Daily Papers

Industrial defect detection systems face critical limitations when confined to one-class anomaly detection paradigms, which assume uniform outlier distributions and struggle with data scarcity in realworld manufacturing environments. We present ExDD (Explicit Dual Distribution), a novel framework that transcends these limitations by explicitly modeling dual feature distributions. Our approach leverages parallel memory banks that capture the distinct statistical properties of both normality and anomalous patterns, addressing the fundamental flaw of uniform outlier assumptions. To overcome data scarcity, we employ latent diffusion models with domain-specific textual conditioning, generating in-distribution synthetic defects that preserve industrial context. Our neighborhood-aware ratio scoring mechanism elegantly fuses complementary distance metrics, amplifying signals in regions exhibiting both deviation from normality and similarity to known defect patterns. Experimental validation on KSDD2 demonstrates superior performance (94.2% I-AUROC, 97.7% P-AUROC), with optimal augmentation at 100 synthetic samples.

Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding. To address these challenges, we introduce a Large-Scale Multi-Modal Industrial Open-Closed benchmark (MMIOC-1M) containing over one million samples across 14 super-categories, 29 industrial scenes, and 351 defect subcategories. To our knowledge, MMIOC-1M is the first unified largest benchmark supporting both open-vocabulary and closed-set industrial detection, providing valuable pre-training data for LVLMs in industrial scenarios. Furthermore, we propose a Refined Text-Visual Prompt Network (RTVPNet) that incorporates three key innovations: (1) an expert-assisted domain projection mechanism that enables rapid adaptation of general vision models to industrial domains, (2) an energy-based sparse sampling strategy that automatically generates refined visual prompts without manual intervention, and (3) a bidirectional text-visual interaction module that enhances cross-modal semantic alignment and understanding. Extensive experiments demonstrate that RTVPNet achieves state-of-the-art performance on MMIOC-1M, LVIS, and COCO benchmarks while maintaining computational efficiency. The dataset and code are available at https://github.com/hellozzk/MMIO.

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

Anomaly Detection involves identifying deviations from normal data distributions and is critical in fields such as medical diagnostics and industrial defect detection. Traditional AD methods typically require the availability of normal training samples; however, this assumption is not always feasible. Recently, the rich pretraining knowledge of CLIP has shown promising zero-shot generalization in detecting anomalies without the need for training samples from target domains. However, CLIP's coarse-grained image-text alignment limits localization and detection performance for fine-grained anomalies due to: (1) spatial misalignment, and (2) the limited sensitivity of global features to local anomalous patterns. In this paper, we propose Crane which tackles both problems. First, we introduce a correlation-based attention module to retain spatial alignment more accurately. Second, to boost the model's awareness of fine-grained anomalies, we condition the learnable prompts of the text encoder on image context extracted from the vision encoder and perform a local-to-global representation fusion. Moreover, our method can incorporate vision foundation models such as DINOv2 to further enhance spatial understanding and localization. The key insight of Crane is to balance learnable adaptations for modeling anomalous concepts with non-learnable adaptations that preserve and exploit generalized pretrained knowledge, thereby minimizing in-domain overfitting and maximizing performance on unseen domains. Extensive evaluation across 14 diverse industrial and medical datasets demonstrates that Crane consistently improves the state-of-the-art ZSAD from 2% to 28%, at both image and pixel levels, while remaining competitive in inference speed. The code is available at https://github.com/AlirezaSalehy/Crane.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

Identifying potential objects is critical for object recognition and analysis across various computer vision applications. Existing methods typically localize potential objects by relying on exemplar images, predefined categories, or textual descriptions. However, their reliance on image and text prompts often limits flexibility, restricting adaptability in real-world scenarios. In this paper, we introduce a novel Prompt-Free Universal Region Proposal Network (PF-RPN), which identifies potential objects without relying on external prompts. First, the Sparse Image-Aware Adapter (SIA) module performs initial localization of potential objects using a learnable query embedding dynamically updated with visual features. Next, the Cascade Self-Prompt (CSP) module identifies the remaining potential objects by leveraging the self-prompted learnable embedding, autonomously aggregating informative visual features in a cascading manner. Finally, the Centerness-Guided Query Selection (CG-QS) module facilitates the selection of high-quality query embeddings using a centerness scoring network. Our method can be optimized with limited data (e.g., 5% of MS COCO data) and applied directly to various object detection application domains for identifying potential objects without fine-tuning, such as underwater object detection, industrial defect detection, and remote sensing image object detection. Experimental results across 19 datasets validate the effectiveness of our method. Code is available at https://github.com/tangqh03/PF-RPN.

Unsupervised anomaly in industry has been a concerning topic and a stepping stone for high performance industrial automation process. The vast majority of industry-oriented methods focus on learning from good samples to detect anomaly notwithstanding some specific industrial scenario requiring even less specific training and therefore a generalization for anomaly detection. The obvious use case is the fabric anomaly detection, where we have to deal with a really wide range of colors and types of textile and a stoppage of the production line for training could not be considered. In this paper, we propose an automation process for industrial fabric texture defect detection with a specificity-learning process during the domain-generalized anomaly detection. Combining the ability to generalize and the learning process offer a fast and precise anomaly detection and segmentation. The main contributions of this paper are the following: A domain-generalization texture anomaly detection method achieving the state-of-the-art performances, a fast specific training on good samples extracted by the proposed method, a self-evaluation method based on custom defect creation and an automatic detection of already seen fabric to prevent re-training.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet

Visual analysis and reconstruction of pipeline inner walls remain challenging in industrial inspection scenarios. This paper presents a dedicated reconstruction system for pipeline inner walls via industrial endoscopes, which is built on panoramic image stitching technology. Equipped with a custom graphical user interface (GUI), the system extracts key frames from endoscope video footage, and integrates polar coordinate transformation with image stitching techniques to unwrap annular video frames of pipeline inner walls into planar panoramic images. Experimental results demonstrate that the proposed method enables efficient processing of industrial endoscope videos, and the generated panoramic stitched images preserve all detailed features of pipeline inner walls in their entirety. This provides intuitive and accurate visual support for defect detection and condition assessment of pipeline inner walls. In comparison with the traditional frame-by-frame video review method, the proposed approach significantly elevates the efficiency of pipeline inner wall reconstruction and exhibits considerable engineering application value.

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a diverse collection of 14 industrial inspection datasets, uniquely poised to meet these challenges. Unlike previous datasets, VISION brings versatility to defect detection, offering annotation masks across all splits and catering to various detection methodologies. Our datasets also feature instance-segmentation annotation, enabling precise defect identification. With a total of 18k images encompassing 44 defect types, VISION strives to mirror a wide range of real-world production scenarios. By supporting two ongoing challenge competitions on the VISION Datasets, we hope to foster further advancements in vision-based industrial inspection.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

Industrial anomaly detection (IAD) has garnered significant attention and experienced rapid development. However, the recent development of IAD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real-IAD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Industrial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular IAD methods on the Real-IAD dataset, providing a highly challenging benchmark to promote the development of the IAD field.

3D anomaly detection (3D-AD) plays a critical role in industrial manufacturing, particularly in ensuring the reliability and safety of core equipment components. Although existing 3D datasets like Real3D-AD and MVTec 3D-AD offer broad application support, they fall short in capturing the complexities and subtle defects found in real industrial environments. This limitation hampers precise anomaly detection research, especially for industrial equipment components (IEC) such as bearings, rings, and bolts. To address this challenge, we have developed a point cloud anomaly detection dataset (IEC3D-AD) specific to real industrial scenarios. This dataset is directly collected from actual production lines, ensuring high fidelity and relevance. Compared to existing datasets, IEC3D-AD features significantly improved point cloud resolution and defect annotation granularity, facilitating more demanding anomaly detection tasks. Furthermore, inspired by generative 2D-AD methods, we introduce a novel 3D-AD paradigm (GMANet) on IEC3D-AD. This paradigm generates synthetic point cloud samples based on geometric morphological analysis, then reduces the margin and increases the overlap between normal and abnormal point-level features through spatial discrepancy optimization. Extensive experiments demonstrate the effectiveness of our method on both IEC3D-AD and other datasets.

Multimodal Large Language Models (MLLMs) have achieved impressive success in natural visual understanding, yet they consistently underperform in industrial anomaly detection (IAD). This is because MLLMs trained mostly on general web data differ significantly from industrial images. Moreover, they encode each image independently and can only compare images in the language space, making them insensitive to subtle visual differences that are key to IAD. To tackle these issues, we present AD-Copilot, an interactive MLLM specialized for IAD via visual in-context comparison. We first design a novel data curation pipeline to mine inspection knowledge from sparsely labeled industrial images and generate precise samples for captioning, VQA, and defect localization, yielding a large-scale multimodal dataset Chat-AD rich in semantic signals for IAD. On this foundation, AD-Copilot incorporates a novel Comparison Encoder that employs cross-attention between paired image features to enhance multi-image fine-grained perception, and is trained with a multi-stage strategy that incorporates domain knowledge and gradually enhances IAD skills. In addition, we introduce MMAD-BBox, an extended benchmark for anomaly localization with bounding-box-based evaluation. The experiments show that AD-Copilot achieves 82.3% accuracy on the MMAD benchmark, outperforming all other models without any data leakage. In the MMAD-BBox test, it achieves a maximum improvement of 3.35times over the baseline. AD-Copilot also exhibits excellent generalization of its performance gains across other specialized and general-purpose benchmarks. Remarkably, AD-Copilot surpasses human expert-level performance on several IAD tasks, demonstrating its potential as a reliable assistant for real-world industrial inspection. All datasets and models will be released for the broader benefit of the community.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

Anomaly detection is nowadays increasingly used in industrial applications and processes. One of the main fields of the appliance is the visual inspection for surface anomaly detection, which aims to spot regions that deviate from regularity and consequently identify abnormal products. Defect localization is a key task, that usually is achieved using a basic comparison between generated image and the original one, implementing some blob-analysis or image-editing algorithms, in the post-processing step, which is very biased towards the source dataset, and they are unable to generalize. Furthermore, in industrial applications, the totality of the image is not always interesting but could be one or some regions of interest (ROIs), where only in those areas there are relevant anomalies to be spotted. For these reasons, we propose a new architecture composed by two blocks. The first block is a Generative Adversarial Network (GAN), based on a residual autoencoder (ResAE), to perform reconstruction and denoising processes, while the second block produces image segmentation, spotting defects. This method learns from a dataset composed of good products and generated synthetic defects. The discriminative network is trained using a ROI for each image contained in the training dataset. The network will learn in which area anomalies are relevant. This approach guarantees the reduction of using pre-processing algorithms, formerly developed with blob-analysis and image-editing procedures. To test our model we used challenging MVTec anomaly detection datasets and an industrial large dataset of pharmaceutical BFS strips of vials. This set constitutes a more realistic use case of the aforementioned network.

