Daily Papers

Continuous Integration and Continuous Deployment (CI/CD) pipelines are central to modern software delivery, yet their static workflows often introduce inefficiencies as systems scale. This paper proposes a reinforcement learning (RL) based approach to dynamically optimize CI/CD pipeline workflows. The pipeline is modeled as a Markov Decision Process, and an RL agent is trained to make runtime decisions such as selecting full, partial, or no test execution in order to maximize throughput while minimizing testing overhead. A configurable CI/CD simulation environment is developed to evaluate the approach across build, test, and deploy stages. Experimental results show that the RL optimized pipeline achieves up to a 30 percent improvement in throughput and approximately a 25 percent reduction in test execution time compared to static baselines, while maintaining a defect miss rate below 5 percent. The agent learns to selectively skip or abbreviate tests for low risk commits, accelerating feedback cycles without significantly increasing failure risk. These results demonstrate the potential of reinforcement learning to enable adaptive and intelligent DevOps workflows, providing a practical pathway toward more efficient, resilient, and sustainable CI/CD automation.

We introduce AutoMonitor-Bench, the first benchmark designed to systematically evaluate the reliability of LLM-based misbehavior monitors across diverse tasks and failure modes. AutoMonitor-Bench consists of 3,010 carefully annotated test samples spanning question answering, code generation, and reasoning, with paired misbehavior and benign instances. We evaluate monitors using two complementary metrics: Miss Rate (MR) and False Alarm Rate (FAR), capturing failures to detect misbehavior and oversensitivity to benign behavior, respectively. Evaluating 12 proprietary and 10 open-source LLMs, we observe substantial variability in monitoring performance and a consistent trade-off between MR and FAR, revealing an inherent safety-utility tension. To further explore the limits of monitor reliability, we construct a large-scale training corpus of 153,581 samples and fine-tune Qwen3-4B-Instruction to investigate whether training on known, relatively easy-to-construct misbehavior datasets improves monitoring performance on unseen and more implicit misbehaviors. Our results highlight the challenges of reliable, scalable misbehavior monitoring and motivate future work on task-aware designing and training strategies for LLM-based monitors.

In modern Very Large Scale Integrated (VLSI) circuit design flow, the Register-Transfer Level (RTL) stage presents a critical opportunity for timing optimization. Addressing timing violations at this early stage is essential, as modern systems demand higher speeds, where even minor timing violations can lead to functional failures or system crashes. However, traditional timing optimization heavily relies on manual expertise, requiring engineers to iteratively analyze timing reports and debug. To automate this process, this paper proposes ViTAD, a method that efficiently analyzes the root causes of timing violations and dynamically generates targeted repair strategies. Specifically, we first parse Verilog code and timing reports to construct a Signal Timing Dependency Graph (STDG). Based on the STDG, we perform violation path analysis and use large language models (LLMs) to infer the root causes of violations. Finally, by analyzing the causes of violations, we selectively retrieve relevant debugging knowledge from a domain-specific knowledge base to generate customized repair solutions. To evaluate the effectiveness of our method, we construct a timing violation dataset based on real-world open-source projects. This dataset contains 54 cases of violations. Experimental results show that our method achieves a 73.68% success rate in repairing timing violations, while the baseline using only LLM is 54.38%. Our method improves the success rate by 19.30%.

This paper introduces MISS-QA, the first benchmark specifically designed to evaluate the ability of models to interpret schematic diagrams within scientific literature. MISS-QA comprises 1,500 expert-annotated examples over 465 scientific papers. In this benchmark, models are tasked with interpreting schematic diagrams that illustrate research overviews and answering corresponding information-seeking questions based on the broader context of the paper. We assess the performance of 18 frontier multimodal foundation models, including o4-mini, Gemini-2.5-Flash, and Qwen2.5-VL. We reveal a significant performance gap between these models and human experts on MISS-QA. Our analysis of model performance on unanswerable questions and our detailed error analysis further highlight the strengths and limitations of current models, offering key insights to enhance models in comprehending multimodal scientific literature.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

Large language models (LLMs) have been widely applied to assist test generation with the source code under test provided as the context. This paper aims to answer the question: If the source code under test is incorrect, will LLMs be misguided when generating tests? The effectiveness of test cases is measured by their accuracy, coverage, and bug detection effectiveness. Our evaluation results with five open- and six closed-source LLMs on four datasets demonstrate that incorrect code can significantly mislead LLMs in generating correct, high-coverage, and bug-revealing tests. For instance, in the HumanEval dataset, LLMs achieve 80.45% test accuracy when provided with task descriptions and correct code, but only 57.12% when given task descriptions and incorrect code. For the APPS dataset, prompts with correct code yield tests that detect 39.85% of the bugs, while prompts with incorrect code detect only 19.61%. These findings have important implications for the deployment of LLM-based testing: using it on mature code may help protect against future regression, but on early-stage immature code, it may simply bake in errors. Our findings also underscore the need for further research to improve LLMs resilience against incorrect code in generating reliable and bug-revealing tests.

