Daily Papers

Turning a research idea into a complete paper requires more than text generation: the system must retrieve literature, design and execute experiments, revise claims according to evidence, produce publication-ready figures, and maintain consistency across a long generation process. We present Spark-to-Paper, an end-to-end research paper generation system implemented as thirteen composable skills inside an existing coding assistant, without requiring a separate agent platform or orchestration service. Spark-to-Paper separates model-based judgment from deterministic operations that can be directly executed and checked. It further separates experiment planning from reporting, so that required evidence is specified before results are observed and manuscript claims are revised according to measured outcomes. To improve reliability over long research trajectories, the system combines deterministic integrity checks with self-critique and bounds a failure mode we call the Self-Refutation Loop, in which repeated experiments continue to reject the original research objective. Spark-to-Paper also produces editable vector figures through programmatic plotting for experimental results and code-based reconstruction for generated method diagrams. Across eight controlled research topics, Spark-to-Paper achieves 99.5% citation validity and 96.4% figure editability. A controlled ablation increases fabrication detection from 14% for a single-pass draft to 92% with the full integrity and review stack, while adversarial review achieves 74% precision. The full system uses 11.9M tokens, costs $8.1 per manuscript, and requires 3.2 hours on average. These results show that end-to-end research paper generation can be implemented as a lightweight, composable workflow inside existing coding assistants while keeping experimental evidence central to how claims are accepted, revised, or abandoned.

This paper introduces KnowHalu, a novel approach for detecting hallucinations in text generated by large language models (LLMs), utilizing step-wise reasoning, multi-formulation query, multi-form knowledge for factual checking, and fusion-based detection mechanism. As LLMs are increasingly applied across various domains, ensuring that their outputs are not hallucinated is critical. Recognizing the limitations of existing approaches that either rely on the self-consistency check of LLMs or perform post-hoc fact-checking without considering the complexity of queries or the form of knowledge, KnowHalu proposes a two-phase process for hallucination detection. In the first phase, it identifies non-fabrication hallucinations--responses that, while factually correct, are irrelevant or non-specific to the query. The second phase, multi-form based factual checking, contains five key steps: reasoning and query decomposition, knowledge retrieval, knowledge optimization, judgment generation, and judgment aggregation. Our extensive evaluations demonstrate that KnowHalu significantly outperforms SOTA baselines in detecting hallucinations across diverse tasks, e.g., improving by 15.65% in QA tasks and 5.50% in summarization tasks, highlighting its effectiveness and versatility in detecting hallucinations in LLM-generated content.

Stealthy hardware Trojans (HTs) inserted during the fabrication of integrated circuits can bypass the security of critical infrastructures. Although researchers have proposed many techniques to detect HTs, several limitations exist, including: (i) a low success rate, (ii) high algorithmic complexity, and (iii) a large number of test patterns. Furthermore, the most pertinent drawback of prior detection techniques stems from an incorrect evaluation methodology, i.e., they assume that an adversary inserts HTs randomly. Such inappropriate adversarial assumptions enable detection techniques to claim high HT detection accuracy, leading to a "false sense of security." Unfortunately, to the best of our knowledge, despite more than a decade of research on detecting HTs inserted during fabrication, there have been no concerted efforts to perform a systematic evaluation of HT detection techniques. In this paper, we play the role of a realistic adversary and question the efficacy of HT detection techniques by developing an automated, scalable, and practical attack framework, ATTRITION, using reinforcement learning (RL). ATTRITION evades eight detection techniques across two HT detection categories, showcasing its agnostic behavior. ATTRITION achieves average attack success rates of 47times and 211times compared to randomly inserted HTs against state-of-the-art HT detection techniques. We demonstrate ATTRITION's ability to evade detection techniques by evaluating designs ranging from the widely-used academic suites to larger designs such as the open-source MIPS and mor1kx processors to AES and a GPS module. Additionally, we showcase the impact of ATTRITION-generated HTs through two case studies (privilege escalation and kill switch) on the mor1kx processor. We envision that our work, along with our released HT benchmarks and models, fosters the development of better HT detection techniques.

Collaborative perception, which greatly enhances the sensing capability of connected and autonomous vehicles (CAVs) by incorporating data from external resources, also brings forth potential security risks. CAVs' driving decisions rely on remote untrusted data, making them susceptible to attacks carried out by malicious participants in the collaborative perception system. However, security analysis and countermeasures for such threats are absent. To understand the impact of the vulnerability, we break the ground by proposing various real-time data fabrication attacks in which the attacker delivers crafted malicious data to victims in order to perturb their perception results, leading to hard brakes or increased collision risks. Our attacks demonstrate a high success rate of over 86\% on high-fidelity simulated scenarios and are realizable in real-world experiments. To mitigate the vulnerability, we present a systematic anomaly detection approach that enables benign vehicles to jointly reveal malicious fabrication. It detects 91.5% of attacks with a false positive rate of 3% in simulated scenarios and significantly mitigates attack impacts in real-world scenarios.

The detection and classification of exfoliated two-dimensional (2D) material flakes from optical microscope images can be automated using computer vision algorithms. This has the potential to increase the accuracy and objectivity of classification and the efficiency of sample fabrication, and it allows for large-scale data collection. Existing algorithms often exhibit challenges in identifying low-contrast materials and typically require large amounts of training data. Here, we present a deep learning model, called MaskTerial, that uses an instance segmentation network to reliably identify 2D material flakes. The model is extensively pre-trained using a synthetic data generator, that generates realistic microscopy images from unlabeled data. This results in a model that can to quickly adapt to new materials with as little as 5 to 10 images. Furthermore, an uncertainty estimation model is used to finally classify the predictions based on optical contrast. We evaluate our method on eight different datasets comprising five different 2D materials and demonstrate significant improvements over existing techniques in the detection of low-contrast materials such as hexagonal boron nitride.

Fake news detection is crucial for preventing the dissemination of misinformation on social media. To differentiate fake news from real ones, existing methods observe the language patterns of the news post and "zoom in" to verify its content with knowledge sources or check its readers' replies. However, these methods neglect the information in the external news environment where a fake news post is created and disseminated. The news environment represents recent mainstream media opinion and public attention, which is an important inspiration of fake news fabrication because fake news is often designed to ride the wave of popular events and catch public attention with unexpected novel content for greater exposure and spread. To capture the environmental signals of news posts, we "zoom out" to observe the news environment and propose the News Environment Perception Framework (NEP). For each post, we construct its macro and micro news environment from recent mainstream news. Then we design a popularity-oriented and a novelty-oriented module to perceive useful signals and further assist final prediction. Experiments on our newly built datasets show that the NEP can efficiently improve the performance of basic fake news detectors.

Vision-Language Models (VLMs) are increasingly deployed in settings where reliable visual grounding carries operational consequences, yet their behavior under progressively coercive prompt phrasing remains undercharacterized. Existing hallucination benchmarks predominantly rely on neutral prompts and binary detection, leaving open how both the incidence and the intensity of fabrication respond to graded linguistic pressure across structurally distinct task types. We present Ghost-100, a procedurally constructed benchmark of 800 synthetically generated images spanning eight categories across three task families: text-illegibility, time-reading, and object-absence, each designed under a negative-ground-truth principle that guarantees the queried target is absent, illegible, or indeterminate by construction. Every image is paired with five prompts drawn from a structured 5-Level Prompt Intensity Framework, holding the image and task identity fixed while varying only directive force, so that tone is isolated as the sole independent variable. We adopt a dual-track evaluation protocol: a rule-based H-Rate measuring the proportion of responses in which a model crosses from grounded refusal into unsupported positive commitment, and a GPT-4o-mini-judged H-Score on a 1-5 scale characterizing the confidence and specificity of fabrication once it occurs. We additionally release a three-stage automated validation workflow, which retrospectively confirms 717 of 800 images as strictly compliant. Evaluating nine open-weight VLMs, we find that H-Rate and H-Score dissociate substantially across model families, reading-style and presence-detection subsets respond to prompt pressure in qualitatively different ways, and several models exhibit non-monotonic sensitivity peaking at intermediate tone levels: patterns that aggregate metrics obscure.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

While tactile sensing is widely accepted as an important and useful sensing modality, its use pales in comparison to other sensory modalities like vision and proprioception. AnySkin addresses the critical challenges that impede the use of tactile sensing -- versatility, replaceability, and data reusability. Building on the simplistic design of ReSkin, and decoupling the sensing electronics from the sensing interface, AnySkin simplifies integration making it as straightforward as putting on a phone case and connecting a charger. Furthermore, AnySkin is the first uncalibrated tactile-sensor with cross-instance generalizability of learned manipulation policies. To summarize, this work makes three key contributions: first, we introduce a streamlined fabrication process and a design tool for creating an adhesive-free, durable and easily replaceable magnetic tactile sensor; second, we characterize slip detection and policy learning with the AnySkin sensor; and third, we demonstrate zero-shot generalization of models trained on one instance of AnySkin to new instances, and compare it with popular existing tactile solutions like DIGIT and ReSkin. Videos of experiments, fabrication details and design files can be found on https://any-skin.github.io/

In this paper, we introduce an approach for detecting modifications in assembled printed circuit boards based on photographs taken without tight control over perspective and illumination conditions. One instance of this problem is the visual inspection of gas pumps PCBs, which can be modified by fraudsters wishing to deceive costumers or evade taxes. Given the uncontrolled environment and the huge number of possible modifications, we address the problem as a case of anomaly detection, proposing an approach that is directed towards the characteristics of that scenario, while being well-suited for other similar applications. The proposed approach employs a deep convolutional autoencoder trained to reconstruct images of an unmodified board, but which remains unable to do the same for images showing modifications. By comparing the input image with its reconstruction, it is possible to segment anomalies and modifications in a pixel-wise manner. Experiments performed on a dataset built to represent real-world situations (and which we will make publicly available) show that our approach outperforms other state-of-the-art approaches for anomaly segmentation in the considered scenario, while producing comparable results on the popular MVTec-AD dataset for a more general object anomaly detection task.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

Surface anomaly detection is a vital component in manufacturing inspection. Current discriminative methods follow a two-stage architecture composed of a reconstructive network followed by a discriminative network that relies on the reconstruction output. Currently used reconstructive networks often produce poor reconstructions that either still contain anomalies or lack details in anomaly-free regions. Discriminative methods are robust to some reconstructive network failures, suggesting that the discriminative network learns a strong normal appearance signal that the reconstructive networks miss. We reformulate the two-stage architecture into a single-stage iterative process that allows the exchange of information between the reconstruction and localization. We propose a novel transparency-based diffusion process where the transparency of anomalous regions is progressively increased, restoring their normal appearance accurately while maintaining the appearance of anomaly-free regions using localization cues of previous steps. We implement the proposed process as TRANSparency DifFUSION (TransFusion), a novel discriminative anomaly detection method that achieves state-of-the-art performance on both the VisA and the MVTec AD datasets, with an image-level AUROC of 98.5% and 99.2%, respectively. Code: https://github.com/MaticFuc/ECCV_TransFusion

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

Unsupervised texture anomaly detection has been a concerning topic in a vast amount of industrial processes. Patterned textures inspection, particularly in the context of fabric defect detection, is indeed a widely encountered use case. This task involves handling a diverse spectrum of colors and textile types, encompassing a wide range of fabrics. Given the extensive variability in colors, textures, and defect types, fabric defect detection poses a complex and challenging problem in the field of patterned textures inspection. In this article, we propose a knowledge distillation-based approach tailored specifically for addressing the challenge of unsupervised anomaly detection in textures resembling fabrics. Our method aims to redefine the recently introduced reverse distillation approach, which advocates for an encoder-decoder design to mitigate classifier bias and to prevent the student from reconstructing anomalies. In this study, we present a new reverse distillation technique for the specific task of fabric defect detection. Our approach involves a meticulous design selection that strategically highlights high-level features. To demonstrate the capabilities of our approach both in terms of performance and inference speed, we conducted a series of experiments on multiple texture datasets, including MVTEC AD, AITEX, and TILDA, alongside conducting experiments on a dataset acquired from a textile manufacturing facility. The main contributions of this paper are the following: a robust texture anomaly detector utilizing a reverse knowledge-distillation technique suitable for both anomaly detection and domain generalization and a novel dataset encompassing a diverse range of fabrics and defects.