Recently, large pre-trained vision-language models have shown remarkable performance in zero-shot anomaly detection (ZSAD). With fine-tuning on a single auxiliary dataset, the model enables cross-category anomaly detection on diverse datasets covering industrial defects and medical lesions. Compared to manually designed prompts, prompt learning eliminates the need for expert knowledge and trial-and-error. However, it still faces the following challenges: (i) static learnable tokens struggle to capture the continuous and diverse patterns of normal and anomalous states, limiting generalization to unseen categories; (ii) fixed textual labels provide overly sparse category information, making the model prone to overfitting to a specific semantic subspace. To address these issues, we propose Conditional Prompt Synthesis (CoPS), a novel framework that synthesizes dynamic prompts conditioned on visual features to enhance ZSAD performance. Specifically, we extract representative normal and anomaly prototypes from fine-grained patch features and explicitly inject them into prompts, enabling adaptive state modeling. Given the sparsity of class labels, we leverage a variational autoencoder to model semantic image features and implicitly fuse varied class tokens into prompts. Additionally, integrated with our spatially-aware alignment mechanism, extensive experiments demonstrate that CoPS surpasses state-of-the-art methods by 2.5% AUROC in both classification and segmentation across 13 industrial and medical datasets. Code will be available at https://github.com/cqylunlun/CoPS.

Deep learning solutions for vulnerability detection proposed in academic research are not always accessible to developers, and their applicability in industrial settings is rarely addressed. Transferring such technologies from academia to industry presents challenges related to trustworthiness, legacy systems, limited digital literacy, and the gap between academic and industrial expertise. For deep learning in particular, performance and integration into existing workflows are additional concerns. In this work, we first evaluate the performance of CodeBERT for detecting vulnerable functions in industrial and open-source software. We analyse its cross-domain generalisation when fine-tuned on open-source data and tested on industrial data, and vice versa, also exploring strategies for handling class imbalance. Based on these results, we develop AI-DO(Automating vulnerability detection Integration for Developers' Operations), a Continuous Integration-Continuous Deployment (CI/CD)-integrated recommender system that uses fine-tuned CodeBERT to detect and localise vulnerabilities during code review without disrupting workflows. Finally, we assess the tool's perceived usefulness through a survey with the company's IT professionals. Our results show that models trained on industrial data detect vulnerabilities accurately within the same domain but lose performance on open-source code, while a deep learner fine-tuned on open data, with appropriate undersampling techniques, improves the detection of vulnerabilities.

Detecting small objects in UAV remote sensing images and identifying surface defects in industrial inspection remain difficult tasks. These applications face common obstacles: features are sparse and weak, backgrounds are cluttered, and object scales vary dramatically. Current transformer-based detectors, while powerful, struggle with three critical issues. First, features degrade severely as networks downsample progressively. Second, spatial convolutions cannot capture long-range dependencies effectively. Third, standard upsampling methods inflate feature maps unnecessarily. We introduce DFIR-DETR to tackle these problems through dynamic feature aggregation combined with frequency-domain processing. Our architecture builds on three novel components. The DCFA module uses dynamic K-sparse attention, cutting complexity from O(N2) down to O(NK), and employs spatial gated linear units for better nonlinear modeling. The DFPN module applies amplitude-normalized upsampling to prevent feature inflation and uses dual-path shuffle convolution to retain spatial details across scales. The FIRC3 module operates in the frequency domain, achieving global receptive fields without sacrificing efficiency. We tested our method extensively on NEU-DET and VisDrone datasets. Results show mAP50 scores of 92.9% and 51.6% respectively-both state-of-the-art. The model stays lightweight with just 11.7M parameters and 41.2 GFLOPs. Strong performance across two very different domains confirms that DFIR-DETR generalizes well and works effectively in resource-limited settings for cross-scene small object detection.

Recently, vision-language models (e.g. CLIP) have demonstrated remarkable performance in zero-shot anomaly detection (ZSAD). By leveraging auxiliary data during training, these models can directly perform cross-category anomaly detection on target datasets, such as detecting defects on industrial product surfaces or identifying tumors in organ tissues. Existing approaches typically construct text prompts through either manual design or the optimization of learnable prompt vectors. However, these methods face several challenges: 1) handcrafted prompts require extensive expert knowledge and trial-and-error; 2) single-form learnable prompts struggle to capture complex anomaly semantics; and 3) an unconstrained prompt space limits generalization to unseen categories. To address these issues, we propose Bayesian Prompt Flow Learning (Bayes-PFL), which models the prompt space as a learnable probability distribution from a Bayesian perspective. Specifically, a prompt flow module is designed to learn both image-specific and image-agnostic distributions, which are jointly utilized to regularize the text prompt space and improve the model's generalization on unseen categories. These learned distributions are then sampled to generate diverse text prompts, effectively covering the prompt space. Additionally, a residual cross-model attention (RCA) module is introduced to better align dynamic text embeddings with fine-grained image features. Extensive experiments on 15 industrial and medical datasets demonstrate our method's superior performance. The code is available at https://github.com/xiaozhen228/Bayes-PFL.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

Although self-supervised 3D anomaly detection assumes that acquiring high-precision point clouds is computationally expensive, in real manufacturing scenarios it is often feasible to collect a limited number of anomalous samples. Therefore, we study open-set supervised 3D anomaly detection, where the model is trained with only normal samples and a small number of known anomalous samples, aiming to identify unknown anomalies at test time. We present Open-Industry, a high-quality industrial dataset containing 15 categories, each with five real anomaly types collected from production lines. We first adapt general open-set anomaly detection methods to accommodate 3D point cloud inputs better. Building upon this, we propose Open3D-AD, a point-cloud-oriented approach that leverages normal samples, simulated anomalies, and partially observed real anomalies to model the probability density distributions of normal and anomalous data. Then, we introduce a simple Correspondence Distributions Subsampling to reduce the overlap between normal and non-normal distributions, enabling stronger dual distributions modeling. Based on these contributions, we establish a comprehensive benchmark and evaluate the proposed method extensively on Open-Industry as well as established datasets including Real3D-AD and Anomaly-ShapeNet. Benchmark results and ablation studies demonstrate the effectiveness of Open3D-AD and further reveal the potential of open-set supervised 3D anomaly detection.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Industrial anomaly detection is generally addressed as an unsupervised task that aims at locating defects with only normal training samples. Recently, numerous 2D anomaly detection methods have been proposed and have achieved promising results, however, using only the 2D RGB data as input is not sufficient to identify imperceptible geometric surface anomalies. Hence, in this work, we focus on multi-modal anomaly detection. Specifically, we investigate early multi-modal approaches that attempted to utilize models pre-trained on large-scale visual datasets, i.e., ImageNet, to construct feature databases. And we empirically find that directly using these pre-trained models is not optimal, it can either fail to detect subtle defects or mistake abnormal features as normal ones. This may be attributed to the domain gap between target industrial data and source data.Towards this problem, we propose a Local-to-global Self-supervised Feature Adaptation (LSFA) method to finetune the adaptors and learn task-oriented representation toward anomaly detection.Both intra-modal adaptation and cross-modal alignment are optimized from a local-to-global perspective in LSFA to ensure the representation quality and consistency in the inference stage.Extensive experiments demonstrate that our method not only brings a significant performance boost to feature embedding based approaches, but also outperforms previous State-of-The-Art (SoTA) methods prominently on both MVTec-3D AD and Eyecandies datasets, e.g., LSFA achieves 97.1% I-AUROC on MVTec-3D, surpass previous SoTA by +3.4%.

Industrial Internet of Things environments increasingly rely on advanced Anomaly Detection and explanation techniques to rapidly detect and mitigate cyberincidents, thereby ensuring operational safety. The sequential nature of data collected from these environments has enabled improvements in Anomaly Detection using Machine Learning and Deep Learning models by processing time windows rather than treating the data as tabular. However, conventional explanation methods often neglect this temporal structure, leading to imprecise or less actionable explanations. This work presents ShaTS (Shapley values for Time Series models), which is a model-agnostic explainable Artificial Intelligence method designed to enhance the precision of Shapley value explanations for time series models. ShaTS addresses the shortcomings of traditional approaches by incorporating an a priori feature grouping strategy that preserves temporal dependencies and produces both coherent and actionable insights. Experiments conducted on the SWaT dataset demonstrate that ShaTS accurately identifies critical time instants, precisely pinpoints the sensors, actuators, and processes affected by anomalies, and outperforms SHAP in terms of both explainability and resource efficiency, fulfilling the real-time requirements of industrial environments.

The increasing complexity of industrial anomaly detection (IAD) has positioned multimodal detection methods as a focal area of machine vision research. However, dedicated multimodal datasets specifically tailored for IAD remain limited. Pioneering datasets like MVTec 3D have laid essential groundwork in multimodal IAD by incorporating RGB+3D data, but still face challenges in bridging the gap with real industrial environments due to limitations in scale and resolution. To address these challenges, we introduce Real-IAD D3, a high-precision multimodal dataset that uniquely incorporates an additional pseudo3D modality generated through photometric stereo, alongside high-resolution RGB images and micrometer-level 3D point clouds. Real-IAD D3 features finer defects, diverse anomalies, and greater scale across 20 categories, providing a challenging benchmark for multimodal IAD Additionally, we introduce an effective approach that integrates RGB, point cloud, and pseudo-3D depth information to leverage the complementary strengths of each modality, enhancing detection performance. Our experiments highlight the importance of these modalities in boosting detection robustness and overall IAD performance. The dataset and code are publicly accessible for research purposes at https://realiad4ad.github.io/Real-IAD D3

In recent years, the wood product industry has been facing a skilled labor shortage. The result is more frequent sudden failures, resulting in additional costs for these companies already operating in a very competitive market. Moreover, sawmills are challenging environments for machinery and sensors. Given that experienced machine operators may be able to diagnose defects or malfunctions, one possible way of assisting novice operators is through acoustic monitoring. As a step towards the automation of wood-processing equipment and decision support systems for machine operators, in this paper, we explore using a deep convolutional autoencoder for acoustic anomaly detection of wood planers on a new real-life dataset. Specifically, our convolutional autoencoder with skip connections (Skip-CAE) and our Skip-CAE transformer outperform the DCASE autoencoder baseline, one-class SVM, isolation forest and a published convolutional autoencoder architecture, respectively obtaining an area under the ROC curve of 0.846 and 0.875 on a dataset of real-factory planer sounds. Moreover, we show that adding skip connections and attention mechanism under the form of a transformer encoder-decoder helps to further improve the anomaly detection capabilities.