Existing defect/anomaly generation methods often rely on few-shot learning, which overfits to specific defect categories due to the lack of large-scale paired defect editing data. This issue is aggravated by substantial variations in defect scale and morphology, resulting in limited generalization, degraded realism, and category consistency. We address these challenges by introducing UDG, a large-scale dataset of 300K normal-abnormal-mask-caption quadruplets spanning diverse domains, and by presenting UniDG, a universal defect generation foundation model that supports both reference-based defect generation and text instruction-based defect editing without per-category fine-tuning. UniDG performs Defect-Context Editing via adaptive defect cropping and structured diptych input format, and fuses reference and target conditions through MM-DiT multimodal attention. A two-stage training strategy, Diversity-SFT followed by Consistency-RFT, further improves diversity while enhancing realism and reference consistency. Extensive experiments on MVTec-AD and VisA show that UniDG outperforms prior few-shot anomaly generation and image insertion/editing baselines in synthesis quality and downstream single- and multi-class anomaly detection/localization. Code will be available at https://github.com/RetoFan233/UniDG.

Large Language Models (LLMs) in Software Engineering (SE) can offer assistance for coding. To facilitate a rigorous evaluation of LLMs in practical coding contexts, Carlos et al. introduced the SWE-bench dataset, which comprises 2,294 real-world GitHub issues and their corresponding pull requests, collected from 12 widely used Python repositories. Several impressive LLM-based toolkits recently are developed and evaluated on this dataset. However, a systematic evaluation of the quality of SWE-bench remains missing. In this paper, we addressed this gap by presenting an empirical analysis of the SWE-bench dataset. We conducted a manual screening of instances where SWEAgent + GPT-4 successfully resolved issues by comparing the model-generated patches with the actual pull requests. SWE-Agent+GPT-4 was at the top of SWE-bench leaderboard during the time of our study. Our analysis reveals some critical issues with the SWE-bench dataset: 1) 32.67% of the successful patches involve cheating as the solutions were directly provided in the issue report or the comments. We refer to as solution leakage problem. 2) 31.08% of the passed patches are suspicious patches due to weak test cases, i.e., the tests were not adequate to verify the correctness of a patch. When we filtered out these problematic issues, the resolution rate of SWE-Agent+GPT-4 dropped from 12.47% to 3.97%. We also observed that the same data quality issues also exist in the two variants of SWE-bench, i.e., SWE-bench Lite and SWE-Bench Verified. In addition, over 94% of the issues were created before LLM's knowledge cutoff dates, posing potential data leakage issues.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

Automated issue solving aims to resolve real-world issues in software repositories. The most popular benchmarks for automated issue solving are SWE-bench and its human-filtered subset SWE-bench Verified. These benchmarks leverage testing to validate generated patches. However, because testing is rarely exhaustive, a patch may pass the tests but nevertheless fail to match the developers' expectations. Unfortunately, it is currently unclear to what extent evaluations performed with SWE-bench suffer from such plausible but incorrect patches. This paper presents an in-depth empirical study of the correctness of plausible patches generated by three state-of-the-art issue-solving tools evaluated on SWE-bench Verified. We extensively test and inspect generated patches, and compare them against human-written ground truth patches. The core of our methodology is a novel technique PatchDiff for differential patch testing, which automatically exposes behavioral discrepancies between two patches. Our findings reveal critical weaknesses in SWE-bench's patch validation mechanism, which causes 7.8% of all patches to count as correct while failing the developer-written test suite. Moreover, our novel automated technique reveals that even more (29.6%) plausible patches induce different behavior than the ground truth patches. These behavioral differences are often due to similar, but divergent implementations (46.8%) and due to generated patches that adapt more behavior than the ground truth patches (27.3%). Our manual inspection shows that 28.6% of behaviorally divergent patches are certainly incorrect. Combined, the different weaknesses lead to an inflation of reported resolution rates by 6.2 absolute percent points. Our findings are a call to arms for more robust and reliable evaluation of issue-solving tools. We envision our automated differential patch testing technique to be useful for this purpose.