Anomaly detection is nowadays increasingly used in industrial applications and processes. One of the main fields of the appliance is the visual inspection for surface anomaly detection, which aims to spot regions that deviate from regularity and consequently identify abnormal products. Defect localization is a key task, that usually is achieved using a basic comparison between generated image and the original one, implementing some blob-analysis or image-editing algorithms, in the post-processing step, which is very biased towards the source dataset, and they are unable to generalize. Furthermore, in industrial applications, the totality of the image is not always interesting but could be one or some regions of interest (ROIs), where only in those areas there are relevant anomalies to be spotted. For these reasons, we propose a new architecture composed by two blocks. The first block is a Generative Adversarial Network (GAN), based on a residual autoencoder (ResAE), to perform reconstruction and denoising processes, while the second block produces image segmentation, spotting defects. This method learns from a dataset composed of good products and generated synthetic defects. The discriminative network is trained using a ROI for each image contained in the training dataset. The network will learn in which area anomalies are relevant. This approach guarantees the reduction of using pre-processing algorithms, formerly developed with blob-analysis and image-editing procedures. To test our model we used challenging MVTec anomaly detection datasets and an industrial large dataset of pharmaceutical BFS strips of vials. This set constitutes a more realistic use case of the aforementioned network.

Internal defect detection constitutes a critical process in ensuring component quality, for which anomaly detection serves as an effective solution. However, existing anomaly detection datasets predominantly focus on surface defects in visible-light images, lacking publicly available X-ray datasets targeting internal defects in components. To address this gap, we construct the first publicly accessible component X-ray anomaly detection (CXR-AD) dataset, comprising real-world X-ray images. The dataset covers five industrial component categories, including 653 normal samples and 561 defect samples with precise pixel-level mask annotations. We systematically analyze the dataset characteristics and identify three major technical challenges: (1) strong coupling between complex internal structures and defect regions, (2) inherent low contrast and high noise interference in X-ray imaging, and (3) significant variations in defect scales and morphologies. To evaluate dataset complexity, we benchmark three state-of-the-art anomaly detection frameworks (feature-based, reconstruction-based, and zero-shot learning methods). Experimental results demonstrate a 29.78% average performance degradation on CXR-AD compared to MVTec AD, highlighting the limitations of current algorithms in handling internal defect detection tasks. To the best of our knowledge, CXR-AD represents the first publicly available X-ray dataset for component anomaly detection, providing a real-world industrial benchmark to advance algorithm development and enhance precision in internal defect inspection technologies.

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D Anomaly Detection in Additive Manufacturing dataset, that is the first large-scale, industry-relevant dataset for RGB+3D surface defect detection in additive manufacturing. 3D-ADAM comprises 14,120 high-resolution scans of 217 unique parts, captured with four industrial depth sensors, and includes 27,346 annotated defects across 12 categories along with 27,346 annotations of machine element features in 16 classes. 3D-ADAM is captured in a real industrial environment and as such reflects real production conditions, including variations in part placement, sensor positioning, lighting, and partial occlusion. Benchmarking state-of-the-art models demonstrates that 3D-ADAM presents substantial challenges beyond existing datasets. Validation through expert labelling surveys with industry partners further confirms its industrial relevance. By providing this benchmark, 3D-ADAM establishes a foundation for advancing robust 3D anomaly detection capable of meeting manufacturing demands.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

Logical anomaly detection in industrial inspection remains challenging due to variations in visual appearance (e.g., background clutter, illumination shift, and blur), which often distract vision-centric detectors from identifying rule-level violations. However, existing benchmarks rarely provide controlled settings where logical states are fixed while such nuisance factors vary. To address this gap, we introduce VID-AD, a dataset for logical anomaly detection under vision-induced distraction. It comprises 10 manufacturing scenarios and five capture conditions, totaling 50 one-class tasks and 10,395 images. Each scenario is defined by two logical constraints selected from quantity, length, type, placement, and relation, with anomalies including both single-constraint and combined violations. We further propose a language-based anomaly detection framework that relies solely on text descriptions generated from normal images. Using contrastive learning with positive texts and contradiction-based negative texts synthesized from these descriptions, our method learns embeddings that capture logical attributes rather than low-level features. Extensive experiments demonstrate consistent improvements over baselines across the evaluated settings. The dataset is available at: https://github.com/nkthiroto/VID-AD.

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to identify the defects. These methods are generally very huge and have significant inference time. They also require GPU support to efficiently operate. All these issues make these models not fit for on-line prediction in the manufacturing foundry. In this paper, we propose an extremely simple yet effective technique to extract features from wafer images. The proposed method is extremely fast, intuitive, and non-parametric while being explainable. The experiment results show that the proposed pipeline outperforms conventional deep learning models. Our feature extraction requires no training or fine-tuning while preserving the relative shape and location of data points as revealed by our interpretability analysis.

We present a novel large-scale dataset for defect detection in a logistics setting. Recent work on industrial anomaly detection has primarily focused on manufacturing scenarios with highly controlled poses and a limited number of object categories. Existing benchmarks like MVTec-AD [6] and VisA [33] have reached saturation, with state-of-the-art methods achieving up to 99.9% AUROC scores. In contrast to manufacturing, anomaly detection in retail logistics faces new challenges, particularly in the diversity and variability of object pose and appearance. Leading anomaly detection methods fall short when applied to this new setting. To bridge this gap, we introduce a new benchmark that overcomes the current limitations of existing datasets. With over 230,000 images (and more than 29,000 defective instances), it is 40 times larger than MVTec-AD and contains more than 48,000 distinct objects. To validate the difficulty of the problem, we conduct an extensive evaluation of multiple state-of-the-art anomaly detection methods, demonstrating that they do not surpass 56.96% AUROC on our dataset. Further qualitative analysis confirms that existing methods struggle to leverage normal samples under heavy pose and appearance variation. With our large-scale dataset, we set a new benchmark and encourage future research towards solving this challenging problem in retail logistics anomaly detection. The dataset is available for download under https://www.kaputt-dataset.com.

In industrial settings, surface defects on steel can significantly compromise its service life and elevate potential safety risks. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low efficiency and high costs. Although automated defect detection approaches based on Convolutional Neural Networks(e.g., Mask R-CNN) have advanced rapidly, their reliability remains challenged due to data annotation uncertainties during deep model training and overfitting issues. These limitations may lead to detection deviations when processing the given new test samples, rendering automated detection processes unreliable. To address this challenge, we first evaluate the detection model's practical performance through calibration data that satisfies the independent and identically distributed (i.i.d) condition with test data. Specifically, we define a loss function for each calibration sample to quantify detection error rates, such as the complement of recall rate and false discovery rate. Subsequently, we derive a statistically rigorous threshold based on a user-defined risk level to identify high-probability defective pixels in test images, thereby constructing prediction sets (e.g., defect regions). This methodology ensures that the expected error rate (mean error rate) on the test set remains strictly bounced by the predefined risk level. Additionally, we observe a negative correlation between the average prediction set size and the risk level on the test set, establishing a statistically rigorous metric for assessing detection model uncertainty. Furthermore, our study demonstrates robust and efficient control over the expected test set error rate across varying calibration-to-test partitioning ratios, validating the method's adaptability and operational effectiveness.

We present the Open Stamped Parts Dataset (OSPD), featuring synthetic and real images of stamped metal sheets for auto manufacturing. The real part images, captured from 7 cameras, consist of 7,980 unlabeled images and 1,680 labeled images. In addition, we have compiled a defect dataset by overlaying synthetically generated masks on 10\% of the holes. The synthetic dataset replicates the real manufacturing environment in terms of lighting and part placement relative to the cameras. The synthetic data includes 7,980 training images, 1,680 validation images and 1,680 test images, each with bounding box and segmentation mask annotations around all holes. 10\% of the holes in the synthetic data mimic defects generated in the real image dataset. We trained a hole-detection model on the synthetic-OSPD, achieving a modified recall score of 67.2\% and a precision of 94.4\% . We anticipate researchers in auto manufacturing use OSPD to advance the state of the art in defect detection of stamped holes in the metal-sheet stamping process. The dataset is available for download at: https://tinyurl.com/hm6xatd7.

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD.

Visual anomaly detection is commonly used in industrial quality inspection. In this paper, we present a new dataset as well as a new self-supervised learning method for ImageNet pre-training to improve anomaly detection and segmentation in 1-class and 2-class 5/10/high-shot training setups. We release the Visual Anomaly (VisA) Dataset consisting of 10,821 high-resolution color images (9,621 normal and 1,200 anomalous samples) covering 12 objects in 3 domains, making it the largest industrial anomaly detection dataset to date. Both image and pixel-level labels are provided. We also propose a new self-supervised framework - SPot-the-difference (SPD) - which can regularize contrastive self-supervised pre-training, such as SimSiam, MoCo and SimCLR, to be more suitable for anomaly detection tasks. Our experiments on VisA and MVTec-AD dataset show that SPD consistently improves these contrastive pre-training baselines and even the supervised pre-training. For example, SPD improves Area Under the Precision-Recall curve (AU-PR) for anomaly segmentation by 5.9% and 6.8% over SimSiam and supervised pre-training respectively in the 2-class high-shot regime. We open-source the project at http://github.com/amazon-research/spot-diff .

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet

3D anomaly detection plays a crucial role in monitoring parts for localized inherent defects in precision manufacturing. Embedding-based and reconstruction-based approaches are among the most popular and successful methods. However, there are two major challenges to the practical application of the current approaches: 1) the embedded models suffer the prohibitive computational and storage due to the memory bank structure; 2) the reconstructive models based on the MAE mechanism fail to detect anomalies in the unmasked regions. In this paper, we propose R3D-AD, reconstructing anomalous point clouds by diffusion model for precise 3D anomaly detection. Our approach capitalizes on the data distribution conversion of the diffusion process to entirely obscure the input's anomalous geometry. It step-wisely learns a strict point-level displacement behavior, which methodically corrects the aberrant points. To increase the generalization of the model, we further present a novel 3D anomaly simulation strategy named Patch-Gen to generate realistic and diverse defect shapes, which narrows the domain gap between training and testing. Our R3D-AD ensures a uniform spatial transformation, which allows straightforwardly generating anomaly results by distance comparison. Extensive experiments show that our R3D-AD outperforms previous state-of-the-art methods, achieving 73.4% Image-level AUROC on the Real3D-AD dataset and 74.9% Image-level AUROC on the Anomaly-ShapeNet dataset with an exceptional efficiency.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

Industry 4.0 has revolutionized manufacturing by driving digitalization and shifting the paradigm toward additive manufacturing (AM). Fused Deposition Modeling (FDM), a key AM technology, enables the creation of highly customized, cost-effective products with minimal material waste through layer-by-layer extrusion, posing a significant challenge to traditional subtractive methods. However, the susceptibility of material extrusion techniques to errors often requires expert intervention to detect and mitigate defects that can severely compromise product quality. While automated error detection and machine learning models exist, their generalizability across diverse 3D printer setups, firmware, and sensors is limited, and deep learning methods require extensive labeled datasets, hindering scalability and adaptability. To address these challenges, we present a process monitoring and control framework that leverages pre-trained Large Language Models (LLMs) alongside 3D printers to detect and address printing defects. The LLM evaluates print quality by analyzing images captured after each layer or print segment, identifying failure modes and querying the printer for relevant parameters. It then generates and executes a corrective action plan. We validated the effectiveness of the proposed framework in identifying defects by comparing it against a control group of engineers with diverse AM expertise. Our evaluation demonstrated that LLM-based agents not only accurately identify common 3D printing errors, such as inconsistent extrusion, stringing, warping, and layer adhesion, but also effectively determine the parameters causing these failures and autonomously correct them without any need for human intervention.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

Industrial visual sim-to-real is often described as transferring from synthetic images to real images, but industrial deployment usually involves a broader mismatch between available evidence and required decisions. A system may be built from CAD renderings, simulated RGB-D observations, normal reference images, synthetic defects, pretrained feature spaces, or language prompts, yet deployed under different sensors, lighting, materials, fixtures, calibration, production variation, and rare defect modes. This review reframes industrial visual sim-to-real as a domain-gap problem organized by prior availability. We distinguish CAD-available settings, where explicit object geometry can support rendering, calibration, pose estimation, segmentation, and test-time geometric verification; CAD-unavailable settings, where geometry is replaced by normal-reference appearance, feature distributions, teacher-student residuals, synthetic anomaly assumptions, foundation features, or vision-language priors; and boundary-prior settings, where approximate models, templates, reference views, or semantic correspondences preserve only part of the CAD role. This framing connects CAD-based detection and 6D pose-estimation literature with industrial anomaly and surface-inspection literature that is usually reviewed separately. To make the taxonomy concrete, we use empirical anchors on T-LESS/BOP, MVTec AD, and VisA. The anchors show that CAD render count alone does not close transfer; source-distribution design, detector capacity, and small real calibration can matter more. They also show that CAD at test time creates a distinct verification channel through mask, pose, and depth consistency, whereas CAD-unavailable inspection relies on calibrated normality and feature deviation. The review therefore argues against a single cross-task leaderboard and instead asks what prior grounds the deployment decision.