In this paper, we tackle the problem of Egocentric Human-Object Interaction (EHOI) detection in an industrial setting. To overcome the lack of public datasets in this context, we propose a pipeline and a tool for generating synthetic images of EHOIs paired with several annotations and data signals (e.g., depth maps or segmentation masks). Using the proposed pipeline, we present EgoISM-HOI a new multimodal dataset composed of synthetic EHOI images in an industrial environment with rich annotations of hands and objects. To demonstrate the utility and effectiveness of synthetic EHOI data produced by the proposed tool, we designed a new method that predicts and combines different multimodal signals to detect EHOIs in RGB images. Our study shows that exploiting synthetic data to pre-train the proposed method significantly improves performance when tested on real-world data. Moreover, to fully understand the usefulness of our method, we conducted an in-depth analysis in which we compared and highlighted the superiority of the proposed approach over different state-of-the-art class-agnostic methods. To support research in this field, we publicly release the datasets, source code, and pre-trained models at https://iplab.dmi.unict.it/egoism-hoi.

3D Anomaly Detection (AD) has shown great potential in detecting anomalies or defects of high-precision industrial products. However, existing methods are typically trained in a class-specific manner and also lack the capability of learning from emerging classes. In this study, we proposed a continual learning framework named Continual 3D Anomaly Detection (C3D-AD), which can not only learn generalized representations for multi-class point clouds but also handle new classes emerging over time.Specifically, in the feature extraction module, to extract generalized local features from diverse product types of different tasks efficiently, Kernel Attention with random feature Layer (KAL) is introduced, which normalizes the feature space. Then, to reconstruct data correctly and continually, an efficient Kernel Attention with learnable Advisor (KAA) mechanism is proposed, which learns the information from new categories while discarding redundant old information within both the encoder and decoder. Finally, to keep the representation consistency over tasks, a Reconstruction with Parameter Perturbation (RPP) module is proposed by designing a representation rehearsal loss function, which ensures that the model remembers previous category information and returns category-adaptive representation.Extensive experiments on three public datasets demonstrate the effectiveness of the proposed method, achieving an average performance of 66.4%, 83.1%, and 63.4% AUROC on Real3D-AD, Anomaly-ShapeNet, and MulSen-AD, respectively.

In this technical report, we present our solution to the CVPR 2025 Visual Anomaly and Novelty Detection (VAND) 3.0 Workshop Challenge Track 1: Adapt & Detect: Robust Anomaly Detection in Real-World Applications. In real-world industrial anomaly detection, it is crucial to accurately identify anomalies with physical complexity, such as transparent or reflective surfaces, occlusions, and low-contrast contaminations. The recently proposed MVTec AD 2 dataset significantly narrows the gap between publicly available benchmarks and anomalies found in real-world industrial environments. To address the challenges posed by this dataset--such as complex and varying lighting conditions and real anomalies with large scale differences--we propose a fully training-free anomaly detection and segmentation method based on feature extraction using the DINOv2 model named SuperAD. Our method carefully selects a small number of normal reference images and constructs a memory bank by leveraging the strong representational power of DINOv2. Anomalies are then segmented by performing nearest neighbor matching between test image features and the memory bank. Our method achieves competitive results on both test sets of the MVTec AD 2 dataset.

In this work, we present STOPNet, a framework for 6-DoF object suction detection on production lines, with a focus on but not limited to transparent objects, which is an important and challenging problem in robotic systems and modern industry. Current methods requiring depth input fail on transparent objects due to depth cameras' deficiency in sensing their geometry, while we proposed a novel framework to reconstruct the scene on the production line depending only on RGB input, based on multiview stereo. Compared to existing works, our method not only reconstructs the whole 3D scene in order to obtain high-quality 6-DoF suction poses in real time but also generalizes to novel environments, novel arrangements and novel objects, including challenging transparent objects, both in simulation and the real world. Extensive experiments in simulation and the real world show that our method significantly surpasses the baselines and has better generalizability, which caters to practical industrial needs.

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D Anomaly Detection in Additive Manufacturing dataset, that is the first large-scale, industry-relevant dataset for RGB+3D surface defect detection in additive manufacturing. 3D-ADAM comprises 14,120 high-resolution scans of 217 unique parts, captured with four industrial depth sensors, and includes 27,346 annotated defects across 12 categories along with 27,346 annotations of machine element features in 16 classes. 3D-ADAM is captured in a real industrial environment and as such reflects real production conditions, including variations in part placement, sensor positioning, lighting, and partial occlusion. Benchmarking state-of-the-art models demonstrates that 3D-ADAM presents substantial challenges beyond existing datasets. Validation through expert labelling surveys with industry partners further confirms its industrial relevance. By providing this benchmark, 3D-ADAM establishes a foundation for advancing robust 3D anomaly detection capable of meeting manufacturing demands.

Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. Yet, many methods, tailored to specific pipelines, grapple with diverse product portfolios and evolving processes. Addressing this, we present the Incremental Unified Framework (IUF), which can reduce the feature conflict problem when continuously integrating new objects in the pipeline, making it advantageous in object-incremental learning scenarios. Employing a state-of-the-art transformer, we introduce Object-Aware Self-Attention (OASA) to delineate distinct semantic boundaries. Semantic Compression Loss (SCL) is integrated to optimize non-primary semantic space, enhancing network adaptability for novel objects. Additionally, we prioritize retaining the features of established objects during weight updates. Demonstrating prowess in both image and pixel-level defect inspection, our approach achieves state-of-the-art performance, proving indispensable for dynamic and scalable industrial inspections. Our code will be released at https://github.com/jqtangust/IUF.

Industrial quality inspection plays a critical role in modern manufacturing by identifying defective products during production. While single-modality approaches using either 3D point clouds or 2D RGB images suffer from information incompleteness, multimodal anomaly detection offers promise through the complementary fusion of crossmodal data. However, existing methods face challenges in effectively integrating unimodal results and improving discriminative power. To address these limitations, we first reinterpret memory bank-based anomaly scores in single modalities as isotropic Euclidean distances in local feature spaces. Dynamically evolving from Euclidean metrics, we propose a novel Geometry-Guided Score Fusion (G^{2}SF) framework that progressively learns an anisotropic local distance metric as a unified score for the fusion task. Through a geometric encoding operator, a novel Local Scale Prediction Network (LSPN) is proposed to predict direction-aware scaling factors that characterize first-order local feature distributions, thereby enhancing discrimination between normal and anomalous patterns. Additionally, we develop specialized loss functions and score aggregation strategy from geometric priors to ensure both metric generalization and efficacy. Comprehensive evaluations on the MVTec-3D AD and Eyecandies datasets demonstrate the state-of-the-art detection performance of our method, and detailed ablation analysis validates each component's contribution. Our code is available at https://github.com/ctaoaa/G2SF.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

We present IMDD-1M, the first large-scale Industrial Multimodal Defect Dataset comprising 1,000,000 aligned image-text pairs, designed to advance multimodal learning for manufacturing and quality inspection. IMDD-1M contains high-resolution real-world defects spanning over 60 material categories and more than 400 defect types, each accompanied by expert-verified annotations and fine-grained textual descriptions detailing defect location, severity, and contextual attributes. This dataset enables a wide spectrum of applications, including classification, segmentation, retrieval, captioning, and generative modeling. Building upon IMDD-1M, we train a diffusion-based vision-language foundation model from scratch, specifically tailored for industrial scenarios. The model serves as a generalizable foundation that can be efficiently adapted to specialized domains through lightweight fine-tuning. With less than 5% of the task-specific data required by dedicated expert models, it achieves comparable performance, highlighting the potential of data-efficient foundation model adaptation for industrial inspection and generation, paving the way for scalable, domain-adaptive, and knowledge-grounded manufacturing intelligence.

One persistent obstacle in industrial quality inspection is the detection of anomalies. In real-world use cases, two problems must be addressed: anomalous data is sparse and the same types of anomalies need to be detected on previously unseen objects. Current anomaly detection approaches can be trained with sparse nominal data, whereas domain generalization approaches enable detecting objects in previously unseen domains. Utilizing those two observations, we introduce the hybrid task of domain generalization on sparse classes. To introduce an accompanying dataset for this task, we present a modification of the well-established MVTec AD dataset by generating three new datasets. In addition to applying existing methods for benchmark, we design two embedding-based approaches, Spatial Embedding MLP (SEMLP) and Labeled PatchCore. Overall, SEMLP achieves the best performance with an average image-level AUROC of 87.2 % vs. 80.4 % by MIRO. The new and openly available datasets allow for further research to improve industrial anomaly detection.

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

Industrial visual inspection in pharmaceutical production requires high accuracy under strict constraints on cycle time, hardware footprint, and operational cost. Manual inline inspection is still common, but it is affected by operator variability and limited throughput. Classical rule-based computer vision pipelines are often rigid and difficult to scale to highly variable production scenarios. To address these limitations, we present a semi-supervised anomaly detection framework based on a generative adversarial architecture with a residual autoencoder and a dense bottleneck, specifically designed for online deployment on a high-speed Blow-Fill-Seal (BFS) line. The model is trained only on nominal samples and detects anomalies through reconstruction residuals, providing both classification and spatial localization via heatmaps. The training set contains 2,815,200 grayscale patches. Experiments on a real industrial test kit show high detection performance while satisfying timing constraints compatible with a 500 ms acquisition slot.

Accurate defect segmentation is critical for industrial inspection, yet dense pixel-level annotations are rarely available. A common workaround is to convert inexpensive bounding boxes into pseudo-masks using foundation segmentation models such as the Segment Anything Model (SAM). However, these pseudo-labels are systematically noisy on industrial surfaces, often hallucinating background structure while missing sparse defects. To address this limitation, a noise-robust box-to-pixel distillation framework, Boxes2Pixels, is proposed that treats SAM as a noisy teacher rather than a source of ground-truth supervision. Bounding boxes are converted into pseudo-masks offline by SAM, and a compact student is trained with (i) a hierarchical decoder over frozen DINOv2 features for semantic stability, (ii) an auxiliary binary localization head to decouple sparse foreground discovery from class prediction, and (iii) a one-sided online self-correction mechanism that relaxes background supervision when the student is confident, targeting teacher false negatives. On a manually annotated wind turbine inspection benchmark, the proposed Boxes2Pixels improves anomaly mIoU by +6.97 and binary IoU by +9.71 over the strongest baseline trained under identical weak supervision. Moreover, online self-correction increases the binary recall by +18.56, while the model employs 80\% fewer trainable parameters. Code is available at https://github.com/CLendering/Boxes2Pixels.