Too many defective compute chips are escaping existing manufacturing tests -- at least an order of magnitude more than industrial targets across all compute chip types in data centers. Silent data corruptions (SDCs) caused by test escapes, when left unaddressed, pose a major threat to reliable computing. We present a three-pronged approach outlining future directions for overcoming test escapes: (a) Quick diagnosis of defective chips directly from system-level incorrect behaviors. Such diagnosis is critical for gaining insights into why so many defective chips escape existing manufacturing testing. (b) In-field detection of defective chips. (c) New test experiments to understand the effectiveness of new techniques for detecting defective chips. These experiments must overcome the drawbacks and pitfalls of previous industrial test experiments and case studies.

Large language models frequently fail to produce correct code on their first attempt, yet most benchmarks evaluate them in a single-shot setting. We investigate iterative self-repair (feeding execution errors back to the model for correction) across seven models spanning three families and both open-weight and proprietary providers: Llama 3.1 8B, Llama 3.3 70B, Llama 4 Scout (MoE, 16 experts), Llama 4 Maverick (MoE, 128 experts), Qwen3 32B, Gemini 2.5 Flash, and Gemini 2.5 Pro. On HumanEval (164 problems) and MBPP Sanitized (257 problems) with up to five attempts, self-repair universally improves pass rates: +4.9 to +17.1 pp on HumanEval and +16.0 to +30.0 pp on MBPP. Gemini 2.5 Flash achieves the highest final pass rates (96.3% HumanEval, 93.8% MBPP). Most gains concentrate in the first two rounds.Error-type analysis shows assertion errors (logical mistakes) are the hardest to repair at ~45%, while syntax and name errors are repaired at substantially higher rates, connecting to broader findings on the limits of LLM self-correction. Prior work found that weaker models fail at self-repair or require fine-tuning; we show that modern instruction-tuned models succeed with prompting alone, even at 8B scale. We also provide the first comparison of dense and MoE architectures for self-repair, and extend the repair-vs-resampling tradeoff analysis to modern models. A prompt ablation reveals chain-of-thought repair yields up to +5.5 pp additional self-repair gain (measured as improvement in repair delta) over minimal prompting for capable models.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

Program synthesis has been long studied with recent approaches focused on directly using the power of Large Language Models (LLMs) to generate code. Programming benchmarks, with curated synthesis problems and test-cases, are used to measure the performance of various LLMs on code synthesis. However, these test-cases can be limited in both quantity and quality for fully assessing the functional correctness of the generated code. Such limitation in the existing benchmarks begs the following question: In the era of LLMs, is the code generated really correct? To answer this, we propose EvalPlus -- a code synthesis evaluation framework to rigorously benchmark the functional correctness of LLM-synthesized code. EvalPlus augments a given evaluation dataset with large amounts of test-cases newly produced by an automatic test input generator, powered by both LLM- and mutation-based strategies. While EvalPlus is general, we extend the test-cases of the popular HumanEval benchmark by 80x to build HumanEval+. Our extensive evaluation across 26 popular LLMs (e.g., GPT-4 and ChatGPT) demonstrates that HumanEval+ is able to catch significant amounts of previously undetected wrong code synthesized by LLMs, reducing the pass@k by up-to 19.3-28.9%. We also surprisingly found that test insufficiency can lead to mis-ranking. For example, both WizardCoder-CodeLlama and Phind-CodeLlama now outperform ChatGPT on HumanEval+, while none of them could on HumanEval. Our work not only indicates that prior popular code synthesis evaluation results do not accurately reflect the true performance of LLMs for code synthesis, but also opens up a new direction to improve such programming benchmarks through automated testing. We have open-sourced our tools, enhanced datasets as well as all LLM-generated code at https://github.com/evalplus/evalplus to facilitate and accelerate future LLM-for-code research.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