Visual anomaly detection is critical in industrial manufacturing, but traditional methods often rely on extensive normal datasets and custom models, limiting scalability. Recent advancements in large-scale visual-language models have significantly improved zero/few-shot anomaly detection. However, these approaches may not fully utilize hierarchical features, potentially missing nuanced details. We introduce a window self-attention mechanism based on the CLIP model, combined with learnable prompts to process multi-level features within a Soldier-Offier Window self-Attention (SOWA) framework. Our method has been tested on five benchmark datasets, demonstrating superior performance by leading in 18 out of 20 metrics compared to existing state-of-the-art techniques.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Industrial visual inspection in pharmaceutical production requires high accuracy under strict constraints on cycle time, hardware footprint, and operational cost. Manual inline inspection is still common, but it is affected by operator variability and limited throughput. Classical rule-based computer vision pipelines are often rigid and difficult to scale to highly variable production scenarios. To address these limitations, we present a semi-supervised anomaly detection framework based on a generative adversarial architecture with a residual autoencoder and a dense bottleneck, specifically designed for online deployment on a high-speed Blow-Fill-Seal (BFS) line. The model is trained only on nominal samples and detects anomalies through reconstruction residuals, providing both classification and spatial localization via heatmaps. The training set contains 2,815,200 grayscale patches. Experiments on a real industrial test kit show high detection performance while satisfying timing constraints compatible with a 500 ms acquisition slot.

One persistent obstacle in industrial quality inspection is the detection of anomalies. In real-world use cases, two problems must be addressed: anomalous data is sparse and the same types of anomalies need to be detected on previously unseen objects. Current anomaly detection approaches can be trained with sparse nominal data, whereas domain generalization approaches enable detecting objects in previously unseen domains. Utilizing those two observations, we introduce the hybrid task of domain generalization on sparse classes. To introduce an accompanying dataset for this task, we present a modification of the well-established MVTec AD dataset by generating three new datasets. In addition to applying existing methods for benchmark, we design two embedding-based approaches, Spatial Embedding MLP (SEMLP) and Labeled PatchCore. Overall, SEMLP achieves the best performance with an average image-level AUROC of 87.2 % vs. 80.4 % by MIRO. The new and openly available datasets allow for further research to improve industrial anomaly detection.

In this paper we present TruFor, a forensic framework that can be applied to a large variety of image manipulation methods, from classic cheapfakes to more recent manipulations based on deep learning. We rely on the extraction of both high-level and low-level traces through a transformer-based fusion architecture that combines the RGB image and a learned noise-sensitive fingerprint. The latter learns to embed the artifacts related to the camera internal and external processing by training only on real data in a self-supervised manner. Forgeries are detected as deviations from the expected regular pattern that characterizes each pristine image. Looking for anomalies makes the approach able to robustly detect a variety of local manipulations, ensuring generalization. In addition to a pixel-level localization map and a whole-image integrity score, our approach outputs a reliability map that highlights areas where localization predictions may be error-prone. This is particularly important in forensic applications in order to reduce false alarms and allow for a large scale analysis. Extensive experiments on several datasets show that our method is able to reliably detect and localize both cheapfakes and deepfakes manipulations outperforming state-of-the-art works. Code is publicly available at https://grip-unina.github.io/TruFor/

In this technical report, we present our solution to the CVPR 2025 Visual Anomaly and Novelty Detection (VAND) 3.0 Workshop Challenge Track 1: Adapt & Detect: Robust Anomaly Detection in Real-World Applications. In real-world industrial anomaly detection, it is crucial to accurately identify anomalies with physical complexity, such as transparent or reflective surfaces, occlusions, and low-contrast contaminations. The recently proposed MVTec AD 2 dataset significantly narrows the gap between publicly available benchmarks and anomalies found in real-world industrial environments. To address the challenges posed by this dataset--such as complex and varying lighting conditions and real anomalies with large scale differences--we propose a fully training-free anomaly detection and segmentation method based on feature extraction using the DINOv2 model named SuperAD. Our method carefully selects a small number of normal reference images and constructs a memory bank by leveraging the strong representational power of DINOv2. Anomalies are then segmented by performing nearest neighbor matching between test image features and the memory bank. Our method achieves competitive results on both test sets of the MVTec AD 2 dataset.

In recent years, performance on existing anomaly detection benchmarks like MVTec AD and VisA has started to saturate in terms of segmentation AU-PRO, with state-of-the-art models often competing in the range of less than one percentage point. This lack of discriminatory power prevents a meaningful comparison of models and thus hinders progress of the field, especially when considering the inherent stochastic nature of machine learning results. We present MVTec AD 2, a collection of eight anomaly detection scenarios with more than 8000 high-resolution images. It comprises challenging and highly relevant industrial inspection use cases that have not been considered in previous datasets, including transparent and overlapping objects, dark-field and back light illumination, objects with high variance in the normal data, and extremely small defects. We provide comprehensive evaluations of state-of-the-art methods and show that their performance remains below 60% average AU-PRO. Additionally, our dataset provides test scenarios with lighting condition changes to assess the robustness of methods under real-world distribution shifts. We host a publicly accessible evaluation server that holds the pixel-precise ground truth of the test set (https://benchmark.mvtec.com/). All image data is available at https://www.mvtec.com/company/research/datasets/mvtec-ad-2.

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.

The paper explores the industrial multimodal Anomaly Detection (AD) task, which exploits point clouds and RGB images to localize anomalies. We introduce a novel light and fast framework that learns to map features from one modality to the other on nominal samples. At test time, anomalies are detected by pinpointing inconsistencies between observed and mapped features. Extensive experiments show that our approach achieves state-of-the-art detection and segmentation performance in both the standard and few-shot settings on the MVTec 3D-AD dataset while achieving faster inference and occupying less memory than previous multimodal AD methods. Moreover, we propose a layer-pruning technique to improve memory and time efficiency with a marginal sacrifice in performance.

Existing tampering detection benchmarks largely rely on object masks, which severely misalign with the true edit signal: many pixels inside a mask are untouched or only trivially modified, while subtle yet consequential edits outside the mask are treated as natural. We reformulate VLM image tampering from coarse region labels to a pixel-grounded, meaning and language-aware task. First, we introduce a taxonomy spanning edit primitives (replace/remove/splice/inpaint/attribute/colorization, etc.) and their semantic class of tampered object, linking low-level changes to high-level understanding. Second, we release a new benchmark with per-pixel tamper maps and paired category supervision to evaluate detection and classification within a unified protocol. Third, we propose a training framework and evaluation metrics that quantify pixel-level correctness with localization to assess confidence or prediction on true edit intensity, and further measure tamper meaning understanding via semantics-aware classification and natural language descriptions for the predicted regions. We also re-evaluate the existing strong segmentation/localization baselines on recent strong tamper detectors and reveal substantial over- and under-scoring using mask-only metrics, and expose failure modes on micro-edits and off-mask changes. Our framework advances the field from masks to pixels, meanings and language descriptions, establishing a rigorous standard for tamper localization, semantic classification and description. Code and benchmark data are available at https://github.com/VILA-Lab/PIXAR.

We introduce a simple and intuitive self-supervision task, Natural Synthetic Anomalies (NSA), for training an end-to-end model for anomaly detection and localization using only normal training data. NSA integrates Poisson image editing to seamlessly blend scaled patches of various sizes from separate images. This creates a wide range of synthetic anomalies which are more similar to natural sub-image irregularities than previous data-augmentation strategies for self-supervised anomaly detection. We evaluate the proposed method using natural and medical images. Our experiments with the MVTec AD dataset show that a model trained to localize NSA anomalies generalizes well to detecting real-world a priori unknown types of manufacturing defects. Our method achieves an overall detection AUROC of 97.2 outperforming all previous methods that learn without the use of additional datasets. Code available at https://github.com/hmsch/natural-synthetic-anomalies.

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the effectiveness of ML in wafer defect identification, there is a noticeable absence of comprehensive reviews on this subject. This survey attempts to fill this void by amalgamating available literature and providing an in-depth analysis of the advantages, limitations, and potential applications of various ML classification algorithms in the realm of wafer defect detection. An innovative taxonomy of methodologies that we present provides a detailed classification of algorithms into more refined categories and techniques. This taxonomy follows a three-tier structure, starting from broad methodology categories and ending with specific techniques. It aids researchers in comprehending the complex relationships between different algorithms and their techniques. We employ a rigorous empirical and experimental evaluation to rank these varying techniques. For the empirical evaluation, we assess techniques based on a set of five criteria. The experimental evaluation ranks the algorithms employing the same techniques, sub-categories, and categories. Also the paper illuminates the future prospects of ML classification techniques for wafer defect identification, underscoring potential advancements and opportunities for further research in this field

Industrial quality inspection plays a critical role in modern manufacturing by identifying defective products during production. While single-modality approaches using either 3D point clouds or 2D RGB images suffer from information incompleteness, multimodal anomaly detection offers promise through the complementary fusion of crossmodal data. However, existing methods face challenges in effectively integrating unimodal results and improving discriminative power. To address these limitations, we first reinterpret memory bank-based anomaly scores in single modalities as isotropic Euclidean distances in local feature spaces. Dynamically evolving from Euclidean metrics, we propose a novel Geometry-Guided Score Fusion (G^{2}SF) framework that progressively learns an anisotropic local distance metric as a unified score for the fusion task. Through a geometric encoding operator, a novel Local Scale Prediction Network (LSPN) is proposed to predict direction-aware scaling factors that characterize first-order local feature distributions, thereby enhancing discrimination between normal and anomalous patterns. Additionally, we develop specialized loss functions and score aggregation strategy from geometric priors to ensure both metric generalization and efficacy. Comprehensive evaluations on the MVTec-3D AD and Eyecandies datasets demonstrate the state-of-the-art detection performance of our method, and detailed ablation analysis validates each component's contribution. Our code is available at https://github.com/ctaoaa/G2SF.

Anomaly Detection (AD) focuses on detecting samples that differ from the standard pattern, making it a vital tool in process control. Logical anomalies may appear visually normal yet violate predefined constraints on object presence, arrangement, or quantity, depending on reasoning and explainability. We introduce LogicQA, a framework that enhances AD by providing industrial operators with explanations for logical anomalies. LogicQA compiles automatically generated questions into a checklist and collects responses to identify violations of logical constraints. LogicQA is training-free, annotation-free, and operates in a few-shot setting. We achieve state-of-the-art (SOTA) Logical AD performance on public benchmarks, MVTec LOCO AD, with an AUROC of 87.6 percent and an F1-max of 87.0 percent along with the explanations of anomalies. Also, our approach has shown outstanding performance on semiconductor SEM corporate data, further validating its effectiveness in industrial applications.