Anomaly detection in industrial visual inspection is challenging due to the scarcity of defective samples. Most existing methods rely on unsupervised reconstruction using only normal data, often resulting in overfitting and poor detection of subtle defects. We propose a semi-supervised deep reinforcement learning framework that integrates a neural batch sampler, an autoencoder, and a predictor. The RL-based sampler adaptively selects informative patches by balancing exploration and exploitation through a composite reward. The autoencoder generates loss profiles highlighting abnormal regions, while the predictor performs segmentation in the loss-profile space. This interaction enables the system to effectively learn both normal and defective patterns with limited labeled data. Experiments on the MVTec AD dataset demonstrate that our method achieves higher accuracy and better localization of subtle anomalies than recent state-of-the-art approaches while maintaining low complexity, yielding an average improvement of 0.15 in F1_max and 0.06 in AUC, with a maximum gain of 0.37 in F1_max in the best case.

The recent rapid development of deep learning has laid a milestone in industrial Image Anomaly Detection (IAD). In this paper, we provide a comprehensive review of deep learning-based image anomaly detection techniques, from the perspectives of neural network architectures, levels of supervision, loss functions, metrics and datasets. In addition, we extract the new setting from industrial manufacturing and review the current IAD approaches under our proposed our new setting. Moreover, we highlight several opening challenges for image anomaly detection. The merits and downsides of representative network architectures under varying supervision are discussed. Finally, we summarize the research findings and point out future research directions. More resources are available at https://github.com/M-3LAB/awesome-industrial-anomaly-detection.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and time-consuming. To address this challenge, we propose a novel diffusion-based pipeline for generating high-fidelity industrial datasets with minimal supervision. Our approach conditions the diffusion model on enriched bounding box representations to produce precise segmentation masks, ensuring realistic and accurately localized defect synthesis. Compared to existing layout-conditioned generative methods, our approach improves defect consistency and spatial accuracy. We introduce two quantitative metrics to evaluate the effectiveness of our method and assess its impact on a downstream segmentation task trained on real and synthetic data. Our results demonstrate that diffusion-based synthesis can bridge the gap between artificial and real-world industrial data, fostering more reliable and cost-efficient segmentation models. The code is publicly available at https://github.com/covisionlab/diffusion_labeling.

We present a new framework for Patch Distribution Modeling, PaDiM, to concurrently detect and localize anomalies in images in a one-class learning setting. PaDiM makes use of a pretrained convolutional neural network (CNN) for patch embedding, and of multivariate Gaussian distributions to get a probabilistic representation of the normal class. It also exploits correlations between the different semantic levels of CNN to better localize anomalies. PaDiM outperforms current state-of-the-art approaches for both anomaly detection and localization on the MVTec AD and STC datasets. To match real-world visual industrial inspection, we extend the evaluation protocol to assess performance of anomaly localization algorithms on non-aligned dataset. The state-of-the-art performance and low complexity of PaDiM make it a good candidate for many industrial applications.

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.

In the field of industrial inspection, Multimodal Large Language Models (MLLMs) have a high potential to renew the paradigms in practical applications due to their robust language capabilities and generalization abilities. However, despite their impressive problem-solving skills in many domains, MLLMs' ability in industrial anomaly detection has not been systematically studied. To bridge this gap, we present MMAD, the first-ever full-spectrum MLLMs benchmark in industrial Anomaly Detection. We defined seven key subtasks of MLLMs in industrial inspection and designed a novel pipeline to generate the MMAD dataset with 39,672 questions for 8,366 industrial images. With MMAD, we have conducted a comprehensive, quantitative evaluation of various state-of-the-art MLLMs. The commercial models performed the best, with the average accuracy of GPT-4o models reaching 74.9%. However, this result falls far short of industrial requirements. Our analysis reveals that current MLLMs still have significant room for improvement in answering questions related to industrial anomalies and defects. We further explore two training-free performance enhancement strategies to help models improve in industrial scenarios, highlighting their promising potential for future research.

Visual anomaly detection is critical in industrial manufacturing, but traditional methods often rely on extensive normal datasets and custom models, limiting scalability. Recent advancements in large-scale visual-language models have significantly improved zero/few-shot anomaly detection. However, these approaches may not fully utilize hierarchical features, potentially missing nuanced details. We introduce a window self-attention mechanism based on the CLIP model, combined with learnable prompts to process multi-level features within a Soldier-Offier Window self-Attention (SOWA) framework. Our method has been tested on five benchmark datasets, demonstrating superior performance by leading in 18 out of 20 metrics compared to existing state-of-the-art techniques.

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD.

Multimodal large language models (MLLMs) have shown remarkable capability in bridging visual perception and textual reasoning, enabling zero-shot understanding across diverse industrial scenarios. However, their performance in open-vocabulary industrial anomaly detection (IAD) is often limited by domain-misaligned reasoning and hallucinated structural inferences. To address these challenges, we propose IndusAgent, a tool-augmented agentic framework for open-vocabulary IAD. Specifically, we first construct Indus-CoT, a structured dataset that integrates global visual observations, high-resolution local patches, and expert normalcy priors, providing supervision for fine-tuning the model on rigorous industrial inspection trajectories. Building on this, IndusAgent dynamically orchestrates a set of external tools, including dynamic region cropping, high-frequency feature enhancement, and prior retrieval, thus enabling the agent to actively resolve visual ambiguities and disentangle subtle anomalies. Furthermore, we introduce a gated reinforcement learning objective that jointly optimizes anomaly classification, localization accuracy, anomaly type reasoning, and efficient tool usage, ensuring that tool invocation occurs only when beneficial. Extensive evaluations on five industrial anomaly benchmarks, including MVTec-AD, VisA, MPDD, DTD, and SDD, demonstrate that IndusAgent achieves state-of-the-art zero-shot performance among all existing methods, validating our robustness and generalization capacity.

Data augmentation is a promising technique for unsupervised anomaly detection in industrial applications, where the availability of positive samples is often limited due to factors such as commercial competition and sample collection difficulties. In this paper, how to effectively select and apply data augmentation methods for unsupervised anomaly detection is studied. The impact of various data augmentation methods on different anomaly detection algorithms is systematically investigated through experiments. The experimental results show that the performance of different industrial image anomaly detection (termed as IAD) algorithms is not significantly affected by the specific data augmentation method employed and that combining multiple data augmentation methods does not necessarily yield further improvements in the accuracy of anomaly detection, although it can achieve excellent results on specific methods. These findings provide useful guidance on selecting appropriate data augmentation methods for different requirements in IAD.

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the effectiveness of ML in wafer defect identification, there is a noticeable absence of comprehensive reviews on this subject. This survey attempts to fill this void by amalgamating available literature and providing an in-depth analysis of the advantages, limitations, and potential applications of various ML classification algorithms in the realm of wafer defect detection. An innovative taxonomy of methodologies that we present provides a detailed classification of algorithms into more refined categories and techniques. This taxonomy follows a three-tier structure, starting from broad methodology categories and ending with specific techniques. It aids researchers in comprehending the complex relationships between different algorithms and their techniques. We employ a rigorous empirical and experimental evaluation to rank these varying techniques. For the empirical evaluation, we assess techniques based on a set of five criteria. The experimental evaluation ranks the algorithms employing the same techniques, sub-categories, and categories. Also the paper illuminates the future prospects of ML classification techniques for wafer defect identification, underscoring potential advancements and opportunities for further research in this field

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to identify the defects. These methods are generally very huge and have significant inference time. They also require GPU support to efficiently operate. All these issues make these models not fit for on-line prediction in the manufacturing foundry. In this paper, we propose an extremely simple yet effective technique to extract features from wafer images. The proposed method is extremely fast, intuitive, and non-parametric while being explainable. The experiment results show that the proposed pipeline outperforms conventional deep learning models. Our feature extraction requires no training or fine-tuning while preserving the relative shape and location of data points as revealed by our interpretability analysis.

Logical anomaly detection in industrial inspection remains challenging due to variations in visual appearance (e.g., background clutter, illumination shift, and blur), which often distract vision-centric detectors from identifying rule-level violations. However, existing benchmarks rarely provide controlled settings where logical states are fixed while such nuisance factors vary. To address this gap, we introduce VID-AD, a dataset for logical anomaly detection under vision-induced distraction. It comprises 10 manufacturing scenarios and five capture conditions, totaling 50 one-class tasks and 10,395 images. Each scenario is defined by two logical constraints selected from quantity, length, type, placement, and relation, with anomalies including both single-constraint and combined violations. We further propose a language-based anomaly detection framework that relies solely on text descriptions generated from normal images. Using contrastive learning with positive texts and contradiction-based negative texts synthesized from these descriptions, our method learns embeddings that capture logical attributes rather than low-level features. Extensive experiments demonstrate consistent improvements over baselines across the evaluated settings. The dataset is available at: https://github.com/nkthiroto/VID-AD.

Video anomaly detection (VAD) is a challenging task aiming to recognize anomalies in video frames, and existing large-scale VAD researches primarily focus on road traffic and human activity scenes. In industrial scenes, there are often a variety of unpredictable anomalies, and the VAD method can play a significant role in these scenarios. However, there is a lack of applicable datasets and methods specifically tailored for industrial production scenarios due to concerns regarding privacy and security. To bridge this gap, we propose a new dataset, IPAD, specifically designed for VAD in industrial scenarios. The industrial processes in our dataset are chosen through on-site factory research and discussions with engineers. This dataset covers 16 different industrial devices and contains over 6 hours of both synthetic and real-world video footage. Moreover, we annotate the key feature of the industrial process, ie, periodicity. Based on the proposed dataset, we introduce a period memory module and a sliding window inspection mechanism to effectively investigate the periodic information in a basic reconstruction model. Our framework leverages LoRA adapter to explore the effective migration of pretrained models, which are initially trained using synthetic data, into real-world scenarios. Our proposed dataset and method will fill the gap in the field of industrial video anomaly detection and drive the process of video understanding tasks as well as smart factory deployment.

Industrial diagrams such as piping and instrumentation diagrams (P&IDs) are essential for the design, operation, and maintenance of industrial plants. Converting these diagrams into digital form is an important step toward building digital twins and enabling intelligent industrial automation. A central challenge in this digitalization process is accurate object detection. Although recent advances have significantly improved object detection algorithms, there remains a lack of methods to automatically evaluate the quality of their outputs. This paper addresses this gap by introducing a framework that employs Visual Language Models (VLMs) to assess object detection results and guide their refinement. The approach exploits the multimodal capabilities of VLMs to identify missing or inconsistent detections, thereby enabling automated quality assessment and improving overall detection performance on complex industrial diagrams.