APR (Automated Program Repair) aims to automatically locate program defects, generate patches and validate the repairs. Existing techniques for APR are often combined with LLMs (Large Language Models), which leverages the code-related knowledge of LLMs to improve repair effectiveness. Current LLM-based APR methods typically utilize test cases only during the inference stage, adopting an iterative approach that performs repair first and validates it through test execution afterward. This conventional paradigm neglects two important aspects: the potential contribution of test cases in the training phase, and the possibility of leveraging testing prior to repair. To address this, we propose Repair-R1, which introduces test cases into the model's training phase and shifts test generation to precede repair. The model is required to first generate discriminative test cases that can distinguish defective behaviors, and then perform repair based on these tests. This enables the model to better locate defects and understand the underlying causes of defects, thereby improving repair effectiveness. We implement Repair-R1 with three different backbone models, using RL (reinforcement learning) to co-optimize test generation and bug repair. Experimental results on four widely adopted benchmarks demonstrate the superiority of Repair-R1. Specially, compared to vanilla models, Repair-R1 improves repair success rate by 2.68\% to 48.29\%, test generation success rate by 16.38\% to 53.28\%, and test coverage by 0.78\% to 53.96\%. We publish the code and weights at https://github.com/Tomsawyerhu/APR-RL and https://huggingface.co/tomhu/Qwen3-4B-RL-5000-step.

Program repair techniques offer cost-saving benefits for debugging within software development and programming education scenarios. With the proven effectiveness of Large Language Models (LLMs) in code-related tasks, researchers have explored their potential for program repair. However, it is crucial to recognize that existing repair benchmarks may have influenced LLM training data, potentially causing data leakage. To evaluate LLMs' realistic repair capabilities, (1) we introduce an extensive, non-crawled benchmark, referred to as TutorCode, comprising 1,239 C++ defect codes and associated information such as tutor guidance, solution description, failing test cases, and the corrected code. Our work assesses the repair performance of 12 LLMs on TutorCode, measuring repair correctness (TOP-5 and AVG-5) and patch precision (RPSR). (2) We then provide a comprehensive investigation into which types of extra information can help LLMs improve their performance in repairing defects. Among these types, tutor guidance was found to be the most effective information in enhancing LLM repair capabilities. To fully harness LLMs' conversational capabilities and the benefits of augmented information, (3) we introduce a novel conversational semi-automatic repair framework CREF assisting human tutor. It demonstrates a remarkable AVG-5 improvement of 17.2%-24.6% compared to the baseline, achieving an impressive AVG-5 of 76.6% when utilizing GPT-4. These results highlight the potential for enhancing LLMs' repair capabilities through interactions with tutors and historical conversations involving incorrect responses. The successful application of CREF in a real-world educational setting demonstrates its effectiveness in reducing tutors' workload and improving students' learning experience, while also showcasing its promise for facilitating other software engineering tasks, such as code review.

Recently, multiple Automated Program Repair (APR) techniques based on Large Language Models (LLMs) have been proposed to enhance the repair performance. While these techniques mainly focus on the single-line or hunk-level repair, they face significant challenges in real-world application due to the limited repair task scope and costly statement-level fault localization. However, the more practical function-level APR, which broadens the scope of APR task to fix entire buggy functions and requires only cost-efficient function-level fault localization, remains underexplored. In this paper, we conduct the first comprehensive study of LLM-based function-level APR including investigating the effect of the few-shot learning mechanism and the auxiliary repair-relevant information. Specifically, we adopt six widely-studied LLMs and construct a benchmark in both the Defects4J 1.2 and 2.0 datasets. Our study demonstrates that LLMs with zero-shot learning are already powerful function-level APR techniques, while applying the few-shot learning mechanism leads to disparate repair performance. Moreover, we find that directly applying the auxiliary repair-relevant information to LLMs significantly increases function-level repair performance. Inspired by our findings, we propose an LLM-based function-level APR technique, namely SRepair, which adopts a dual-LLM framework to leverage the power of the auxiliary repair-relevant information for advancing the repair performance. The evaluation results demonstrate that SRepair can correctly fix 300 single-function bugs in the Defects4J dataset, largely surpassing all previous APR techniques by at least 85%, without the need for the costly statement-level fault location information. Furthermore, SRepair successfully fixes 32 multi-function bugs in the Defects4J dataset, which is the first time achieved by any APR technique ever to our best knowledge.