Visual anomaly detection is essential and commonly used for many tasks in the field of computer vision. Recent anomaly detection datasets mainly focus on industrial automated inspection, medical image analysis and video surveillance. In order to broaden the application and research of anomaly detection in unmanned supermarkets and smart manufacturing, we introduce the supermarket goods anomaly detection (GoodsAD) dataset. It contains 6124 high-resolution images of 484 different appearance goods divided into 6 categories. Each category contains several common different types of anomalies such as deformation, surface damage and opened. Anomalies contain both texture changes and structural changes. It follows the unsupervised setting and only normal (defect-free) images are used for training. Pixel-precise ground truth regions are provided for all anomalies. Moreover, we also conduct a thorough evaluation of current state-of-the-art unsupervised anomaly detection methods. This initial benchmark indicates that some methods which perform well on the industrial anomaly detection dataset (e.g., MVTec AD), show poor performance on our dataset. This is a comprehensive, multi-object dataset for supermarket goods anomaly detection that focuses on real-world applications.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

Industrial anomaly detection is generally addressed as an unsupervised task that aims at locating defects with only normal training samples. Recently, numerous 2D anomaly detection methods have been proposed and have achieved promising results, however, using only the 2D RGB data as input is not sufficient to identify imperceptible geometric surface anomalies. Hence, in this work, we focus on multi-modal anomaly detection. Specifically, we investigate early multi-modal approaches that attempted to utilize models pre-trained on large-scale visual datasets, i.e., ImageNet, to construct feature databases. And we empirically find that directly using these pre-trained models is not optimal, it can either fail to detect subtle defects or mistake abnormal features as normal ones. This may be attributed to the domain gap between target industrial data and source data.Towards this problem, we propose a Local-to-global Self-supervised Feature Adaptation (LSFA) method to finetune the adaptors and learn task-oriented representation toward anomaly detection.Both intra-modal adaptation and cross-modal alignment are optimized from a local-to-global perspective in LSFA to ensure the representation quality and consistency in the inference stage.Extensive experiments demonstrate that our method not only brings a significant performance boost to feature embedding based approaches, but also outperforms previous State-of-The-Art (SoTA) methods prominently on both MVTec-3D AD and Eyecandies datasets, e.g., LSFA achieves 97.1% I-AUROC on MVTec-3D, surpass previous SoTA by +3.4%.

We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal training data only. We first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at a random location of a large image. Our empirical study on MVTec anomaly detection dataset demonstrates the proposed algorithm is general to be able to detect various types of real-world defects. We bring the improvement upon previous arts by 3.1 AUCs when learning representations from scratch. By transfer learning on pretrained representations on ImageNet, we achieve a new state-of-theart 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localizing defective areas without annotations during training.

Recent advances in generative models enable highly realistic image manipulations, creating an urgent need for robust forgery detection methods. Current datasets for training and evaluating these methods are limited in scale and diversity. To address this, we propose a methodology for creating high-quality inpainting datasets and apply it to create DiQuID, comprising over 95,000 inpainted images generated from 78,000 original images sourced from MS-COCO, RAISE, and OpenImages. Our methodology consists of three components: (1) Semantically Aligned Object Replacement (SAOR) that identifies suitable objects through instance segmentation and generates contextually appropriate prompts, (2) Multiple Model Image Inpainting (MMII) that employs various state-of-the-art inpainting pipelines primarily based on diffusion models to create diverse manipulations, and (3) Uncertainty-Guided Deceptiveness Assessment (UGDA) that evaluates image realism through comparative analysis with originals. The resulting dataset surpasses existing ones in diversity, aesthetic quality, and technical quality. We provide comprehensive benchmarking results using state-of-the-art forgery detection methods, demonstrating the dataset's effectiveness in evaluating and improving detection algorithms. Through a human study with 42 participants on 1,000 images, we show that while humans struggle with images classified as deceiving by our methodology, models trained on our dataset maintain high performance on these challenging cases. Code and dataset are available at https://github.com/mever-team/DiQuID.

Diffusion models are rapidly redefining 3D anomaly detection in point cloud data. As 3D sensing becomes integral to modern manufacturing, reliable anomaly detection is essential for high-throughput quality assurance and process control. Yet practical deployment on resource-constrained, latency-critical systems remains limited. Existing methods are often computationally prohibitive or unreliable in complex, unmasked regions, and diffusion pipelines are inherently bottlenecked by iterative denoising. In this work, we address this bottleneck by reformulating reconstructionbased anomaly detection through consistency learning, enabling direct prediction of anomaly-free geometry in one or two network evaluations. We further introduce a novel hybrid loss formulation that explicitly enforces reconstruction toward clean data. This design substantially reduces inference cost, achieving up to 80x faster runtime than the current state-of-the-art method, without GPU acceleration, while preserving strong detection performance. It outperforms R3D-AD on Anomaly-ShapeNet with 76.20% I-AUROC and remains competitive on Real3DAD with 72.80% I-AUROC, enabling efficient, low-latency anomaly detection on resource-constrained platforms, including drones, smart industrial cameras, and other edge devices.

Recent surface anomaly detection methods excel at identifying structural anomalies, such as dents and scratches, but struggle with logical anomalies, such as irregular or missing object components. The best-performing logical anomaly detection approaches rely on aggregated pretrained features or handcrafted descriptors (most often derived from composition maps), which discard spatial and semantic information, leading to suboptimal performance. We propose SALAD, a semantics-aware discriminative logical anomaly detection method that incorporates a newly proposed composition branch to explicitly model the distribution of object composition maps, consequently learning important semantic relationships. Additionally, we introduce a novel procedure for extracting composition maps that requires no hand-made labels or category-specific information, in contrast to previous methods. By effectively modelling the composition map distribution, SALAD significantly improves upon state-of-the-art methods on the standard benchmark for logical anomaly detection, MVTec LOCO, achieving an impressive image-level AUROC of 96.1%. Code: https://github.com/MaticFuc/SALAD

In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning electron microscope (SEM) images and the diverse textures of the defects pose significant challenges. Traditional methods usually suffer from insufficient data, labels, and poor transferability. In this paper, we propose a novel few-shot learning approach, SEM-CLIP, for accurate defect classification and segmentation. SEM-CLIP customizes the Contrastive Language-Image Pretraining (CLIP) model to better focus on defect areas and minimize background distractions, thereby enhancing segmentation accuracy. We employ text prompts enriched with domain knowledge as prior information to assist in precise analysis. Additionally, our approach incorporates feature engineering with textual guidance to categorize defects more effectively. SEM-CLIP requires little annotated data, substantially reducing labor demands in the semiconductor industry. Extensive experimental validation demonstrates that our model achieves impressive classification and segmentation results under few-shot learning scenarios.

Unsupervised anomaly in industry has been a concerning topic and a stepping stone for high performance industrial automation process. The vast majority of industry-oriented methods focus on learning from good samples to detect anomaly notwithstanding some specific industrial scenario requiring even less specific training and therefore a generalization for anomaly detection. The obvious use case is the fabric anomaly detection, where we have to deal with a really wide range of colors and types of textile and a stoppage of the production line for training could not be considered. In this paper, we propose an automation process for industrial fabric texture defect detection with a specificity-learning process during the domain-generalized anomaly detection. Combining the ability to generalize and the learning process offer a fast and precise anomaly detection and segmentation. The main contributions of this paper are the following: A domain-generalization texture anomaly detection method achieving the state-of-the-art performances, a fast specific training on good samples extracted by the proposed method, a self-evaluation method based on custom defect creation and an automatic detection of already seen fabric to prevent re-training.

Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.

Anti-forensics seeks to eliminate or conceal traces of tampering artifacts. Typically, anti-forensic methods are designed to deceive binary detectors and persuade them to misjudge the authenticity of an image. However, to the best of our knowledge, no attempts have been made to deceive forgery detectors at the pixel level and mis-locate forged regions. Traditional adversarial attack methods cannot be directly used against forgery localization due to the following defects: 1) they tend to just naively induce the target forensic models to flip their pixel-level pristine or forged decisions; 2) their anti-forensics performance tends to be severely degraded when faced with the unseen forensic models; 3) they lose validity once the target forensic models are retrained with the anti-forensics images generated by them. To tackle the three defects, we propose SEAR (Self-supErvised Anti-foRensics), a novel self-supervised and adversarial training algorithm that effectively trains deep-learning anti-forensic models against forgery localization. SEAR sets a pretext task to reconstruct perturbation for self-supervised learning. In adversarial training, SEAR employs a forgery localization model as a supervisor to explore tampering features and constructs a deep-learning concealer to erase corresponding traces. We have conducted largescale experiments across diverse datasets. The experimental results demonstrate that, through the combination of self-supervised learning and adversarial learning, SEAR successfully deceives the state-of-the-art forgery localization methods, as well as tackle the three defects regarding traditional adversarial attack methods mentioned above.

Anomaly inspection plays a vital role in industrial manufacturing, but the scarcity of anomaly samples significantly limits the effectiveness of existing methods in tasks such as localization and classification. While several anomaly synthesis approaches have been introduced for data augmentation, they often struggle with low realism, inaccurate mask alignment, and poor generalization. To overcome these limitations, we propose Generate Aligned Anomaly (GAA), a region-guided, few-shot anomaly image-mask pair generation framework. GAA leverages the strong priors of a pretrained latent diffusion model to generate realistic, diverse, and semantically aligned anomalies using only a small number of samples. The framework first employs Localized Concept Decomposition to jointly model the semantic features and spatial information of anomalies, enabling flexible control over the type and location of anomalies. It then utilizes Adaptive Multi-Round Anomaly Clustering to perform fine-grained semantic clustering of anomaly concepts, thereby enhancing the consistency of anomaly representations. Subsequently, a region-guided mask generation strategy ensures precise alignment between anomalies and their corresponding masks, while a low-quality sample filtering module is introduced to further improve the overall quality of the generated samples. Extensive experiments on the MVTec AD and LOCO datasets demonstrate that GAA achieves superior performance in both anomaly synthesis quality and downstream tasks such as localization and classification.

Printed Circuit Board (PCB) assurance in the optical domain is a crucial field of study. Though there are many existing PCB assurance methods using image processing, computer vision (CV), and machine learning (ML), the PCB field is complex and increasingly evolving so new techniques are required to overcome the emerging problems. Existing ML-based methods outperform traditional CV methods, however they often require more data, have low explainability, and can be difficult to adapt when a new technology arises. To overcome these challenges, CV methods can be used in tandem with ML methods. In particular, human-interpretable CV algorithms such as those that extract color, shape, and texture features increase PCB assurance explainability. This allows for incorporation of prior knowledge, which effectively reduce the number of trainable ML parameters and thus, the amount of data needed to achieve high accuracy when training or retraining an ML model. Hence, this study explores the benefits and limitations of a variety of common computer vision-based features for the task of PCB component detection using semantic data. Results of this study indicate that color features demonstrate promising performance for PCB component detection. The purpose of this paper is to facilitate collaboration between the hardware assurance, computer vision, and machine learning communities.

Multimodal industrial anomaly detection has largely focused on discrete products using strongly correlated RGB and 3D observations, leaving continuous process manufacturing and weakly correlated sensing modalities underexplored. We introduce LIBAD, the first multimodal anomaly detection benchmark for Li-ion battery electrode manufacturing. Collected from real roll-to-roll production lines, LIBAD provides aligned double-sided visible-light imaging, high-resolution X-ray radiography, and inline-compatible low-resolution X-ray radiography. Electrode patches in LIBAD exhibit highly homogeneous material appearance, while defect evidence can be strong in one modality but weak or absent in another, resulting in pronounced cross-modal anomaly inconsistency. Benchmarks of representative methods under the inline-compatible visible-light and low-resolution X-ray setting exhibit limited transferability and consistently high false-positive rates. We therefore propose DA-Core, a memory-based method that jointly considers feature-space coverage and local density of normal features during coreset selection, allowing compact memory banks to better preserve fine-grained normal variations. With a coreset ratio of 0.05, DA-Core reduces FPR95 from 60.4% to 54.3% compared with standard farthest point sampling. At this ratio, DA-Core also outperforms the best standard coreset result (obtained at 0.20) while reducing inference time by 43.9%. These results suggest that both the data distribution of normal features and the modality relationship itself require explicit consideration when designing anomaly detection methods for process manufacturing.

Recent advancements in quality control across various industries have increasingly utilized the integration of video cameras and image processing for effective defect detection. A critical barrier to progress is the scarcity of comprehensive datasets featuring annotated defects, which are essential for developing and refining automated defect detection models. This systematic review, spanning from 2015 to 2023, identifies 15 publicly available datasets and critically examines them to assess their effectiveness and applicability for benchmarking and model development. Our findings reveal a diverse landscape of datasets, such as NEU-CLS, NEU-DET, DAGM, KolektorSDD, PCB Defect Dataset, and the Hollow Cylindrical Defect Detection Dataset, each with unique strengths and limitations in terms of image quality, defect type representation, and real-world applicability. The goal of this systematic review is to consolidate these datasets in a single location, providing researchers who seek such publicly available resources with a comprehensive reference.