Segmentation-based, two-stage neural network has shown excellent results in the surface defect detection, enabling the network to learn from a relatively small number of samples. In this work, we introduce end-to-end training of the two-stage network together with several extensions to the training process, which reduce the amount of training time and improve the results on the surface defect detection tasks. To enable end-to-end training we carefully balance the contributions of both the segmentation and the classification loss throughout the learning. We adjust the gradient flow from the classification into the segmentation network in order to prevent the unstable features from corrupting the learning. As an additional extension to the learning, we propose frequency-of-use sampling scheme of negative samples to address the issue of over- and under-sampling of images during the training, while we employ the distance transform algorithm on the region-based segmentation masks as weights for positive pixels, giving greater importance to areas with higher probability of presence of defect without requiring a detailed annotation. We demonstrate the performance of the end-to-end training scheme and the proposed extensions on three defect detection datasets - DAGM, KolektorSDD and Severstal Steel defect dataset - where we show state-of-the-art results. On the DAGM and the KolektorSDD we demonstrate 100\% detection rate, therefore completely solving the datasets. Additional ablation study performed on all three datasets quantitatively demonstrates the contribution to the overall result improvements for each of the proposed extensions.

The paper explores the industrial multimodal Anomaly Detection (AD) task, which exploits point clouds and RGB images to localize anomalies. We introduce a novel light and fast framework that learns to map features from one modality to the other on nominal samples. At test time, anomalies are detected by pinpointing inconsistencies between observed and mapped features. Extensive experiments show that our approach achieves state-of-the-art detection and segmentation performance in both the standard and few-shot settings on the MVTec 3D-AD dataset while achieving faster inference and occupying less memory than previous multimodal AD methods. Moreover, we propose a layer-pruning technique to improve memory and time efficiency with a marginal sacrifice in performance.

Visual anomaly classification and segmentation are vital for automating industrial quality inspection. The focus of prior research in the field has been on training custom models for each quality inspection task, which requires task-specific images and annotation. In this paper we move away from this regime, addressing zero-shot and few-normal-shot anomaly classification and segmentation. Recently CLIP, a vision-language model, has shown revolutionary generality with competitive zero-/few-shot performance in comparison to full-supervision. But CLIP falls short on anomaly classification and segmentation tasks. Hence, we propose window-based CLIP (WinCLIP) with (1) a compositional ensemble on state words and prompt templates and (2) efficient extraction and aggregation of window/patch/image-level features aligned with text. We also propose its few-normal-shot extension WinCLIP+, which uses complementary information from normal images. In MVTec-AD (and VisA), without further tuning, WinCLIP achieves 91.8%/85.1% (78.1%/79.6%) AUROC in zero-shot anomaly classification and segmentation while WinCLIP+ does 93.1%/95.2% (83.8%/96.4%) in 1-normal-shot, surpassing state-of-the-art by large margins.

Industrial visual sim-to-real is often described as transferring from synthetic images to real images, but industrial deployment usually involves a broader mismatch between available evidence and required decisions. A system may be built from CAD renderings, simulated RGB-D observations, normal reference images, synthetic defects, pretrained feature spaces, or language prompts, yet deployed under different sensors, lighting, materials, fixtures, calibration, production variation, and rare defect modes. This review reframes industrial visual sim-to-real as a domain-gap problem organized by prior availability. We distinguish CAD-available settings, where explicit object geometry can support rendering, calibration, pose estimation, segmentation, and test-time geometric verification; CAD-unavailable settings, where geometry is replaced by normal-reference appearance, feature distributions, teacher-student residuals, synthetic anomaly assumptions, foundation features, or vision-language priors; and boundary-prior settings, where approximate models, templates, reference views, or semantic correspondences preserve only part of the CAD role. This framing connects CAD-based detection and 6D pose-estimation literature with industrial anomaly and surface-inspection literature that is usually reviewed separately. To make the taxonomy concrete, we use empirical anchors on T-LESS/BOP, MVTec AD, and VisA. The anchors show that CAD render count alone does not close transfer; source-distribution design, detector capacity, and small real calibration can matter more. They also show that CAD at test time creates a distinct verification channel through mask, pose, and depth consistency, whereas CAD-unavailable inspection relies on calibrated normality and feature deviation. The review therefore argues against a single cross-task leaderboard and instead asks what prior grounds the deployment decision.

With the support of Internet of Things (IoT) devices, it is possible to acquire data from degradation phenomena and design data-driven models to perform anomaly detection in industrial equipment. This approach not only identifies potential anomalies but can also serve as a first step toward building predictive maintenance policies. In this work, we demonstrate a novel anomaly detection system on induction motors used in pumps, compressors, fans, and other industrial machines. This work evaluates a combination of pre-processing techniques and machine learning (ML) models with a low computational cost. We use a combination of pre-processing techniques such as Fast Fourier Transform (FFT), Wavelet Transform (WT), and binning, which are well-known approaches for extracting features from raw data. We also aim to guarantee an optimal balance between multiple conflicting parameters, such as anomaly detection rate, false positive rate, and inference speed of the solution. To this end, multiobjective optimization and analysis are performed on the evaluated models. Pareto-optimal solutions are presented to select which models have the best results regarding classification metrics and computational effort. Differently from most works in this field that use publicly available datasets to validate their models, we propose an end-to-end solution combining low-cost and readily available IoT sensors. The approach is validated by acquiring a custom dataset from induction motors. Also, we fuse vibration, temperature, and noise data from these sensors as the input to the proposed ML model. Therefore, we aim to propose a methodology general enough to be applied in different industrial contexts in the future.

Unsupervised texture anomaly detection has been a concerning topic in a vast amount of industrial processes. Patterned textures inspection, particularly in the context of fabric defect detection, is indeed a widely encountered use case. This task involves handling a diverse spectrum of colors and textile types, encompassing a wide range of fabrics. Given the extensive variability in colors, textures, and defect types, fabric defect detection poses a complex and challenging problem in the field of patterned textures inspection. In this article, we propose a knowledge distillation-based approach tailored specifically for addressing the challenge of unsupervised anomaly detection in textures resembling fabrics. Our method aims to redefine the recently introduced reverse distillation approach, which advocates for an encoder-decoder design to mitigate classifier bias and to prevent the student from reconstructing anomalies. In this study, we present a new reverse distillation technique for the specific task of fabric defect detection. Our approach involves a meticulous design selection that strategically highlights high-level features. To demonstrate the capabilities of our approach both in terms of performance and inference speed, we conducted a series of experiments on multiple texture datasets, including MVTEC AD, AITEX, and TILDA, alongside conducting experiments on a dataset acquired from a textile manufacturing facility. The main contributions of this paper are the following: a robust texture anomaly detector utilizing a reverse knowledge-distillation technique suitable for both anomaly detection and domain generalization and a novel dataset encompassing a diverse range of fabrics and defects.

3D anomaly detection and localization is of great significance for industrial inspection. Prior 3D anomaly detection and localization methods focus on the setting that the testing data share the same category as the training data which is normal. However, in real-world applications, the normal training data for the target 3D objects can be unavailable due to issues like data privacy or export control regulation. To tackle these challenges, we identify a new task -- zero-shot 3D anomaly detection and localization, where the training and testing classes do not overlap. To this end, we design 3DzAL, a novel patch-level contrastive learning framework based on pseudo anomalies generated using the inductive bias from task-irrelevant 3D xyz data to learn more representative feature representations. Furthermore, we train a normalcy classifier network to classify the normal patches and pseudo anomalies and utilize the classification result jointly with feature distance to design anomaly scores. Instead of directly using the patch point clouds, we introduce adversarial perturbations to the input patch xyz data before feeding into the 3D normalcy classifier for the classification-based anomaly score. We show that 3DzAL outperforms the state-of-the-art anomaly detection and localization performance.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

In this work we explore the application of AI to robotic welding. Robotic welding is a widely used technology in many industries, but robots currently do not have the capability to detect welding defects which get introduced due to various reasons in the welding process. We describe how deep-learning methods can be applied to detect weld defects in real-time by recording the welding process with microphones and a camera. Our findings are based on a large database with more than 4000 welding samples we collected which covers different weld types, materials and various defect categories. All deep learning models are trained in an unsupervised fashion because the space of possible defects is large and the defects in our data may contain biases. We demonstrate that a reliable real-time detection of most categories of weld defects is feasible both from audio and video, with improvements achieved by combining both modalities. Specifically, the multi-modal approach achieves an average Area-under-ROC-Curve (AUC) of 0.92 over all eleven defect types in our data. We conclude the paper with an analysis of the results by defect type and a discussion of future work.

The aim of surface defect detection is to identify and localise abnormal regions on the surfaces of captured objects, a task that's increasingly demanded across various industries. Current approaches frequently fail to fulfil the extensive demands of these industries, which encompass high performance, consistency, and fast operation, along with the capacity to leverage the entirety of the available training data. Addressing these gaps, we introduce SuperSimpleNet, an innovative discriminative model that evolved from SimpleNet. This advanced model significantly enhances its predecessor's training consistency, inference time, as well as detection performance. SuperSimpleNet operates in an unsupervised manner using only normal training images but also benefits from labelled abnormal training images when they are available. SuperSimpleNet achieves state-of-the-art results in both the supervised and the unsupervised settings, as demonstrated by experiments across four challenging benchmark datasets. Code: https://github.com/blaz-r/SuperSimpleNet .

Large Vision-Language Models (LVLMs) such as MiniGPT-4 and LLaVA have demonstrated the capability of understanding images and achieved remarkable performance in various visual tasks. Despite their strong abilities in recognizing common objects due to extensive training datasets, they lack specific domain knowledge and have a weaker understanding of localized details within objects, which hinders their effectiveness in the Industrial Anomaly Detection (IAD) task. On the other hand, most existing IAD methods only provide anomaly scores and necessitate the manual setting of thresholds to distinguish between normal and abnormal samples, which restricts their practical implementation. In this paper, we explore the utilization of LVLM to address the IAD problem and propose AnomalyGPT, a novel IAD approach based on LVLM. We generate training data by simulating anomalous images and producing corresponding textual descriptions for each image. We also employ an image decoder to provide fine-grained semantic and design a prompt learner to fine-tune the LVLM using prompt embeddings. Our AnomalyGPT eliminates the need for manual threshold adjustments, thus directly assesses the presence and locations of anomalies. Additionally, AnomalyGPT supports multi-turn dialogues and exhibits impressive few-shot in-context learning capabilities. With only one normal shot, AnomalyGPT achieves the state-of-the-art performance with an accuracy of 86.1%, an image-level AUC of 94.1%, and a pixel-level AUC of 95.3% on the MVTec-AD dataset. Code is available at https://github.com/CASIA-IVA-Lab/AnomalyGPT.