Current approaches to program synthesis with Large Language Models (LLMs) exhibit a "near miss syndrome": they tend to generate programs that semantically resemble the correct answer (as measured by text similarity metrics or human evaluation), but achieve a low or even zero accuracy as measured by unit tests due to small imperfections, such as the wrong input or output format. This calls for an approach known as Synthesize, Execute, Debug (SED), whereby a draft of the solution is generated first, followed by a program repair phase addressing the failed tests. To effectively apply this approach to instruction-driven LLMs, one needs to determine which prompts perform best as instructions for LLMs, as well as strike a balance between repairing unsuccessful programs and replacing them with newly generated ones. We explore these trade-offs empirically, comparing replace-focused, repair-focused, and hybrid debug strategies, as well as different template-based and model-based prompt-generation techniques. We use OpenAI Codex as the LLM and Program Synthesis Benchmark 2 as a database of problem descriptions and tests for evaluation. The resulting framework outperforms both conventional usage of Codex without the repair phase and traditional genetic programming approaches.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning electron microscope (SEM) images and the diverse textures of the defects pose significant challenges. Traditional methods usually suffer from insufficient data, labels, and poor transferability. In this paper, we propose a novel few-shot learning approach, SEM-CLIP, for accurate defect classification and segmentation. SEM-CLIP customizes the Contrastive Language-Image Pretraining (CLIP) model to better focus on defect areas and minimize background distractions, thereby enhancing segmentation accuracy. We employ text prompts enriched with domain knowledge as prior information to assist in precise analysis. Additionally, our approach incorporates feature engineering with textual guidance to categorize defects more effectively. SEM-CLIP requires little annotated data, substantially reducing labor demands in the semiconductor industry. Extensive experimental validation demonstrates that our model achieves impressive classification and segmentation results under few-shot learning scenarios.

Recent advances in automated test generation utilises language models to produce unit tests. While effective, language models tend to generate many incorrect tests with respect to both syntax and semantics. Although such incorrect tests can be easily detected and discarded, they constitute a "missed opportunity" -- if fixed, they are often valuable as they directly add testing value (they effectively target the underlying program logic to be tested) and indirectly form good seeds for generating additional tests. To this end, we propose a simple technique for repairing some of these incorrect tests through a combination of rule-based static analysis and re-prompting. We evaluate this simple approach, named YATE, on a set of 6 open-source projects and show that it can effectively produce tests that cover on average 32.06% more lines and kill 21.77% more mutants than a plain LLM-based method. We also compare YATE with four other LLM-based methods, namely HITS, SYMPROMPT, TESTSPARK and COVERUP and show that it produces tests that cover substantially more code. YATE achieves 22% higher line coverage, 20% higher branch coverage and kill 20% more mutants at a comparable cost (number of calls to LLMs).

Large Language Models (LLMs) have demonstrated exceptional coding capability. However, as another critical component of programming proficiency, the debugging capability of LLMs remains relatively unexplored. Previous evaluations of LLMs' debugging ability are significantly limited by the risk of data leakage, the scale of the dataset, and the variety of tested bugs. To overcome these deficiencies, we introduce `DebugBench', an LLM debugging benchmark consisting of 4,253 instances. It covers four major bug categories and 18 minor types in C++, Java, and Python. To construct DebugBench, we collect code snippets from the LeetCode community, implant bugs into source data with GPT-4, and assure rigorous quality checks. We evaluate two commercial and three open-source models in a zero-shot scenario. We find that (1) while closed-source models like GPT-4 exhibit inferior debugging performance compared to humans, open-source models such as Code Llama fail to attain any pass rate scores; (2) the complexity of debugging notably fluctuates depending on the bug category; (3) incorporating runtime feedback has a clear impact on debugging performance which is not always helpful. As an extension, we also compare LLM debugging and code generation, revealing a strong correlation between them for closed-source models. These findings will benefit the development of LLMs in debugging.

With the growing reliance on automated code completion tools in software development, the need for robust evaluation benchmarks has become critical. However, existing benchmarks focus more on code generation tasks in function and class level and provide rich text description to prompt the model. By contrast, such descriptive prompt is commonly unavailable in real development and code completion can occur in wider range of situations such as in the middle of a function or a code block. These limitations makes the evaluation poorly align with the practical scenarios of code completion tools. In this paper, we propose RepoMasterEval, a novel benchmark for evaluating code completion models constructed from real-world Python and TypeScript repositories. Each benchmark datum is generated by masking a code snippet (ground truth) from one source code file with existing test suites. To improve test accuracy of model generated code, we employ mutation testing to measure the effectiveness of the test cases and we manually crafted new test cases for those test suites with low mutation score. Our empirical evaluation on 6 state-of-the-art models shows that test argumentation is critical in improving the accuracy of the benchmark and RepoMasterEval is able to report difference in model performance in real-world scenarios. The deployment of RepoMasterEval in a collaborated company for one month also revealed that the benchmark is useful to give accurate feedback during model training and the score is in high correlation with the model's performance in practice. Based on our findings, we call for the software engineering community to build more LLM benchmarks tailored for code generation tools taking the practical and complex development environment into consideration.