Automatic security inspection using computer vision technology is a challenging task in real-world scenarios due to various factors, including intra-class variance, class imbalance, and occlusion. Most of the previous methods rarely solve the cases that the prohibited items are deliberately hidden in messy objects due to the lack of large-scale datasets, restricted their applications in real-world scenarios. Towards real-world prohibited item detection, we collect a large-scale dataset, named as PIDray, which covers various cases in real-world scenarios for prohibited item detection, especially for deliberately hidden items. With an intensive amount of effort, our dataset contains 12 categories of prohibited items in 47,677 X-ray images with high-quality annotated segmentation masks and bounding boxes. To the best of our knowledge, it is the largest prohibited items detection dataset to date. Meanwhile, we design the selective dense attention network (SDANet) to construct a strong baseline, which consists of the dense attention module and the dependency refinement module. The dense attention module formed by the spatial and channel-wise dense attentions, is designed to learn the discriminative features to boost the performance. The dependency refinement module is used to exploit the dependencies of multi-scale features. Extensive experiments conducted on the collected PIDray dataset demonstrate that the proposed method performs favorably against the state-of-the-art methods, especially for detecting the deliberately hidden items.

Visual surface anomaly detection aims to detect local image regions that significantly deviate from normal appearance. Recent surface anomaly detection methods rely on generative models to accurately reconstruct the normal areas and to fail on anomalies. These methods are trained only on anomaly-free images, and often require hand-crafted post-processing steps to localize the anomalies, which prohibits optimizing the feature extraction for maximal detection capability. In addition to reconstructive approach, we cast surface anomaly detection primarily as a discriminative problem and propose a discriminatively trained reconstruction anomaly embedding model (DRAEM). The proposed method learns a joint representation of an anomalous image and its anomaly-free reconstruction, while simultaneously learning a decision boundary between normal and anomalous examples. The method enables direct anomaly localization without the need for additional complicated post-processing of the network output and can be trained using simple and general anomaly simulations. On the challenging MVTec anomaly detection dataset, DRAEM outperforms the current state-of-the-art unsupervised methods by a large margin and even delivers detection performance close to the fully-supervised methods on the widely used DAGM surface-defect detection dataset, while substantially outperforming them in localization accuracy.

3D anomaly detection (3D-AD) plays a critical role in industrial manufacturing, particularly in ensuring the reliability and safety of core equipment components. Although existing 3D datasets like Real3D-AD and MVTec 3D-AD offer broad application support, they fall short in capturing the complexities and subtle defects found in real industrial environments. This limitation hampers precise anomaly detection research, especially for industrial equipment components (IEC) such as bearings, rings, and bolts. To address this challenge, we have developed a point cloud anomaly detection dataset (IEC3D-AD) specific to real industrial scenarios. This dataset is directly collected from actual production lines, ensuring high fidelity and relevance. Compared to existing datasets, IEC3D-AD features significantly improved point cloud resolution and defect annotation granularity, facilitating more demanding anomaly detection tasks. Furthermore, inspired by generative 2D-AD methods, we introduce a novel 3D-AD paradigm (GMANet) on IEC3D-AD. This paradigm generates synthetic point cloud samples based on geometric morphological analysis, then reduces the margin and increases the overlap between normal and abnormal point-level features through spatial discrepancy optimization. Extensive experiments demonstrate the effectiveness of our method on both IEC3D-AD and other datasets.

We present a new framework for Patch Distribution Modeling, PaDiM, to concurrently detect and localize anomalies in images in a one-class learning setting. PaDiM makes use of a pretrained convolutional neural network (CNN) for patch embedding, and of multivariate Gaussian distributions to get a probabilistic representation of the normal class. It also exploits correlations between the different semantic levels of CNN to better localize anomalies. PaDiM outperforms current state-of-the-art approaches for both anomaly detection and localization on the MVTec AD and STC datasets. To match real-world visual industrial inspection, we extend the evaluation protocol to assess performance of anomaly localization algorithms on non-aligned dataset. The state-of-the-art performance and low complexity of PaDiM make it a good candidate for many industrial applications.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

Anomaly inspection plays an important role in industrial manufacture. Existing anomaly inspection methods are limited in their performance due to insufficient anomaly data. Although anomaly generation methods have been proposed to augment the anomaly data, they either suffer from poor generation authenticity or inaccurate alignment between the generated anomalies and masks. To address the above problems, we propose AnomalyDiffusion, a novel diffusion-based few-shot anomaly generation model, which utilizes the strong prior information of latent diffusion model learned from large-scale dataset to enhance the generation authenticity under few-shot training data. Firstly, we propose Spatial Anomaly Embedding, which consists of a learnable anomaly embedding and a spatial embedding encoded from an anomaly mask, disentangling the anomaly information into anomaly appearance and location information. Moreover, to improve the alignment between the generated anomalies and the anomaly masks, we introduce a novel Adaptive Attention Re-weighting Mechanism. Based on the disparities between the generated anomaly image and normal sample, it dynamically guides the model to focus more on the areas with less noticeable generated anomalies, enabling generation of accurately-matched anomalous image-mask pairs. Extensive experiments demonstrate that our model significantly outperforms the state-of-the-art methods in generation authenticity and diversity, and effectively improves the performance of downstream anomaly inspection tasks. The code and data are available in https://github.com/sjtuplayer/anomalydiffusion.

Anomaly detection in industrial visual inspection is challenging due to the scarcity of defective samples. Most existing methods rely on unsupervised reconstruction using only normal data, often resulting in overfitting and poor detection of subtle defects. We propose a semi-supervised deep reinforcement learning framework that integrates a neural batch sampler, an autoencoder, and a predictor. The RL-based sampler adaptively selects informative patches by balancing exploration and exploitation through a composite reward. The autoencoder generates loss profiles highlighting abnormal regions, while the predictor performs segmentation in the loss-profile space. This interaction enables the system to effectively learn both normal and defective patterns with limited labeled data. Experiments on the MVTec AD dataset demonstrate that our method achieves higher accuracy and better localization of subtle anomalies than recent state-of-the-art approaches while maintaining low complexity, yielding an average improvement of 0.15 in F1_max and 0.06 in AUC, with a maximum gain of 0.37 in F1_max in the best case.

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

This expository paper introduces a simplified approach to image-based quality inspection in manufacturing using OpenAI's CLIP (Contrastive Language-Image Pretraining) model adapted for few-shot learning. While CLIP has demonstrated impressive capabilities in general computer vision tasks, its direct application to manufacturing inspection presents challenges due to the domain gap between its training data and industrial applications. We evaluate CLIP's effectiveness through five case studies: metallic pan surface inspection, 3D printing extrusion profile analysis, stochastic textured surface evaluation, automotive assembly inspection, and microstructure image classification. Our results show that CLIP can achieve high classification accuracy with relatively small learning sets (50-100 examples per class) for single-component and texture-based applications. However, the performance degrades with complex multi-component scenes. We provide a practical implementation framework that enables quality engineers to quickly assess CLIP's suitability for their specific applications before pursuing more complex solutions. This work establishes CLIP-based few-shot learning as an effective baseline approach that balances implementation simplicity with robust performance, demonstrated in several manufacturing quality control applications.

While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging. This paper presents a procedural rendering pipeline that generates large-scale annotated synthetic training data using BlenderProc, with configurable material appearance, camera modes, and domain randomization, producing automatic COCO-format annotations. To show the potential of our approach, we evaluate four training strategies, namely synthetic-only, real-only, mixed, and fine-tuning from synthetic weights, across two objects with different material properties and three lightweight edge-deployable detectors, YOLOX, YOLO26, and LW-DETR. Our evaluation show that fine-tuning from synthetic weights consistently outperforms real-only training, and that mixed training effectively recovers performance under scarce real-data conditions, with findings validated across both convolutional and transformer-based architectures. The proposed approach enables scalable defect detection without the burden of large real annotated datasets, making it practical for on-device industrial inspection. The pipeline scripts, 3D model, and both synthetic and real annotated scratch datasets for a glossy toy Ferrari car will be made available through the project website upon acceptance.

Although self-supervised 3D anomaly detection assumes that acquiring high-precision point clouds is computationally expensive, in real manufacturing scenarios it is often feasible to collect a limited number of anomalous samples. Therefore, we study open-set supervised 3D anomaly detection, where the model is trained with only normal samples and a small number of known anomalous samples, aiming to identify unknown anomalies at test time. We present Open-Industry, a high-quality industrial dataset containing 15 categories, each with five real anomaly types collected from production lines. We first adapt general open-set anomaly detection methods to accommodate 3D point cloud inputs better. Building upon this, we propose Open3D-AD, a point-cloud-oriented approach that leverages normal samples, simulated anomalies, and partially observed real anomalies to model the probability density distributions of normal and anomalous data. Then, we introduce a simple Correspondence Distributions Subsampling to reduce the overlap between normal and non-normal distributions, enabling stronger dual distributions modeling. Based on these contributions, we establish a comprehensive benchmark and evaluate the proposed method extensively on Open-Industry as well as established datasets including Real3D-AD and Anomaly-ShapeNet. Benchmark results and ablation studies demonstrate the effectiveness of Open3D-AD and further reveal the potential of open-set supervised 3D anomaly detection.

The recent rapid development of deep learning has laid a milestone in industrial Image Anomaly Detection (IAD). In this paper, we provide a comprehensive review of deep learning-based image anomaly detection techniques, from the perspectives of neural network architectures, levels of supervision, loss functions, metrics and datasets. In addition, we extract the new setting from industrial manufacturing and review the current IAD approaches under our proposed our new setting. Moreover, we highlight several opening challenges for image anomaly detection. The merits and downsides of representative network architectures under varying supervision are discussed. Finally, we summarize the research findings and point out future research directions. More resources are available at https://github.com/M-3LAB/awesome-industrial-anomaly-detection.

Printed Circuit Boards are the foundation for the functioning of any electronic device, and therefore are an essential component for various industries such as automobile, communication, computation, etc. However, one of the challenges faced by the PCB manufacturers in the process of manufacturing of the PCBs is the faulty placement of its components including missing components. In the present scenario the infrastructure required to ensure adequate quality of the PCB requires a lot of time and effort. The authors present a novel solution for detecting missing components and classifying them in a resourceful manner. The presented algorithm focuses on pixel theory and object detection, which has been used in combination to optimize the results from the given dataset.

Given the huge volume of cross-border flows, effective and efficient control of trade becomes more crucial in protecting people and society from illicit trade. However, limited accessibility of the transaction-level trade datasets hinders the progress of open research, and lots of customs administrations have not benefited from the recent progress in data-based risk management. In this paper, we introduce an import declaration dataset to facilitate the collaboration between domain experts in customs administrations and researchers from diverse domains, such as data science and machine learning. The dataset contains 54,000 artificially generated trades with 22 key attributes, and it is synthesized with conditional tabular GAN while maintaining correlated features. Synthetic data has several advantages. First, releasing the dataset is free from restrictions that do not allow disclosing the original import data. The fabrication step minimizes the possible identity risk which may exist in trade statistics. Second, the published data follow a similar distribution to the source data so that it can be used in various downstream tasks. Hence, our dataset can be used as a benchmark for testing the performance of any classification algorithm. With the provision of data and its generation process, we open baseline codes for fraud detection tasks, as we empirically show that more advanced algorithms can better detect fraud.

Automated detection of defects in Printed Circuit Board (PCB) manufacturing using Solder Paste Inspection (SPI) and Automated Optical Inspection (AOI) machines can help improve operational efficiency and significantly reduce the need for manual intervention. In this paper, using SPI-extracted features of 6 million pins, we demonstrate a data-centric approach to train Machine Learning (ML) models to detect PCB defects at three stages of PCB manufacturing. The 6 million PCB pins correspond to 2 million components that belong to 15,387 PCBs. Using a base extreme gradient boosting (XGBoost) ML model, we iterate on the data pre-processing step to improve detection performance. Combining pin-level SPI features using component and PCB IDs, we developed training instances also at the component and PCB level. This allows the ML model to capture any inter-pin, inter-component, or spatial effects that may not be apparent at the pin level. Models are trained at the pin, component, and PCB levels, and the detection results from the different models are combined to identify defective components.