This paper studies zero-shot anomaly classification (AC) and segmentation (AS) in industrial vision. We reveal that the abundant normal and abnormal cues implicit in unlabeled test images can be exploited for anomaly determination, which is ignored by prior methods. Our key observation is that for the industrial product images, the normal image patches could find a relatively large number of similar patches in other unlabeled images, while the abnormal ones only have a few similar patches. We leverage such a discriminative characteristic to design a novel zero-shot AC/AS method by Mutual Scoring (MuSc) of the unlabeled images, which does not need any training or prompts. Specifically, we perform Local Neighborhood Aggregation with Multiple Degrees (LNAMD) to obtain the patch features that are capable of representing anomalies in varying sizes. Then we propose the Mutual Scoring Mechanism (MSM) to leverage the unlabeled test images to assign the anomaly score to each other. Furthermore, we present an optimization approach named Re-scoring with Constrained Image-level Neighborhood (RsCIN) for image-level anomaly classification to suppress the false positives caused by noises in normal images. The superior performance on the challenging MVTec AD and VisA datasets demonstrates the effectiveness of our approach. Compared with the state-of-the-art zero-shot approaches, MuSc achieves a 21.1% PRO absolute gain (from 72.7% to 93.8%) on MVTec AD, a 19.4% pixel-AP gain and a 14.7% pixel-AUROC gain on VisA. In addition, our zero-shot approach outperforms most of the few-shot approaches and is comparable to some one-class methods. Code is available at https://github.com/xrli-U/MuSc.

In recent years, Printed Circuit Boards (PCB) have become the backbone of a large number of consumer electronic devices leading to a surge in their production. This has made it imperative to employ automatic inspection systems to identify manufacturing defects in PCB before they are installed in the respective systems. An important task in this regard is the classification of defects as either true or pseudo defects, which decides if the PCB is to be re-manufactured or not. This work proposes a novel approach to detect most common defects in the PCBs. The problem has been approached by employing highly discriminative features based on multi-scale wavelet transform, which are further boosted by using a kernalized version of the support vector machines (SVM). A real world printed circuit board dataset has been used for quantitative analysis. Experimental results demonstrated the efficacy of the proposed method.

Industrial anomaly detection is an important task within computer vision with a wide range of practical use cases. The small size of anomalous regions in many real-world datasets necessitates processing the images at a high resolution. This frequently poses significant challenges concerning memory consumption during the model training and inference stages, leaving some existing methods impractical for widespread adoption. To overcome this challenge, we present the tiled ensemble approach, which reduces memory consumption by dividing the input images into a grid of tiles and training a dedicated model for each tile location. The tiled ensemble is compatible with any existing anomaly detection model without the need for any modification of the underlying architecture. By introducing overlapping tiles, we utilize the benefits of traditional stacking ensembles, leading to further improvements in anomaly detection capabilities beyond high resolution alone. We perform a comprehensive analysis using diverse underlying architectures, including Padim, PatchCore, FastFlow, and Reverse Distillation, on two standard anomaly detection datasets: MVTec and VisA. Our method demonstrates a notable improvement across setups while remaining within GPU memory constraints, consuming only as much GPU memory as a single model needs to process a single tile.

Anomaly inspection plays a vital role in industrial manufacturing, but the scarcity of anomaly samples significantly limits the effectiveness of existing methods in tasks such as localization and classification. While several anomaly synthesis approaches have been introduced for data augmentation, they often struggle with low realism, inaccurate mask alignment, and poor generalization. To overcome these limitations, we propose Generate Aligned Anomaly (GAA), a region-guided, few-shot anomaly image-mask pair generation framework. GAA leverages the strong priors of a pretrained latent diffusion model to generate realistic, diverse, and semantically aligned anomalies using only a small number of samples. The framework first employs Localized Concept Decomposition to jointly model the semantic features and spatial information of anomalies, enabling flexible control over the type and location of anomalies. It then utilizes Adaptive Multi-Round Anomaly Clustering to perform fine-grained semantic clustering of anomaly concepts, thereby enhancing the consistency of anomaly representations. Subsequently, a region-guided mask generation strategy ensures precise alignment between anomalies and their corresponding masks, while a low-quality sample filtering module is introduced to further improve the overall quality of the generated samples. Extensive experiments on the MVTec AD and LOCO datasets demonstrate that GAA achieves superior performance in both anomaly synthesis quality and downstream tasks such as localization and classification.

Few-shot anomaly detection (FSAD) has emerged as a crucial yet challenging task in industrial inspection, where normal distribution modeling must be accomplished with only a few normal images. While existing approaches typically employ multi-modal foundation models combining language and vision modalities for prompt-guided anomaly detection, these methods often demand sophisticated prompt engineering and extensive manual tuning. In this paper, we demonstrate that a straightforward nearest-neighbor search framework can surpass state-of-the-art performance in both single-class and multi-class FSAD scenarios. Our proposed method, VisionAD, consists of four simple yet essential components: (1) scalable vision foundation models that extract universal and discriminative features; (2) dual augmentation strategies - support augmentation to enhance feature matching adaptability and query augmentation to address the oversights of single-view prediction; (3) multi-layer feature integration that captures both low-frequency global context and high-frequency local details with minimal computational overhead; and (4) a class-aware visual memory bank enabling efficient one-for-all multi-class detection. Extensive evaluations across MVTec-AD, VisA, and Real-IAD benchmarks demonstrate VisionAD's exceptional performance. Using only 1 normal images as support, our method achieves remarkable image-level AUROC scores of 97.4%, 94.8%, and 70.8% respectively, outperforming current state-of-the-art approaches by significant margins (+1.6%, +3.2%, and +1.4%). The training-free nature and superior few-shot capabilities of VisionAD make it particularly appealing for real-world applications where samples are scarce or expensive to obtain. Code is available at https://github.com/Qiqigeww/VisionAD.

Anomaly detection is a practical and challenging task due to the scarcity of anomaly samples in industrial inspection. Some existing anomaly detection methods address this issue by synthesizing anomalies with noise or external data. However, there is always a large semantic gap between synthetic and real-world anomalies, resulting in weak performance in anomaly detection. To solve the problem, we propose a few-shot Anomaly-driven Generation (AnoGen) method, which guides the diffusion model to generate realistic and diverse anomalies with only a few real anomalies, thereby benefiting training anomaly detection models. Specifically, our work is divided into three stages. In the first stage, we learn the anomaly distribution based on a few given real anomalies and inject the learned knowledge into an embedding. In the second stage, we use the embedding and given bounding boxes to guide the diffusion model to generate realistic and diverse anomalies on specific objects (or textures). In the final stage, we propose a weakly-supervised anomaly detection method to train a more powerful model with generated anomalies. Our method builds upon DRAEM and DesTSeg as the foundation model and conducts experiments on the commonly used industrial anomaly detection dataset, MVTec. The experiments demonstrate that our generated anomalies effectively improve the model performance of both anomaly classification and segmentation tasks simultaneously, \eg, DRAEM and DseTSeg achieved a 5.8\% and 1.5\% improvement in AU-PR metric on segmentation task, respectively. The code and generated anomalous data are available at https://github.com/gaobb/AnoGen.

We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal training data only. We first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at a random location of a large image. Our empirical study on MVTec anomaly detection dataset demonstrates the proposed algorithm is general to be able to detect various types of real-world defects. We bring the improvement upon previous arts by 3.1 AUCs when learning representations from scratch. By transfer learning on pretrained representations on ImageNet, we achieve a new state-of-theart 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localizing defective areas without annotations during training.

Surface anomaly detection is a vital component in manufacturing inspection. Current discriminative methods follow a two-stage architecture composed of a reconstructive network followed by a discriminative network that relies on the reconstruction output. Currently used reconstructive networks often produce poor reconstructions that either still contain anomalies or lack details in anomaly-free regions. Discriminative methods are robust to some reconstructive network failures, suggesting that the discriminative network learns a strong normal appearance signal that the reconstructive networks miss. We reformulate the two-stage architecture into a single-stage iterative process that allows the exchange of information between the reconstruction and localization. We propose a novel transparency-based diffusion process where the transparency of anomalous regions is progressively increased, restoring their normal appearance accurately while maintaining the appearance of anomaly-free regions using localization cues of previous steps. We implement the proposed process as TRANSparency DifFUSION (TransFusion), a novel discriminative anomaly detection method that achieves state-of-the-art performance on both the VisA and the MVTec AD datasets, with an image-level AUROC of 98.5% and 99.2%, respectively. Code: https://github.com/MaticFuc/ECCV_TransFusion

In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning electron microscope (SEM) images and the diverse textures of the defects pose significant challenges. Traditional methods usually suffer from insufficient data, labels, and poor transferability. In this paper, we propose a novel few-shot learning approach, SEM-CLIP, for accurate defect classification and segmentation. SEM-CLIP customizes the Contrastive Language-Image Pretraining (CLIP) model to better focus on defect areas and minimize background distractions, thereby enhancing segmentation accuracy. We employ text prompts enriched with domain knowledge as prior information to assist in precise analysis. Additionally, our approach incorporates feature engineering with textual guidance to categorize defects more effectively. SEM-CLIP requires little annotated data, substantially reducing labor demands in the semiconductor industry. Extensive experimental validation demonstrates that our model achieves impressive classification and segmentation results under few-shot learning scenarios.

3D anomaly detection plays a crucial role in monitoring parts for localized inherent defects in precision manufacturing. Embedding-based and reconstruction-based approaches are among the most popular and successful methods. However, there are two major challenges to the practical application of the current approaches: 1) the embedded models suffer the prohibitive computational and storage due to the memory bank structure; 2) the reconstructive models based on the MAE mechanism fail to detect anomalies in the unmasked regions. In this paper, we propose R3D-AD, reconstructing anomalous point clouds by diffusion model for precise 3D anomaly detection. Our approach capitalizes on the data distribution conversion of the diffusion process to entirely obscure the input's anomalous geometry. It step-wisely learns a strict point-level displacement behavior, which methodically corrects the aberrant points. To increase the generalization of the model, we further present a novel 3D anomaly simulation strategy named Patch-Gen to generate realistic and diverse defect shapes, which narrows the domain gap between training and testing. Our R3D-AD ensures a uniform spatial transformation, which allows straightforwardly generating anomaly results by distance comparison. Extensive experiments show that our R3D-AD outperforms previous state-of-the-art methods, achieving 73.4% Image-level AUROC on the Real3D-AD dataset and 74.9% Image-level AUROC on the Anomaly-ShapeNet dataset with an exceptional efficiency.