The rapid advancement of Large Language Models (LLMs) in software engineering has revealed critical limitations in existing benchmarks, particularly the widely used SWE-bench dataset. Recent studies have uncovered severe data contamination issues, e.g. SWE-bench reports 32.67% of successful patches involve direct solution leakage and 31.08% pass due to inadequate test cases. We introduce SWE-MERA, a dynamic, continuously updated benchmark designed to address these fundamental challenges through an automated collection of real-world GitHub issues and rigorous quality validation. Our approach implements a reliable pipeline that ensures quality while minimizing contamination risks, resulting in approximately 10,000 potential tasks with 300 samples currently available. Evaluation using the Aider coding agent demonstrates strong discriminative power in state-of-the-art models. We report performance across a dozen recent LLMs evaluated on tasks collected between September 2024 and June 2025.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

Efficient bug resolution is critical for maintaining software quality and user satisfaction. However, specific bug reports experience unusually long resolution times, which may indicate underlying process inefficiencies or complex issues. This study presents a comprehensive analysis of bug resolution anomalies across seven prominent open-source repositories: Cassandra, Firefox, Hadoop, HBase, SeaMonkey, Spark, and Thunderbird. Utilizing statistical methods such as Z-score and Interquartile Range (IQR), we identify anomalies in bug resolution durations. To understand the thematic nature of these anomalies, we apply Term Frequency-Inverse Document Frequency (TF-IDF) for textual feature extraction and KMeans clustering to group similar bug summaries. Our findings reveal consistent patterns across projects, with anomalies often clustering around test failures, enhancement requests, and user interface issues. This approach provides actionable insights for project maintainers to prioritize and effectively address long-standing bugs.

Large language models (LLMs) are increasingly used for tasks that require complex reasoning. Most benchmarks focus on final outcomes but overlook the intermediate reasoning steps - such as planning, revision, and decision making under resource constraints. We argue that measuring these internal processes is essential for understanding model behavior and improving reliability. We propose using strategic games as a natural evaluation environment: closed, rule-based systems with clear states, limited resources, and automatic feedback. We introduce a framework that evaluates LLMs along three core dimensions: planning, revision, and resource-constrained decision making. To operationalize this, we define metrics beyond win rate, including overcorrection risk rate, correction success rate, improvement slope, and over-budget ratio. In 4320 adversarial rounds across 12 leading models, ChatGPT-o3-mini achieves the top composite score, with a win rate of 74.7 percent, a correction success rate of 78.6 percent, and an improvement slope of 0.041. By contrast, Qwen-Plus, despite an overcorrection risk rate of 81.6 percent, wins only 25.6 percent of its matches - primarily due to excessive resource use. We also observe a negative correlation between overcorrection risk rate and correction success rate (Pearson r = -0.51, p = 0.093), suggesting that more frequent edits do not always improve outcomes. Our findings highlight the value of assessing not only what LLMs decide but how they arrive at those decisions

Large Language Models (LLMs) have been gaining increasing attention and demonstrated promising performance across a variety of Software Engineering (SE) tasks, such as Automated Program Repair (APR), code summarization, and code completion. For example, ChatGPT, the latest black-box LLM, has been investigated by numerous recent research studies and has shown impressive performance in various tasks. However, there exists a potential risk of data leakage since these LLMs are usually close-sourced with unknown specific training details, e.g., pre-training datasets. In this paper, we seek to review the bug-fixing capabilities of ChatGPT on a clean APR benchmark with different research objectives. We first introduce {\benchmark}, a new benchmark with buggy and the corresponding fixed programs from competitive programming problems starting from 2023, after the training cutoff point of ChatGPT. The results on {\benchmark} show that ChatGPT is able to fix 109 out of 151 buggy programs using the basic prompt within 35 independent rounds, outperforming state-of-the-art LLMs CodeT5 and PLBART by 27.5\% and 62.4\% prediction accuracy. We also investigate the impact of three types of prompts, i.e., problem description, error feedback, and bug localization, leading to additional 34 fixed bugs. Besides, we provide additional discussion from the interactive nature of ChatGPT to illustrate the capacity of a dialog-based repair workflow with 9 additional fixed bugs. Inspired by the findings, we further pinpoint various challenges and opportunities for advanced SE study equipped with such LLMs (e.g.,~ChatGPT) in the near future. More importantly, our work calls for more research on the reevaluation of the achievements obtained by existing black-box LLMs across various SE tasks, not limited to ChatGPT on APR.