Anomaly detection is essential for robotic perception and industrial inspection, yet most benchmarks are collected under controlled conditions with fixed viewpoints and stable illumination. These settings do not reflect robotic deployment, where camera pose, lighting, and surface reflectance vary continuously. We present RAD (Realistic Anomaly Detection), a robot-captured multi-view benchmark for pose-agnostic anomaly detection. RAD contains 5,848 RGB images from 13 everyday object categories, captured from 68 viewpoints per object with a Franka robotic arm and an RGB-D camera under uncontrolled lighting. The dataset covers four realistic defect types: scratched, missing, stained, and squeezed, with pixel-level annotations for localization. We benchmark representative 2D feature-based methods, 3D reconstruction pipelines, and vision-language models under a realistic setting in which test poses are unknown. Results show a clear gap between performance on conventional benchmarks and performance on RAD. Strong 2D feature-embedding methods remain the most reliable at image-level detection, whereas 3D approaches are more competitive for pixel-level localization but remain vulnerable to reflective materials, geometric symmetry, and sparse viewpoint coverage. Vision-language models perform poorly in both classification and localization. RAD provides a challenging testbed for robust robotic inspection and highlights open problems in jointly modeling appearance, geometry, and viewpoint uncertainty. Our website and code are available at https://chang-xinhai.github.io/rad-website/.

Parts manufactured with Fused Deposition Modeling (FDM) often require Design for Additive Manufacturing (DFAM) modifications to ensure printability, structural integrity, and reduced post-processing. Current slicers identify defects such as steep overhangs but are unable to modify the underlying geometry. This work presents AgentsCAD, a multi-agent system that bridges raw boundary-representation (B-Rep) geometry and Large Language Model (LLM) reasoning to automate targeted DFM. The workflow begins by parsing a STEP file. The agentic system detects overhangs above a 45°threshold, constructs a face-adjacency topology graph, and optionally injects semantic feature labels from a GraphSAGE model trained on MFCAD++ (59,665 parts), before dispatching a Claude Sonnet design-reasoning agent that recommends reorientations, fillets, chamfers, and similar modifications. A GPT-4o vision-language verifier inspects rendered views to confirm geometric integrity. Outputs include a modified STEP file and a human-readable report. A test case on a birdhouse model demonstrates that the system correctly diagnoses overhangs, selects appropriate defect mitigation strategies, and proposes physically valid corrections, partially solving the geometry-to-language translation problem central to LLM-driven CAD modification.

The most widely used method for obtaining high-quality two-dimensional materials is through mechanical exfoliation of bulk crystals. Manual identification of suitable flakes from the resulting random distribution of crystal thicknesses and sizes on a substrate is a time-consuming, tedious task. Here, we present a platform for fully automated scanning, detection, and classification of two-dimensional materials, the source code of which we make openly available. Our platform is designed to be accurate, reliable, fast, and versatile in integrating new materials, making it suitable for everyday laboratory work. The implementation allows fully automated scanning and analysis of wafers with an average inference time of 100 ms for images of 2.3 Mpixels. The developed detection algorithm is based on a combination of the flakes' optical contrast toward the substrate and their geometric shape. We demonstrate that it is able to detect the majority of exfoliated flakes of various materials, with an average recall (AR50) between 67% and 89%. We also show that the algorithm can be trained with as few as five flakes of a given material, which we demonstrate for the examples of few-layer graphene, WSe_2, MoSe_2, CrI_3, 1T-TaS_2 and hexagonal BN. Our platform has been tested over a two-year period, during which more than 10^6 images of multiple different materials were acquired by over 30 individual researchers.

There can be numerous electronic components on a given PCB, making the task of visual inspection to detect defects very time-consuming and prone to error, especially at scale. There has thus been significant interest in automatic PCB component detection, particularly leveraging deep learning. However, deep neural networks typically require high computational resources, possibly limiting their feasibility in real-world use cases in manufacturing, which often involve high-volume and high-throughput detection with constrained edge computing resource availability. As a result of an exploration of efficient deep neural network architectures for this use case, we introduce PCBDet, an attention condenser network design that provides state-of-the-art inference throughput while achieving superior PCB component detection performance compared to other state-of-the-art efficient architecture designs. Experimental results show that PCBDet can achieve up to 2times inference speed-up on an ARM Cortex A72 processor when compared to an EfficientNet-based design while achieving sim2-4\% higher mAP on the FICS-PCB benchmark dataset.

Computer-aided design (CAD) is crucial in prototyping 3D objects through geometric instructions (i.e., CAD programs). In practical design workflows, designers often engage in time-consuming reviews and refinements of these prototypes by comparing them with reference images. To bridge this gap, we introduce the CAD review task to automatically detect and correct potential errors, ensuring consistency between the constructed 3D objects and reference images. However, recent advanced multimodal large language models (MLLMs) struggle to recognize multiple geometric components and perform spatial geometric operations within the CAD program, leading to inaccurate reviews. In this paper, we propose the CAD program repairer (ReCAD) framework to effectively detect program errors and provide helpful feedback on error correction. Additionally, we create a dataset, CADReview, consisting of over 20K program-image pairs, with diverse errors for the CAD review task. Extensive experiments demonstrate that our ReCAD significantly outperforms existing MLLMs, which shows great potential in design applications.

In recent years, Printed Circuit Boards (PCB) have become the backbone of a large number of consumer electronic devices leading to a surge in their production. This has made it imperative to employ automatic inspection systems to identify manufacturing defects in PCB before they are installed in the respective systems. An important task in this regard is the classification of defects as either true or pseudo defects, which decides if the PCB is to be re-manufactured or not. This work proposes a novel approach to detect most common defects in the PCBs. The problem has been approached by employing highly discriminative features based on multi-scale wavelet transform, which are further boosted by using a kernalized version of the support vector machines (SVM). A real world printed circuit board dataset has been used for quantitative analysis. Experimental results demonstrated the efficacy of the proposed method.

Due to scarcity of anomaly situations in the early manufacturing stage, an unsupervised anomaly detection (UAD) approach is widely adopted which only uses normal samples for training. This approach is based on the assumption that the trained UAD model will accurately reconstruct normal patterns but struggles with unseen anomalous patterns. To enhance the UAD performance, reconstruction-by-inpainting based methods have recently been investigated, especially on the masking strategy of suspected defective regions. However, there are still issues to overcome: 1) time-consuming inference due to multiple masking, 2) output inconsistency by random masking strategy, and 3) inaccurate reconstruction of normal patterns when the masked area is large. Motivated by this, we propose a novel reconstruction-by-inpainting method, dubbed Excision And Recovery (EAR), that features single deterministic masking based on the ImageNet pre-trained DINO-ViT and visual obfuscation for hint-providing. Experimental results on the MVTec AD dataset show that deterministic masking by pre-trained attention effectively cuts out suspected defective regions and resolve the aforementioned issues 1 and 2. Also, hint-providing by mosaicing proves to enhance the UAD performance than emptying those regions by binary masking, thereby overcomes issue 3. Our approach achieves a high UAD performance without any change of the neural network structure. Thus, we suggest that EAR be adopted in various manufacturing industries as a practically deployable solution.

Visual anomaly detection has been widely used in industrial inspection and medical diagnosis. Existing methods typically demand substantial training samples, limiting their utility in zero-/few-shot scenarios. While recent efforts have leveraged CLIP's zero-shot recognition capability for this task, they often ignore optimizing visual features to focus on local anomalies, reducing their efficacy. In this work, we propose AF-CLIP (Anomaly-Focused CLIP) by dramatically enhancing its visual representations to focus on local defects. Our approach introduces a lightweight adapter that emphasizes anomaly-relevant patterns in visual features, simultaneously optimizing both class-level features for image classification and patch-level features for precise localization. To capture anomalies of different sizes and improve detection accuracy, prior to the adapter, we develop a multi-scale spatial aggregation mechanism to effectively consolidate neighborhood context. Complementing these visual enhancements, we design learnable textual prompts that generically characterize normal and abnormal states. After optimization on auxiliary datasets using a composite objective function, AF-CLIP demonstrates strong zero-shot detection capability. Our method is also extended to few-shot scenarios by extra memory banks. Experimental results across diverse industrial and medical datasets demonstrate the effectiveness and generalization of our proposed method. Code is available at https://github.com/Faustinaqq/AF-CLIP.

Benefiting from generalizability of vision-language models (VLMs) such as CLIP, many zero-/few-shot anomaly detection (AD) approaches have achieved impressive detection performance across various datasets. Nevertheless, they require substantial training on large auxiliary datasets to adapt VLMs to anomaly detection, and their inference largely relies on visual-text embedding similarity-based anomaly scores, lacking reasoning abilities to detect complex anomalies that require in-depth contextual understanding. To address this limitation, we propose AnomalyAgent, a novel training-free, agentic framework that leverages the advanced reasoning and generalization capabilities of multimodal large language models (MLLMs) for anomaly detection. The key ingredients include 1) a comprehensive anomaly-centric toolset that enables adaptive MLLM-driven, agentic anomaly reasoning in zero-shot settings, and 2) a customized memory module that grounds anomaly reasoning with few-shot, in-context reference examples. We extend evaluation beyond the detection of simple anomalies (e.g., surface defects like cracks and dents and clear lesions) in widely used benchmarks to more diverse types of anomalies such as logical/contextual anomalies in logistics and manufacturing settings. Extensive experiment results demonstrate that our AnomalyAgent achieves substantially better performance compared to training-free VLM-based AD and generic agentic methods, highlighting its superior generalization capability in both zero-shot and few-shot anomaly detection settings. The code implementation can be find at this address.

Accurate defect segmentation is critical for industrial inspection, yet dense pixel-level annotations are rarely available. A common workaround is to convert inexpensive bounding boxes into pseudo-masks using foundation segmentation models such as the Segment Anything Model (SAM). However, these pseudo-labels are systematically noisy on industrial surfaces, often hallucinating background structure while missing sparse defects. To address this limitation, a noise-robust box-to-pixel distillation framework, Boxes2Pixels, is proposed that treats SAM as a noisy teacher rather than a source of ground-truth supervision. Bounding boxes are converted into pseudo-masks offline by SAM, and a compact student is trained with (i) a hierarchical decoder over frozen DINOv2 features for semantic stability, (ii) an auxiliary binary localization head to decouple sparse foreground discovery from class prediction, and (iii) a one-sided online self-correction mechanism that relaxes background supervision when the student is confident, targeting teacher false negatives. On a manually annotated wind turbine inspection benchmark, the proposed Boxes2Pixels improves anomaly mIoU by +6.97 and binary IoU by +9.71 over the strongest baseline trained under identical weak supervision. Moreover, online self-correction increases the binary recall by +18.56, while the model employs 80\% fewer trainable parameters. Code is available at https://github.com/CLendering/Boxes2Pixels.

In this paper we propose a novel image representation called face X-ray for detecting forgery in face images. The face X-ray of an input face image is a greyscale image that reveals whether the input image can be decomposed into the blending of two images from different sources. It does so by showing the blending boundary for a forged image and the absence of blending for a real image. We observe that most existing face manipulation methods share a common step: blending the altered face into an existing background image. For this reason, face X-ray provides an effective way for detecting forgery generated by most existing face manipulation algorithms. Face X-ray is general in the sense that it only assumes the existence of a blending step and does not rely on any knowledge of the artifacts associated with a specific face manipulation technique. Indeed, the algorithm for computing face X-ray can be trained without fake images generated by any of the state-of-the-art face manipulation methods. Extensive experiments show that face X-ray remains effective when applied to forgery generated by unseen face manipulation techniques, while most existing face forgery detection or deepfake detection algorithms experience a significant performance drop.

Recently, large-scale vision-language models such as CLIP have demonstrated immense potential in zero-shot anomaly segmentation (ZSAS) task, utilizing a unified model to directly detect anomalies on any unseen product with painstakingly crafted text prompts. However, existing methods often assume that the product category to be inspected is known, thus setting product-specific text prompts, which is difficult to achieve in the data privacy scenarios. Moreover, even the same type of product exhibits significant differences due to specific components and variations in the production process, posing significant challenges to the design of text prompts. In this end, we propose a visual context prompting model (VCP-CLIP) for ZSAS task based on CLIP. The insight behind VCP-CLIP is to employ visual context prompting to activate CLIP's anomalous semantic perception ability. In specific, we first design a Pre-VCP module to embed global visual information into the text prompt, thus eliminating the necessity for product-specific prompts. Then, we propose a novel Post-VCP module, that adjusts the text embeddings utilizing the fine-grained features of the images. In extensive experiments conducted on 10 real-world industrial anomaly segmentation datasets, VCP-CLIP achieved state-of-the-art performance in ZSAS task. The code is available at https://github.com/xiaozhen228/VCP-CLIP.