We present the Open Stamped Parts Dataset (OSPD), featuring synthetic and real images of stamped metal sheets for auto manufacturing. The real part images, captured from 7 cameras, consist of 7,980 unlabeled images and 1,680 labeled images. In addition, we have compiled a defect dataset by overlaying synthetically generated masks on 10\% of the holes. The synthetic dataset replicates the real manufacturing environment in terms of lighting and part placement relative to the cameras. The synthetic data includes 7,980 training images, 1,680 validation images and 1,680 test images, each with bounding box and segmentation mask annotations around all holes. 10\% of the holes in the synthetic data mimic defects generated in the real image dataset. We trained a hole-detection model on the synthetic-OSPD, achieving a modified recall score of 67.2\% and a precision of 94.4\% . We anticipate researchers in auto manufacturing use OSPD to advance the state of the art in defect detection of stamped holes in the metal-sheet stamping process. The dataset is available for download at: https://tinyurl.com/hm6xatd7.

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

Industrial anomaly detection (IAD) is difficult due to the scarcity of normal reference samples and the subtle, localized nature of many defects. Single-pass vision-language models (VLMs) often overlook small abnormalities and lack explicit mechanisms to compare against canonical normal patterns. We propose AgentIAD, a tool-driven agentic framework that enables multi-stage visual inspection. The agent is equipped with a Perceptive Zoomer (PZ) for localized fine-grained analysis and a Comparative Retriever (CR) for querying normal exemplars when evidence is ambiguous. To teach these inspection behaviors, we construct structured perceptive and comparative trajectories from the MMAD dataset and train the model in two stages: supervised fine-tuning followed by reinforcement learning. A two-part reward design drives this process: a perception reward that supervises classification accuracy, spatial alignment, and type correctness, and a behavior reward that encourages efficient tool use. Together, these components enable the model to refine its judgment through step-wise observation, zooming, and verification. AgentIAD achieves a new state-of-the-art 97.62% classification accuracy on MMAD, surpassing prior MLLM-based approaches while producing transparent and interpretable inspection traces.

Automated detection of defects in Printed Circuit Board (PCB) manufacturing using Solder Paste Inspection (SPI) and Automated Optical Inspection (AOI) machines can help improve operational efficiency and significantly reduce the need for manual intervention. In this paper, using SPI-extracted features of 6 million pins, we demonstrate a data-centric approach to train Machine Learning (ML) models to detect PCB defects at three stages of PCB manufacturing. The 6 million PCB pins correspond to 2 million components that belong to 15,387 PCBs. Using a base extreme gradient boosting (XGBoost) ML model, we iterate on the data pre-processing step to improve detection performance. Combining pin-level SPI features using component and PCB IDs, we developed training instances also at the component and PCB level. This allows the ML model to capture any inter-pin, inter-component, or spatial effects that may not be apparent at the pin level. Models are trained at the pin, component, and PCB levels, and the detection results from the different models are combined to identify defective components.

In this paper, we introduce an approach for detecting modifications in assembled printed circuit boards based on photographs taken without tight control over perspective and illumination conditions. One instance of this problem is the visual inspection of gas pumps PCBs, which can be modified by fraudsters wishing to deceive costumers or evade taxes. Given the uncontrolled environment and the huge number of possible modifications, we address the problem as a case of anomaly detection, proposing an approach that is directed towards the characteristics of that scenario, while being well-suited for other similar applications. The proposed approach employs a deep convolutional autoencoder trained to reconstruct images of an unmodified board, but which remains unable to do the same for images showing modifications. By comparing the input image with its reconstruction, it is possible to segment anomalies and modifications in a pixel-wise manner. Experiments performed on a dataset built to represent real-world situations (and which we will make publicly available) show that our approach outperforms other state-of-the-art approaches for anomaly segmentation in the considered scenario, while producing comparable results on the popular MVTec-AD dataset for a more general object anomaly detection task.

Visual anomaly detection has been widely used in industrial inspection and medical diagnosis. Existing methods typically demand substantial training samples, limiting their utility in zero-/few-shot scenarios. While recent efforts have leveraged CLIP's zero-shot recognition capability for this task, they often ignore optimizing visual features to focus on local anomalies, reducing their efficacy. In this work, we propose AF-CLIP (Anomaly-Focused CLIP) by dramatically enhancing its visual representations to focus on local defects. Our approach introduces a lightweight adapter that emphasizes anomaly-relevant patterns in visual features, simultaneously optimizing both class-level features for image classification and patch-level features for precise localization. To capture anomalies of different sizes and improve detection accuracy, prior to the adapter, we develop a multi-scale spatial aggregation mechanism to effectively consolidate neighborhood context. Complementing these visual enhancements, we design learnable textual prompts that generically characterize normal and abnormal states. After optimization on auxiliary datasets using a composite objective function, AF-CLIP demonstrates strong zero-shot detection capability. Our method is also extended to few-shot scenarios by extra memory banks. Experimental results across diverse industrial and medical datasets demonstrate the effectiveness and generalization of our proposed method. Code is available at https://github.com/Faustinaqq/AF-CLIP.

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.

During industrial processing, unforeseen defects may arise in products due to uncontrollable factors. Although unsupervised methods have been successful in defect localization, the usual use of pre-trained models results in low-resolution outputs, which damages visual performance. To address this issue, we propose PyramidFlow, the first fully normalizing flow method without pre-trained models that enables high-resolution defect localization. Specifically, we propose a latent template-based defect contrastive localization paradigm to reduce intra-class variance, as the pre-trained models do. In addition, PyramidFlow utilizes pyramid-like normalizing flows for multi-scale fusing and volume normalization to help generalization. Our comprehensive studies on MVTecAD demonstrate the proposed method outperforms the comparable algorithms that do not use external priors, even achieving state-of-the-art performance in more challenging BTAD scenarios.

Deep neural networks show great potential for automating various visual quality inspection tasks in manufacturing. However, their applicability is limited in more volatile scenarios, such as remanufacturing, where the inspected products and defect patterns often change. In such settings, deployed models require frequent adaptation to novel conditions, effectively posing a continual learning problem. To enable quick adaptation, the necessary training processes must be computationally efficient while still avoiding effects like catastrophic forgetting. This work presents a multi-level feature fusion (MLFF) approach that aims to improve both aspects simultaneously by utilizing representations from different depths of a pretrained network. We show that our approach is able to match the performance of end-to-end training for different quality inspection problems while using significantly less trainable parameters. Furthermore, it reduces catastrophic forgetting and improves generalization robustness to new product types or defects.

Anomaly detection is valuable for real-world applications, such as industrial quality inspection. However, most approaches focus on detecting local structural anomalies while neglecting compositional anomalies incorporating logical constraints. In this paper, we introduce LogSAD, a novel multi-modal framework that requires no training for both Logical and Structural Anomaly Detection. First, we propose a match-of-thought architecture that employs advanced large multi-modal models (i.e. GPT-4V) to generate matching proposals, formulating interests and compositional rules of thought for anomaly detection. Second, we elaborate on multi-granularity anomaly detection, consisting of patch tokens, sets of interests, and composition matching with vision and language foundation models. Subsequently, we present a calibration module to align anomaly scores from different detectors, followed by integration strategies for the final decision. Consequently, our approach addresses both logical and structural anomaly detection within a unified framework and achieves state-of-the-art results without the need for training, even when compared to supervised approaches, highlighting its robustness and effectiveness. Code is available at https://github.com/zhang0jhon/LogSAD.

In recent years, the deterioration of artificial materials used in structures has become a serious social issue, increasing the importance of inspections. Non-destructive testing is gaining increased demand due to its capability to inspect for defects and deterioration in structures while preserving their functionality. Among these, Laser Ultrasonic Visualization Testing (LUVT) stands out because it allows the visualization of ultrasonic propagation. This makes it visually straightforward to detect defects, thereby enhancing inspection efficiency. With the increasing number of the deterioration structures, challenges such as a shortage of inspectors and increased workload in non-destructive testing have become more apparent. Efforts to address these challenges include exploring automated inspection using machine learning. However, the lack of anomalous data with defects poses a barrier to improving the accuracy of automated inspection through machine learning. Therefore, in this study, we propose a method for automated LUVT inspection using an anomaly detection approach with a diffusion model that can be trained solely on negative examples (defect-free data). We experimentally confirmed that our proposed method improves defect detection and localization compared to general object detection algorithms used previously.

Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity about some hyper-parameters. In this work, we design a deep model that accurately detects PCB defects from an input pair of a detect-free template and a defective tested image. A novel group pyramid pooling module is proposed to efficiently extract features of a large range of resolutions, which are merged by group to predict PCB defect of corresponding scales. To train the deep model, a dataset is established, namely DeepPCB, which contains 1,500 image pairs with annotations including positions of 6 common types of PCB defects. Experiment results validate the effectiveness and efficiency of the proposed model by achieving 98.6% mAP @ 62 FPS on DeepPCB dataset. This dataset is now available at: https://github.com/tangsanli5201/DeepPCB.

Power batteries are essential components in electric vehicles, where internal structural defects can pose serious safety risks. We conduct a comprehensive study on a new task, power battery detection (PBD), which aims to localize the dense endpoints of cathode and anode plates from industrial X-ray images for quality inspection. Manual inspection is inefficient and error-prone, while traditional vision algorithms struggle with densely packed plates, low contrast, scale variation, and imaging artifacts. To address this issue and drive more attention into this meaningful task, we present PBD5K, the first large-scale benchmark for this task, consisting of 5,000 X-ray images from nine battery types with fine-grained annotations and eight types of real-world visual interference. To support scalable and consistent labeling, we develop an intelligent annotation pipeline that combines image filtering, model-assisted pre-labeling, cross-verification, and layered quality evaluation. We formulate PBD as a point-level segmentation problem and propose MDCNeXt, a model designed to extract and integrate multi-dimensional structure clues including point, line, and count information from the plate itself. To improve discrimination between plates and suppress visual interference, MDCNeXt incorporates two state space modules. The first is a prompt-filtered module that learns contrastive relationships guided by task-specific prompts. The second is a density-aware reordering module that refines segmentation in regions with high plate density. In addition, we propose a distance-adaptive mask generation strategy to provide robust supervision under varying spatial distributions of anode and cathode positions. The source code and datasets will be publicly available at https://github.com/Xiaoqi-Zhao-DLUT/X-ray-PBD{PBD5K}.