Software engineers develop, fine-tune, and deploy deep learning (DL) models. They use and re-use models in a variety of development frameworks and deploy them on a range of runtime environments. In this diverse ecosystem, engineers use DL model converters to move models from frameworks to runtime environments. However, errors in converters can compromise model quality and disrupt deployment. The failure frequency and failure modes of DL model converters are unknown. In this paper, we conduct the first failure analysis on DL model converters. Specifically, we characterize failures in model converters associated with ONNX (Open Neural Network eXchange). We analyze past failures in the ONNX converters in two major DL frameworks, PyTorch and TensorFlow. The symptoms, causes, and locations of failures (for N=200 issues), and trends over time are also reported. We also evaluate present-day failures by converting 8,797 models, both real-world and synthetically generated instances. The consistent result from both parts of the study is that DL model converters commonly fail by producing models that exhibit incorrect behavior: 33% of past failures and 8% of converted models fell into this category. Our results motivate future research on making DL software simpler to maintain, extend, and validate.

Bug reports contain the information developers need to triage and fix software bugs. However, unclear, incomplete, or ambiguous information may lead to delays and excessive manual effort spent on bug triage and resolution. In this paper, we explore whether Instruction fine-tuned Large Language Models (LLMs) can automatically transform casual, unstructured bug reports into high-quality, structured bug reports adhering to a standard template. We evaluate three open-source instruction-tuned LLMs (Qwen 2.5, Mistral, and Llama 3.2) against ChatGPT-4o, measuring performance on established metrics such as CTQRS, ROUGE, METEOR, and SBERT. Our experiments show that fine-tuned Qwen 2.5 achieves a CTQRS score of 77%, outperforming both fine-tuned Mistral (71%), Llama 3.2 (63%) and ChatGPT in 3-shot learning (75%). Further analysis reveals that Llama 3.2 shows higher accuracy of detecting missing fields particularly Expected Behavior and Actual Behavior, while Qwen 2.5 demonstrates superior performance in capturing Steps-to-Reproduce, with an F1 score of 76%. Additional testing of the models on other popular projects (e.g., Eclipse, GCC) demonstrates that our approach generalizes well, achieving up to 70% CTQRS in unseen projects' bug reports. These findings highlight the potential of instruction fine-tuning in automating structured bug report generation, reducing manual effort for developers and streamlining the software maintenance process.

In the past couple of decades, significant research efforts are devoted to the prediction of software bugs. However, most existing work in this domain treats all bugs the same, which is not the case in practice. It is important for a defect prediction method to estimate the severity of the identified bugs so that the higher-severity ones get immediate attention. In this study, we investigate source code metrics, source code representation using large language models (LLMs), and their combination in predicting bug severity labels of two prominent datasets. We leverage several source metrics at method-level granularity to train eight different machine-learning models. Our results suggest that Decision Tree and Random Forest models outperform other models regarding our several evaluation metrics. We then use the pre-trained CodeBERT LLM to study the source code representations' effectiveness in predicting bug severity. CodeBERT finetuning improves the bug severity prediction results significantly in the range of 29%-140% for several evaluation metrics, compared to the best classic prediction model on source code metric. Finally, we integrate source code metrics into CodeBERT as an additional input, using our two proposed architectures, which both enhance the CodeBERT model effectiveness.