Industrial diagrams such as piping and instrumentation diagrams (P&IDs) are essential for the design, operation, and maintenance of industrial plants. Converting these diagrams into digital form is an important step toward building digital twins and enabling intelligent industrial automation. A central challenge in this digitalization process is accurate object detection. Although recent advances have significantly improved object detection algorithms, there remains a lack of methods to automatically evaluate the quality of their outputs. This paper addresses this gap by introducing a framework that employs Visual Language Models (VLMs) to assess object detection results and guide their refinement. The approach exploits the multimodal capabilities of VLMs to identify missing or inconsistent detections, thereby enabling automated quality assessment and improving overall detection performance on complex industrial diagrams.

The increasing complexity of industrial anomaly detection (IAD) has positioned multimodal detection methods as a focal area of machine vision research. However, dedicated multimodal datasets specifically tailored for IAD remain limited. Pioneering datasets like MVTec 3D have laid essential groundwork in multimodal IAD by incorporating RGB+3D data, but still face challenges in bridging the gap with real industrial environments due to limitations in scale and resolution. To address these challenges, we introduce Real-IAD D3, a high-precision multimodal dataset that uniquely incorporates an additional pseudo3D modality generated through photometric stereo, alongside high-resolution RGB images and micrometer-level 3D point clouds. Real-IAD D3 features finer defects, diverse anomalies, and greater scale across 20 categories, providing a challenging benchmark for multimodal IAD Additionally, we introduce an effective approach that integrates RGB, point cloud, and pseudo-3D depth information to leverage the complementary strengths of each modality, enhancing detection performance. Our experiments highlight the importance of these modalities in boosting detection robustness and overall IAD performance. The dataset and code are publicly accessible for research purposes at https://realiad4ad.github.io/Real-IAD D3

Due to the steadily rising amount of valuable goods in supply chains, tampering detection for parcels is becoming increasingly important. In this work, we focus on the use-case last-mile delivery, where only a single RGB image is taken and compared against a reference from an existing database to detect potential appearance changes that indicate tampering. We propose a tampering detection pipeline that utilizes keypoint detection to identify the eight corner points of a parcel. This permits applying a perspective transformation to create normalized fronto-parallel views for each visible parcel side surface. These viewpoint-invariant parcel side surface representations facilitate the identification of signs of tampering on parcels within the supply chain, since they reduce the problem to parcel side surface matching with pair-wise appearance change detection. Experiments with multiple classical and deep learning-based change detection approaches are performed on our newly collected TAMpering detection dataset for PARcels, called TAMPAR. We evaluate keypoint and change detection separately, as well as in a unified system for tampering detection. Our evaluation shows promising results for keypoint (Keypoint AP 75.76) and tampering detection (81% accuracy, F1-Score 0.83) on real images. Furthermore, a sensitivity analysis for tampering types, lens distortion and viewing angles is presented. Code and dataset are available at https://a-nau.github.io/tampar.

The convergence of LLM-powered research assistants and AI-based peer review systems creates a critical vulnerability: fully automated publication loops where AI-generated research is evaluated by AI reviewers without human oversight. We investigate this through BadScientist, a framework that evaluates whether fabrication-oriented paper generation agents can deceive multi-model LLM review systems. Our generator employs presentation-manipulation strategies requiring no real experiments. We develop a rigorous evaluation framework with formal error guarantees (concentration bounds and calibration analysis), calibrated on real data. Our results reveal systematic vulnerabilities: fabricated papers achieve acceptance rates up to . Critically, we identify concern-acceptance conflict -- reviewers frequently flag integrity issues yet assign acceptance-level scores. Our mitigation strategies show only marginal improvements, with detection accuracy barely exceeding random chance. Despite provably sound aggregation mathematics, integrity checking systematically fails, exposing fundamental limitations in current AI-driven review systems and underscoring the urgent need for defense-in-depth safeguards in scientific publishing.

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a diverse collection of 14 industrial inspection datasets, uniquely poised to meet these challenges. Unlike previous datasets, VISION brings versatility to defect detection, offering annotation masks across all splits and catering to various detection methodologies. Our datasets also feature instance-segmentation annotation, enabling precise defect identification. With a total of 18k images encompassing 44 defect types, VISION strives to mirror a wide range of real-world production scenarios. By supporting two ongoing challenge competitions on the VISION Datasets, we hope to foster further advancements in vision-based industrial inspection.

3D anomaly detection and localization is of great significance for industrial inspection. Prior 3D anomaly detection and localization methods focus on the setting that the testing data share the same category as the training data which is normal. However, in real-world applications, the normal training data for the target 3D objects can be unavailable due to issues like data privacy or export control regulation. To tackle these challenges, we identify a new task -- zero-shot 3D anomaly detection and localization, where the training and testing classes do not overlap. To this end, we design 3DzAL, a novel patch-level contrastive learning framework based on pseudo anomalies generated using the inductive bias from task-irrelevant 3D xyz data to learn more representative feature representations. Furthermore, we train a normalcy classifier network to classify the normal patches and pseudo anomalies and utilize the classification result jointly with feature distance to design anomaly scores. Instead of directly using the patch point clouds, we introduce adversarial perturbations to the input patch xyz data before feeding into the 3D normalcy classifier for the classification-based anomaly score. We show that 3DzAL outperforms the state-of-the-art anomaly detection and localization performance.

Industrial anomaly detection (IAD) has garnered significant attention and experienced rapid development. However, the recent development of IAD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real-IAD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Industrial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular IAD methods on the Real-IAD dataset, providing a highly challenging benchmark to promote the development of the IAD field.

Despite significant advances in image anomaly detection and segmentation, few methods use 3D information. We utilize a recently introduced 3D anomaly detection dataset to evaluate whether or not using 3D information is a lost opportunity. First, we present a surprising finding: standard color-only methods outperform all current methods that are explicitly designed to exploit 3D information. This is counter-intuitive as even a simple inspection of the dataset shows that color-only methods are insufficient for images containing geometric anomalies. This motivates the question: how can anomaly detection methods effectively use 3D information? We investigate a range of shape representations including hand-crafted and deep-learning-based; we demonstrate that rotation invariance plays the leading role in the performance. We uncover a simple 3D-only method that beats all recent approaches while not using deep learning, external pre-training datasets, or color information. As the 3D-only method cannot detect color and texture anomalies, we combine it with color-based features, significantly outperforming previous state-of-the-art. Our method, dubbed BTF (Back to the Feature) achieves pixel-wise ROCAUC: 99.3% and PRO: 96.4% on MVTec 3D-AD.

Outsourced printed circuit board (PCB) fabrication necessitates increased hardware assurance capabilities. Several assurance techniques based on automated optical inspection (AOI) have been proposed that leverage PCB images acquired using digital cameras. We review state-of-the-art AOI techniques and observe a strong, rapid trend toward machine learning (ML) solutions. These require significant amounts of labeled ground truth data, which is lacking in the publicly available PCB data space. We contribute the FICS PCB Image Collection (FPIC) dataset to address this need. Additionally, we outline new hardware security methodologies enabled by our data set.

The rapid progress in synthetic image generation and manipulation has now come to a point where it raises significant concerns for the implications towards society. At best, this leads to a loss of trust in digital content, but could potentially cause further harm by spreading false information or fake news. This paper examines the realism of state-of-the-art image manipulations, and how difficult it is to detect them, either automatically or by humans. To standardize the evaluation of detection methods, we propose an automated benchmark for facial manipulation detection. In particular, the benchmark is based on DeepFakes, Face2Face, FaceSwap and NeuralTextures as prominent representatives for facial manipulations at random compression level and size. The benchmark is publicly available and contains a hidden test set as well as a database of over 1.8 million manipulated images. This dataset is over an order of magnitude larger than comparable, publicly available, forgery datasets. Based on this data, we performed a thorough analysis of data-driven forgery detectors. We show that the use of additional domainspecific knowledge improves forgery detection to unprecedented accuracy, even in the presence of strong compression, and clearly outperforms human observers.

Automated X-ray inspection is crucial for efficient and unobtrusive security screening in various public settings. However, challenges such as object occlusion, variations in the physical properties of items, diversity in X-ray scanning devices, and limited training data hinder accurate and reliable detection of illicit items. Despite the large body of research in the field, reported experimental evaluations are often incomplete, with frequently conflicting outcomes. To shed light on the research landscape and facilitate further research, a systematic, detailed, and thorough comparative evaluation of recent Deep Learning (DL)-based methods for X-ray object detection is conducted. For this, a comprehensive evaluation framework is developed, composed of: a) Six recent, large-scale, and widely used public datasets for X-ray illicit item detection (OPIXray, CLCXray, SIXray, EDS, HiXray, and PIDray), b) Ten different state-of-the-art object detection schemes covering all main categories in the literature, including generic Convolutional Neural Network (CNN), custom CNN, generic transformer, and hybrid CNN-transformer architectures, and c) Various detection (mAP50 and mAP50:95) and time/computational-complexity (inference time (ms), parameter size (M), and computational load (GFLOPS)) metrics. A thorough analysis of the results leads to critical observations and insights, emphasizing key aspects such as: a) Overall behavior of the object detection schemes, b) Object-level detection performance, c) Dataset-specific observations, and d) Time efficiency and computational complexity analysis. To support reproducibility of the reported experimental results, the evaluation code and model weights are made publicly available at https://github.com/jgenc/xray-comparative-evaluation.

Misinformation can be countered with fact-checking, but the process is costly and slow. Identifying checkworthy claims is the first step, where automation can help scale fact-checkers' efforts. However, detection methods struggle with content that is 1) multimodal, 2) from diverse domains, and 3) synthetic. We introduce HintsOfTruth, a public dataset for multimodal checkworthiness detection with 27K real-world and synthetic image/claim pairs. The mix of real and synthetic data makes this dataset unique and ideal for benchmarking detection methods. We compare fine-tuned and prompted Large Language Models (LLMs). We find that well-configured lightweight text-based encoders perform comparably to multimodal models but the first only focus on identifying non-claim-like content. Multimodal LLMs can be more accurate but come at a significant computational cost, making them impractical for large-scale applications. When faced with synthetic data, multimodal models perform more robustly

Text-guided image editors can now manipulate authentic medical scans with high fidelity, enabling lesion implantation/removal that threatens clinical trust and safety. Existing defenses are inadequate for healthcare. Medical detectors are largely black-box, while MLLM-based explainers are typically post-hoc, lack medical expertise, and may hallucinate evidence on ambiguous cases. We present MedForge, a data-and-method solution for pre-hoc, evidence-grounded medical forgery detection. We introduce MedForge-90K, a large-scale benchmark of realistic lesion edits across 19 pathologies with expert-guided reasoning supervision via doctor inspection guidelines and gold edit locations. Building on it, MedForge-Reasoner performs localize-then-analyze reasoning, predicting suspicious regions before producing a verdict, and is further aligned with Forgery-aware GSPO to strengthen grounding and reduce hallucinations. Experiments demonstrate state-of-the-art detection accuracy and trustworthy, expert-aligned explanations.

The rapid development of generative AI is a double-edged sword, which not only facilitates content creation but also makes image manipulation easier and more difficult to detect. Although current image forgery detection and localization (IFDL) methods are generally effective, they tend to face two challenges: 1) black-box nature with unknown detection principle, 2) limited generalization across diverse tampering methods (e.g., Photoshop, DeepFake, AIGC-Editing). To address these issues, we propose the explainable IFDL task and design FakeShield, a multi-modal framework capable of evaluating image authenticity, generating tampered region masks, and providing a judgment basis based on pixel-level and image-level tampering clues. Additionally, we leverage GPT-4o to enhance existing IFDL datasets, creating the Multi-Modal Tamper Description dataSet (MMTD-Set) for training FakeShield's tampering analysis capabilities. Meanwhile, we incorporate a Domain Tag-guided Explainable Forgery Detection Module (DTE-FDM) and a Multi-modal Forgery Localization Module (MFLM) to address various types of tamper detection interpretation and achieve forgery localization guided by detailed textual descriptions. Extensive experiments demonstrate that FakeShield effectively detects and localizes various tampering techniques, offering an explainable and superior solution compared to previous IFDL methods.

