, M.</author> <year>(1984).</year> <title>LASER RAMAN MICROPROBING TECHNIQUES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–249.</page>
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<author>Dothée, D., Camelot, M., & Roques-Carmes, C.</author> <year>(1984).</year> <title>MICROANALYSE PHYSICOCHIMIQUE SUPERFICIELLE DU POLYÉTHYLÈNE PAR SPECTROMÉTRIES VIBRATIONNELLES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–257.</page>
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<author>Doyle, J. H., & Chambers, W. F.</author> <year>(1984).</year> <title>A {USER} {DESIGNED} {SOFTWARE} {SYSTEM} {FOR} {ELECTRON} {MICROPROBES} - {QUALITATIVE} {AND} {QUANTITATIVE} {TECHNIQUES}$\mathplus$.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–227.</page>
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<author>Dubessy, J., Beny, C., Guilhaumou, N., Dhamelincourt, P., & Poty, B.</author> <year>(1984).</year> <title>APPLICATIONS OF THE MOLE RAMAN MICROPROBE TO THE STUDY OF FLUID INCLUSIONS IN MINERALS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–811.</page>
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article
10.1051
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<author>Dyck, P. V., Storms, H., & Grieken, R. V.</author> <year>(1984).</year> <title>AUTOMATED QUANTITATIVE ELECTRON MICROPROBE ANALYSIS OF PARTICULATE MATERIAL.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–781.</page>
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10.1051
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<author>Eloy, J. F.</author> <year>(1984).</year> <title>QUANTITATIVE MICROANALYSIS OF SOLID SAMPLES WITH THE LASER PROBE MASS SPECTROMETRY II (L.P.M.S. II).</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–265.</page>
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<author>Esteva, J. M., & Karnatak, R. C.</author> <year>(1984).</year> <title>1 keV X-RAY ABSORPTION SPECTROSCOPY OF BULK MATERIALS BY ELECTRON YIELD MEASUREMENT.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–279.</page>
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<author>Fourdeux, A., Sevely, J., Zanchi, G., & Kihn, Y.</author> <year>(1984).</year> <title>IDENTIFICATION DE PRÉCIPITÉS DE NITRURE DALUMINIUM DANS DES ÉCHANTILLONS DE FER.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–691.</page>
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<author>Franks, A.</author> <year>(1984).</year> <title>ADVANCES IN X-RAY OPTICS AT THE NATIONAL PHYSICAL LABORATORY.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–69.</page>
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<author>Fritz, G. S., McCarthy, J. J., & Benson, J.</author> <year>(1984).</year> <title>AUTOMATED MEASUREMENTS OF INTEGRATED CIRCUIT LINEWIDTHS BY ELECTRON MICROSCOPY.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–895.</page>
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<author>Gaudichet, A.</author> <year>(1984).</year> <title>CARACTÉRISATION DE FINES PARTICULES DANS DIVERS PRÉLÈVEMENTS ATMOSPHÉRIQUES EN MICROSCOPIE ANALYTIQUE EN TRANSMISSION.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–789.</page>
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<author>Gauneau, M., Chaplain, R., & Rupert, A.</author> <year>(1984).</year> <title>APPLICATION OF CESIUM PRIMARY BEAM TO THE CHARACTERIZATION OF III.V SEMICONDUCTORS BY SIMS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–119.</page>
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<author>Giber, J., Marton, D., & László, J.</author> <year>(1984).</year> <title>DEPTH RESOLUTION IN ION SPUTTERING - AN ASPECT OF QUANTITATIVEMICROANALYSIS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–115.</page>
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<author>Grazzini, M., Cencioni, R., & Formiconi, G.</author> <year>(1984).</year> <title>EVALUATION DES SUBSTITUTIONS IONIQUES DES COMPOSANTS À LÉTAT SOLIDE AU MOYEN DU MEB ET DU MICROANALYSEUR À RAYONS X.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–741.</page>
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<author>Grman, D., & Muster, W. J.</author> <year>(1984).</year> <title>EXTENDED SOFTWARE POSSIBILITIES IN X-RAY MICROANALYSIS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–231.</page>
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<author>Grübmeier, H. B.</author> <year>(1984).</year> <title>LOCALIZING FISSION PRODUCTS IN IRRADIATED NUCLEAR FUEL PARTICLES WITH THE UNSHIELDED ELECTRON MICROPROBE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–833.</page>
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<author>Havette, A.</author> <year>(1984).</year> <title>TECHNIQUES DANALYSE QUANTITATIVE PAR ÉMISSION IONIQUE SECONDAIRE : APPLICATION AUX MESURES ET AUX MICROGRAPHIES IONIQUES EN PÉTROLOGIE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–797.</page>
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<author>Hawkes, P. W.</author> <year>(1984).</year> <title>PROCESSING INFORMATION FROM SCANNING INSTRUMENTS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–195.</page>
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<author>Heck, D.</author> <year>(1984).</year> <title>NUCLEAR MICROPROBE ANALYSIS AT KARLSRUHE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–245.</page>
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<author>Heinrich, K. F. J.</author> <year>(1984).</year> <title>USE OF COLOR SCALES IN MICROANALYTICAL MAPS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–201.</page>
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<author>Hersener, J., Huber, H.-P., & Wienskowski, J. V.</author> <year>(1984).</year> <title>SEMIQUANTITATIVE X-RAY MICROANALYSIS ON PREFORMS FOR OPTICAL WAVEGUIDE FIBRES.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–761.</page>
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<author>Ichinokawa, T., Ampo, H., & Kinoshita, S.</author> <year>(1984).</year> <title>ANALYTICAL LOW VOLTAGE SEM IN UHV FOR SOLID SURFACE.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–301.</page>
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<author>Izrael, A., Thioulouse, P., & Tueta, R.</author> <year>(1984).</year> <title>CRYSTALLINE STRUCTURE AND DOPING LEVEL OF THIN ELECTROLUMINESCENT ZnS:Mn LAYERS.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–903.</page>
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<author>Jones, M. P.</author> <year>(1984).</year> <title>USE OF THE X-RAY MICROANALYSER AS AN IMAGE ANALYSER.</title> <container-title>Le Journal de Physique Colloques,</container-title> <volume>45</volume> <issue>(C2),</issue> <page>C2–211.</page>
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