Tests that cause spurious failures without any code changes, i.e., flaky tests, hamper regression testing, increase maintenance costs, may shadow real bugs, and decrease trust in tests. While the prevalence and importance of flakiness is well established, prior research focused on Java projects, thus raising the question of how the findings generalize. In order to provide a better understanding of the role of flakiness in software development beyond Java, we empirically study the prevalence, causes, and degree of flakiness within software written in Python, one of the currently most popular programming languages. For this, we sampled 22352 open source projects from the popular PyPI package index, and analyzed their 876186 test cases for flakiness. Our investigation suggests that flakiness is equally prevalent in Python as it is in Java. The reasons, however, are different: Order dependency is a much more dominant problem in Python, causing 59% of the 7571 flaky tests in our dataset. Another 28% were caused by test infrastructure problems, which represent a previously undocumented cause of flakiness. The remaining 13% can mostly be attributed to the use of network and randomness APIs by the projects, which is indicative of the type of software commonly written in Python. Our data also suggests that finding flaky tests requires more runs than are often done in the literature: A 95% confidence that a passing test case is not flaky on average would require 170 reruns.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is much more complicated compared to single-type DPR due to varied spatial features, the uncertainty of defects, and the number of defects present. To accurately predict the number of defects as well as the types of defects, we propose a novel compact deformable convolutional transformer (DC Transformer). Specifically, DC Transformer focuses on the global features present in the wafer map by virtue of learnable deformable kernels and multi-head attention to the global features. The proposed method succinctly models the internal relationship between the wafer maps and the defects. DC Transformer is evaluated on a real dataset containing 38 defect patterns. Experimental results show that DC Transformer performs exceptionally well in recognizing both single and mixed-type defects. The proposed method outperforms the current state of the models by a considerable margin

Bug reports often lack sufficient detail for developers to reproduce and fix the underlying defects. Bug Reproduction Tests (BRTs), tests that fail when the bug is present and pass when it has been resolved, are crucial for debugging, but they are rarely included in bug reports, both in open-source and in industrial settings. Thus, automatically generating BRTs from bug reports has the potential to accelerate the debugging process and lower time to repair. This paper investigates automated BRT generation within an industry setting, specifically at Google, focusing on the challenges of a large-scale, proprietary codebase and considering real-world industry bugs extracted from Google's internal issue tracker. We adapt and evaluate a state-of-the-art BRT generation technique, LIBRO, and present our agent-based approach, BRT Agent, which makes use of a fine-tuned Large Language Model (LLM) for code editing. Our BRT Agent significantly outperforms LIBRO, achieving a 28% plausible BRT generation rate, compared to 10% by LIBRO, on 80 human-reported bugs from Google's internal issue tracker. We further investigate the practical value of generated BRTs by integrating them with an Automated Program Repair (APR) system at Google. Our results show that providing BRTs to the APR system results in 30% more bugs with plausible fixes. Additionally, we introduce Ensemble Pass Rate (EPR), a metric which leverages the generated BRTs to select the most promising fixes from all fixes generated by APR system. Our evaluation on EPR for Top-K and threshold-based fix selections demonstrates promising results and trade-offs. For example, EPR correctly selects a plausible fix from a pool of 20 candidates in 70% of cases, based on its top-1 ranking.

Automated Program Repair (APR) attempts to fix software bugs without human intervention, which plays a crucial role in software development and maintenance. Recently, with the advances in Large Language Models (LLMs), a rapidly increasing number of APR techniques have been proposed with remarkable performance. However, existing LLM-based APR techniques typically adopt trial-and-error strategies, which suffer from two major drawbacks: (1) inherently limited patch effectiveness due to local exploration, and (2) low search efficiency due to redundant exploration. In this paper, we propose APRMCTS, which uses iterative tree search to improve LLM-based APR. APRMCTS incorporates Monte Carlo Tree Search (MCTS) into patch searching by performing a global evaluation of the explored patches and selecting the most promising one for subsequent refinement and generation. APRMCTS effectively resolves the problems of falling into local optima and thus helps improve the efficiency of patch searching. Our experiments on 835 bugs from Defects4J demonstrate that, when integrated with GPT-3.5, APRMCTS can fix a total of 201 bugs, which outperforms all state-of-the-art baselines. Besides, APRMCTS helps GPT-4o-mini, GPT-3.5, Yi-Coder-9B, and Qwen2.5-Coder-7B to fix 30, 27, 37, and 28 more bugs, respectively. More importantly, APRMCTS boasts a significant performance advantage while employing small patch size (16 and 32), notably fewer than the 500 and 10,000 patches adopted in previous studies. In terms of cost, compared to existing state-of-the-art LLM-based APR methods, APRMCTS has time and monetary costs of less than 20% and 50%, respectively. Our extensive study demonstrates that APRMCTS exhibits good effectiveness and efficiency, with particular advantages in addressing complex bugs.