Visual counterfeits are increasingly causing an existential conundrum in mainstream media with rapid evolution in neural image synthesis methods. Though detection of such counterfeits has been a taxing problem in the image forensics community, a recent class of forensic detectors -- universal detectors -- are able to surprisingly spot counterfeit images regardless of generator architectures, loss functions, training datasets, and resolutions. This intriguing property suggests the possible existence of transferable forensic features (T-FF) in universal detectors. In this work, we conduct the first analytical study to discover and understand T-FF in universal detectors. Our contributions are 2-fold: 1) We propose a novel forensic feature relevance statistic (FF-RS) to quantify and discover T-FF in universal detectors and, 2) Our qualitative and quantitative investigations uncover an unexpected finding: color is a critical T-FF in universal detectors. Code and models are available at https://keshik6.github.io/transferable-forensic-features/

Recent advances in AI-driven image generation have introduced new challenges for verifying the authenticity of digital evidence in forensic investigations. Modern generative models can produce visually consistent forgeries that evade traditional detectors based on pixel or compression artefacts. Most existing approaches also lack an explicit measure of anomaly intensity, which limits their ability to quantify the severity of manipulation. This paper introduces Vision-Attention Anomaly Scoring (VAAS), a novel dual-module framework that integrates global attention-based anomaly estimation using Vision Transformers (ViT) with patch-level self-consistency scoring derived from SegFormer embeddings. The hybrid formulation provides a continuous and interpretable anomaly score that reflects both the location and degree of manipulation. Evaluations on the DF2023 and CASIA v2.0 datasets demonstrate that VAAS achieves competitive F1 and IoU performance, while enhancing visual explainability through attention-guided anomaly maps. The framework bridges quantitative detection with human-understandable reasoning, supporting transparent and reliable image integrity assessment. The source code for all experiments and corresponding materials for reproducing the results are available open source.

The rise of AI-generated image editing tools has made localized forgeries increasingly realistic, posing challenges for visual content integrity. Although recent efforts have explored localized AIGC detection, existing datasets predominantly focus on object-level forgeries while overlooking broader scene edits in regions such as sky or ground. To address these limitations, we introduce BR-Gen, a large-scale dataset of 150,000 locally forged images with diverse scene-aware annotations, which are based on semantic calibration to ensure high-quality samples. BR-Gen is constructed through a fully automated Perception-Creation-Evaluation pipeline to ensure semantic coherence and visual realism. In addition, we further propose NFA-ViT, a Noise-guided Forgery Amplification Vision Transformer that enhances the detection of localized forgeries by amplifying forgery-related features across the entire image. NFA-ViT mines heterogeneous regions in images, i.e., potential edited areas, by noise fingerprints. Subsequently, attention mechanism is introduced to compel the interaction between normal and abnormal features, thereby propagating the generalization traces throughout the entire image, allowing subtle forgeries to influence a broader context and improving overall detection robustness. Extensive experiments demonstrate that BR-Gen constructs entirely new scenarios that are not covered by existing methods. Take a step further, NFA-ViT outperforms existing methods on BR-Gen and generalizes well across current benchmarks. All data and codes are available at https://github.com/clpbc/BR-Gen.

Recent Anomaly Detection methods achieve perfect detection and segmentation scores on well-established datasets, such as MVTec. However, many of these methods face challenges when foundational assumptions - such as consistent object scale, viewpoint, background, illumination, and centered placement - are violated. Those variations that occur render anomaly detection methods unusable in many real-world scenarios. To address these limitations, we introduce three key contributions: (1) a visual prompting pipeline that isolates objects using foreground-background masking; (2) a mechanism for unfreezing the teacher in student-teacher models to improve domain adaptability; and (3) a data augmentation strategy leveraging diffusion-generated synthetic images to enhance anomaly detection performance. We achieve a 3.5 percentage point improvement over the previous state-of-the-art on the challenging AeBAD dataset by using the Masked Multiscale Reconstruction (MMR) model as our backbone.

We present a deep learning approach for quantifying and localizing ex-situ porosity within Laser Powder Bed Fusion fabricated samples utilizing in-situ thermal image monitoring data. Our goal is to build the real time porosity map of parts based on thermal images acquired during the build. The quantification task builds upon the established Convolutional Neural Network model architecture to predict pore count and the localization task leverages the spatial and temporal attention mechanisms of the novel Video Vision Transformer model to indicate areas of expected porosity. Our model for porosity quantification achieved a R^2 score of 0.57 and our model for porosity localization produced an average IoU score of 0.32 and a maximum of 1.0. This work is setting the foundations of part porosity "Digital Twins" based on additive manufacturing monitoring data and can be applied downstream to reduce time-intensive post-inspection and testing activities during part qualification and certification. In addition, we seek to accelerate the acquisition of crucial insights normally only available through ex-situ part evaluation by means of machine learning analysis of in-situ process monitoring data.

In this work we investigate the ability of large language models to predict additive manufacturing defect regimes given a set of process parameter inputs. For this task we utilize a process parameter defect dataset to fine-tune a collection of models, titled AdditiveLLM, for the purpose of predicting potential defect regimes including Keyholing, Lack of Fusion, and Balling. We compare different methods of input formatting in order to gauge the model's performance to correctly predict defect regimes on our sparse Baseline dataset and our natural language Prompt dataset. The model displays robust predictive capability, achieving an accuracy of 93\% when asked to provide the defect regimes associated with a set of process parameters. The incorporation of natural language input further simplifies the task of process parameters selection, enabling users to identify optimal settings specific to their build.

In this work we explore the application of AI to robotic welding. Robotic welding is a widely used technology in many industries, but robots currently do not have the capability to detect welding defects which get introduced due to various reasons in the welding process. We describe how deep-learning methods can be applied to detect weld defects in real-time by recording the welding process with microphones and a camera. Our findings are based on a large database with more than 4000 welding samples we collected which covers different weld types, materials and various defect categories. All deep learning models are trained in an unsupervised fashion because the space of possible defects is large and the defects in our data may contain biases. We demonstrate that a reliable real-time detection of most categories of weld defects is feasible both from audio and video, with improvements achieved by combining both modalities. Specifically, the multi-modal approach achieves an average Area-under-ROC-Curve (AUC) of 0.92 over all eleven defect types in our data. We conclude the paper with an analysis of the results by defect type and a discussion of future work.

Anomaly detection is valuable for real-world applications, such as industrial quality inspection. However, most approaches focus on detecting local structural anomalies while neglecting compositional anomalies incorporating logical constraints. In this paper, we introduce LogSAD, a novel multi-modal framework that requires no training for both Logical and Structural Anomaly Detection. First, we propose a match-of-thought architecture that employs advanced large multi-modal models (i.e. GPT-4V) to generate matching proposals, formulating interests and compositional rules of thought for anomaly detection. Second, we elaborate on multi-granularity anomaly detection, consisting of patch tokens, sets of interests, and composition matching with vision and language foundation models. Subsequently, we present a calibration module to align anomaly scores from different detectors, followed by integration strategies for the final decision. Consequently, our approach addresses both logical and structural anomaly detection within a unified framework and achieves state-of-the-art results without the need for training, even when compared to supervised approaches, highlighting its robustness and effectiveness. Code is available at https://github.com/zhang0jhon/LogSAD.

Multimodal large language models have unlocked new possibilities for various multimodal tasks. However, their potential in image manipulation detection remains unexplored. When directly applied to the IMD task, M-LLMs often produce reasoning texts that suffer from hallucinations and overthinking. To address this, in this work, we propose ForgerySleuth, which leverages M-LLMs to perform comprehensive clue fusion and generate segmentation outputs indicating specific regions that are tampered with. Moreover, we construct the ForgeryAnalysis dataset through the Chain-of-Clues prompt, which includes analysis and reasoning text to upgrade the image manipulation detection task. A data engine is also introduced to build a larger-scale dataset for the pre-training phase. Our extensive experiments demonstrate the effectiveness of ForgeryAnalysis and show that ForgerySleuth significantly outperforms existing methods in generalization, robustness, and explainability.

We propose a new comprehensive benchmark to revolutionize the current deepfake detection field to the next generation. Predominantly, existing works identify top-notch detection algorithms and models by adhering to the common practice: training detectors on one specific dataset (e.g., FF++) and testing them on other prevalent deepfake datasets. This protocol is often regarded as a "golden compass" for navigating SoTA detectors. But can these stand-out "winners" be truly applied to tackle the myriad of realistic and diverse deepfakes lurking in the real world? If not, what underlying factors contribute to this gap? In this work, we found the dataset (both train and test) can be the "primary culprit" due to: (1) forgery diversity: Deepfake techniques are commonly referred to as both face forgery and entire image synthesis. Most existing datasets only contain partial types of them, with limited forgery methods implemented; (2) forgery realism: The dominated training dataset, FF++, contains out-of-date forgery techniques from the past four years. "Honing skills" on these forgeries makes it difficult to guarantee effective detection generalization toward nowadays' SoTA deepfakes; (3) evaluation protocol: Most detection works perform evaluations on one type, which hinders the development of universal deepfake detectors. To address this dilemma, we construct a highly diverse deepfake detection dataset called DF40, which comprises 40 distinct deepfake techniques. We then conduct comprehensive evaluations using 4 standard evaluation protocols and 8 representative detection methods, resulting in over 2,000 evaluations. Through these evaluations, we provide an extensive analysis from various perspectives, leading to 7 new insightful findings. We also open up 4 valuable yet previously underexplored research questions to inspire future works. Our project page is https://github.com/YZY-stack/DF40.

Power batteries are essential components in electric vehicles, where internal structural defects can pose serious safety risks. We conduct a comprehensive study on a new task, power battery detection (PBD), which aims to localize the dense endpoints of cathode and anode plates from industrial X-ray images for quality inspection. Manual inspection is inefficient and error-prone, while traditional vision algorithms struggle with densely packed plates, low contrast, scale variation, and imaging artifacts. To address this issue and drive more attention into this meaningful task, we present PBD5K, the first large-scale benchmark for this task, consisting of 5,000 X-ray images from nine battery types with fine-grained annotations and eight types of real-world visual interference. To support scalable and consistent labeling, we develop an intelligent annotation pipeline that combines image filtering, model-assisted pre-labeling, cross-verification, and layered quality evaluation. We formulate PBD as a point-level segmentation problem and propose MDCNeXt, a model designed to extract and integrate multi-dimensional structure clues including point, line, and count information from the plate itself. To improve discrimination between plates and suppress visual interference, MDCNeXt incorporates two state space modules. The first is a prompt-filtered module that learns contrastive relationships guided by task-specific prompts. The second is a density-aware reordering module that refines segmentation in regions with high plate density. In addition, we propose a distance-adaptive mask generation strategy to provide robust supervision under varying spatial distributions of anode and cathode positions. The source code and datasets will be publicly available at https://github.com/Xiaoqi-Zhao-DLUT/X-ray-PBD{PBD5K}.

Although vanilla Convolutional Neural Network (CNN) based detectors can achieve satisfactory performance on fake face detection, we observe that the detectors tend to seek forgeries on a limited region of face, which reveals that the detectors is short of understanding of forgery. Therefore, we propose an attention-based data augmentation framework to guide detector refine and enlarge its attention. Specifically, our method tracks and occludes the Top-N sensitive facial regions, encouraging the detector to mine deeper into the regions ignored before for more representative forgery. Especially, our method is simple-to-use and can be easily integrated with various CNN models. Extensive experiments show that the detector trained with our method is capable to separately point out the representative forgery of fake faces generated by different manipulation techniques, and our method enables a vanilla CNN-based detector to achieve state-of-the-art performance without structure modification.

Deep Neural Networks achieve high performance in vision tasks by learning features from regions of interest (ROI) within images, but their performance degrades when deployed on out-of-distribution (OOD) data that differs from training data. This challenge has led to OOD detection methods that aim to identify and reject unreliable predictions. Although prior work shows that OOD detection performance varies by artefact type, the underlying causes remain underexplored. To this end, we identify a previously unreported bias in OOD detection: for hard-to-detect artefacts (near-OOD), detection performance typically improves when the artefact shares visual similarity (e.g. colour) with the model's ROI and drops when it does not - a phenomenon we term the Invisible Gorilla Effect. For example, in a skin lesion classifier with red lesion ROI, we show the method Mahalanobis Score achieves a 31.5% higher AUROC when detecting OOD red ink (similar to ROI) compared to black ink (dissimilar) annotations. We annotated artefacts by colour in 11,355 images from three public datasets (e.g. ISIC) and generated colour-swapped counterfactuals to rule out dataset bias. We then evaluated 40 OOD methods across 7 benchmarks and found significant performance drops for most methods when artefacts differed from the ROI. Our findings highlight an overlooked failure mode in OOD detection and provide guidance for more robust detectors. Code and annotations are available at: https://github.com/HarryAnthony/Invisible_Gorilla_Effect.