Machine vision enhances automation, quality control, and operational efficiency in industrial applications by enabling machines to interpret and act on visual data. While traditional computer vision algorithms and approaches remain widely utilized, machine learning has become pivotal in current research activities. In particular, generative AI demonstrates promising potential by improving pattern recognition capabilities, through data augmentation, increasing image resolution, and identifying anomalies for quality control. However, the application of generative AI in machine vision is still in its early stages due to challenges in data diversity, computational requirements, and the necessity for robust validation methods. A comprehensive literature review is essential to understand the current state of generative AI in industrial machine vision, focusing on recent advancements, applications, and research trends. Thus, a literature review based on the PRISMA guidelines was conducted, analyzing over 1,200 papers on generative AI in industrial machine vision. Our findings reveal various patterns in current research, with the primary use of generative AI being data augmentation, for machine vision tasks such as classification and object detection. Furthermore, we gather a collection of application challenges together with data requirements to enable a successful application of generative AI in industrial machine vision. This overview aims to provide researchers with insights into the different areas and applications within current research, highlighting significant advancements and identifying opportunities for future work.

Anomaly inspection plays an important role in industrial manufacture. Existing anomaly inspection methods are limited in their performance due to insufficient anomaly data. Although anomaly generation methods have been proposed to augment the anomaly data, they either suffer from poor generation authenticity or inaccurate alignment between the generated anomalies and masks. To address the above problems, we propose AnomalyDiffusion, a novel diffusion-based few-shot anomaly generation model, which utilizes the strong prior information of latent diffusion model learned from large-scale dataset to enhance the generation authenticity under few-shot training data. Firstly, we propose Spatial Anomaly Embedding, which consists of a learnable anomaly embedding and a spatial embedding encoded from an anomaly mask, disentangling the anomaly information into anomaly appearance and location information. Moreover, to improve the alignment between the generated anomalies and the anomaly masks, we introduce a novel Adaptive Attention Re-weighting Mechanism. Based on the disparities between the generated anomaly image and normal sample, it dynamically guides the model to focus more on the areas with less noticeable generated anomalies, enabling generation of accurately-matched anomalous image-mask pairs. Extensive experiments demonstrate that our model significantly outperforms the state-of-the-art methods in generation authenticity and diversity, and effectively improves the performance of downstream anomaly inspection tasks. The code and data are available in https://github.com/sjtuplayer/anomalydiffusion.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is much more complicated compared to single-type DPR due to varied spatial features, the uncertainty of defects, and the number of defects present. To accurately predict the number of defects as well as the types of defects, we propose a novel compact deformable convolutional transformer (DC Transformer). Specifically, DC Transformer focuses on the global features present in the wafer map by virtue of learnable deformable kernels and multi-head attention to the global features. The proposed method succinctly models the internal relationship between the wafer maps and the defects. DC Transformer is evaluated on a real dataset containing 38 defect patterns. Experimental results show that DC Transformer performs exceptionally well in recognizing both single and mixed-type defects. The proposed method outperforms the current state of the models by a considerable margin

Mechanical defects in real situations affect observation values and cause abnormalities in multivariate time series, such as sensor values or network data. To perceive abnormalities in such data, it is crucial to understand the temporal context and interrelation between variables simultaneously. The anomaly detection task for time series, especially for unlabeled data, has been a challenging problem, and we address it by applying a suitable data degradation scheme to self-supervised model training. We define four types of synthetic outliers and propose the degradation scheme in which a portion of input data is replaced with one of the synthetic outliers. Inspired by the self-attention mechanism, we design a Transformer-based architecture to recognize the temporal context and detect unnatural sequences with high efficiency. Our model converts multivariate data points into temporal representations with relative position bias and yields anomaly scores from these representations. Our method, AnomalyBERT, shows a great capability of detecting anomalies contained in complex time series and surpasses previous state-of-the-art methods on five real-world benchmarks. Our code is available at https://github.com/Jhryu30/AnomalyBERT.

The advent of Industry 4.0 has precipitated the incorporation of Artificial Intelligence (AI) methods within industrial contexts, aiming to realize intelligent manufacturing, operation as well as maintenance, also known as industrial intelligence. However, intricate industrial milieus, particularly those relating to energy exploration and production, frequently encompass data characterized by long-tailed class distribution, sample imbalance, and domain shift. These attributes pose noteworthy challenges to data-centric Deep Learning (DL) techniques, crucial for the realization of industrial intelligence. The present study centers on the intricate and distinctive industrial scenarios of Nuclear Power Generation (NPG), meticulously scrutinizing the application of DL techniques under the constraints of finite data samples. Initially, the paper expounds on potential employment scenarios for AI across the full life-cycle of NPG. Subsequently, we delve into an evaluative exposition of DL's advancement, grounded in the finite sample perspective. This encompasses aspects such as small-sample learning, few-shot learning, zero-shot learning, and open-set recognition, also referring to the unique data characteristics of NPG. The paper then proceeds to present two specific case studies. The first revolves around the automatic recognition of zirconium alloy metallography, while the second pertains to open-set recognition for signal diagnosis of machinery sensors. These cases, spanning the entirety of NPG's life-cycle, are accompanied by constructive outcomes and insightful deliberations. By exploring and applying DL methodologies within the constraints of finite sample availability, this paper not only furnishes a robust technical foundation but also introduces a fresh perspective toward the secure and efficient advancement and exploitation of this advanced energy source.

This expository paper introduces a simplified approach to image-based quality inspection in manufacturing using OpenAI's CLIP (Contrastive Language-Image Pretraining) model adapted for few-shot learning. While CLIP has demonstrated impressive capabilities in general computer vision tasks, its direct application to manufacturing inspection presents challenges due to the domain gap between its training data and industrial applications. We evaluate CLIP's effectiveness through five case studies: metallic pan surface inspection, 3D printing extrusion profile analysis, stochastic textured surface evaluation, automotive assembly inspection, and microstructure image classification. Our results show that CLIP can achieve high classification accuracy with relatively small learning sets (50-100 examples per class) for single-component and texture-based applications. However, the performance degrades with complex multi-component scenes. We provide a practical implementation framework that enables quality engineers to quickly assess CLIP's suitability for their specific applications before pursuing more complex solutions. This work establishes CLIP-based few-shot learning as an effective baseline approach that balances implementation simplicity with robust performance, demonstrated in several manufacturing quality control applications.

The deployment of automated pavement defect detection is often hindered by poor cross-domain generalization. Supervised detectors achieve strong in-domain accuracy but require costly re-annotation for new environments, while standard self-supervised methods capture generic features and remain vulnerable to domain shift. We propose \ours, a self-supervised framework that visually probes target domains without labels. \ours introduces a Self-supervised Prompt Enhancement Module (SPEM), which derives defect-aware prompts from unlabeled target data to guide a frozen ViT backbone, and a Domain-Aware Prompt Alignment (DAPA) objective, which aligns prompt-conditioned source and target representations. Experiments on four challenging benchmarks show that \ours consistently outperforms strong supervised, self-supervised, and adaptation baselines, achieving robust zero-shot transfer, improved resilience to domain variations, and high data efficiency in few-shot adaptation. These results highlight self-supervised prompting as a practical direction for building scalable and adaptive visual inspection systems. Source code is publicly available: https://github.com/xixiaouab/PROBE/tree/main

Pavement defect detection faces critical challenges including limited annotated data, domain shift between training and deployment environments, and high variability in defect appearances across different road conditions. We propose RoadFusion, a framework that addresses these limitations through synthetic anomaly generation with dual-path feature adaptation. A latent diffusion model synthesizes diverse, realistic defects using text prompts and spatial masks, enabling effective training under data scarcity. Two separate feature adaptors specialize representations for normal and anomalous inputs, improving robustness to domain shift and defect variability. A lightweight discriminator learns to distinguish fine-grained defect patterns at the patch level. Evaluated on six benchmark datasets, RoadFusion achieves consistently strong performance across both classification and localization tasks, setting new state-of-the-art in multiple metrics relevant to real-world road inspection.

Visual anomaly detection, an important problem in computer vision, is usually formulated as a one-class classification and segmentation task. The student-teacher (S-T) framework has proved to be effective in solving this challenge. However, previous works based on S-T only empirically applied constraints on normal data and fused multi-level information. In this study, we propose an improved model called DeSTSeg, which integrates a pre-trained teacher network, a denoising student encoder-decoder, and a segmentation network into one framework. First, to strengthen the constraints on anomalous data, we introduce a denoising procedure that allows the student network to learn more robust representations. From synthetically corrupted normal images, we train the student network to match the teacher network feature of the same images without corruption. Second, to fuse the multi-level S-T features adaptively, we train a segmentation network with rich supervision from synthetic anomaly masks, achieving a substantial performance improvement. Experiments on the industrial inspection benchmark dataset demonstrate that our method achieves state-of-the-art performance, 98.6% on image-level AUC, 75.8% on pixel-level average precision, and 76.4% on instance-level average precision.

We present a transformer-based image anomaly detection and localization network. Our proposed model is a combination of a reconstruction-based approach and patch embedding. The use of transformer networks helps to preserve the spatial information of the embedded patches, which are later processed by a Gaussian mixture density network to localize the anomalous areas. In addition, we also publish BTAD, a real-world industrial anomaly dataset. Our results are compared with other state-of-the-art algorithms using publicly available datasets like MNIST and MVTec.

Pipeline integrity is critical to industrial safety and environmental protection, with Magnetic Flux Leakage (MFL) detection being a primary non-destructive testing technology. Despite the promise of deep learning for automating MFL interpretation, progress toward reliable models has been constrained by the absence of a large-scale public dataset and benchmark, making fair comparison and reproducible evaluation difficult. We introduce PipeMFL-240K, a large-scale, meticulously annotated dataset and benchmark for complex object detection in pipeline MFL pseudo-color images. PipeMFL-240K reflects real-world inspection complexity and poses several unique challenges: (i) an extremely long-tailed distribution over 12 categories, (ii) a high prevalence of tiny objects that often comprise only a handful of pixels, and (iii) substantial intra-class variability. The dataset contains 240,320 images and 191,530 high-quality bounding-box annotations, collected from 11 pipelines spanning approximately 1,480 km. Extensive experiments are conducted with state-of-the-art object detectors to establish baselines. Results show that modern detectors still struggle with the intrinsic properties of MFL data, highlighting considerable headroom for improvement, while PipeMFL-240K provides a reliable and challenging testbed to drive future research. As the first public dataset and the first benchmark of this scale and scope for pipeline MFL inspection, it provides a critical foundation for efficient pipeline diagnostics as well as maintenance planning and is expected to accelerate algorithmic innovation and reproducible research in MFL-based pipeline integrity assessment.

Industrial and medical anomaly detection faces critical challenges from data scarcity and prohibitive annotation costs, particularly in evolving manufacturing and healthcare settings. To address this, we propose CoZAD, a novel zero-shot anomaly detection framework that integrates soft confident learning with meta-learning and contrastive feature representation. Unlike traditional confident learning that discards uncertain samples, our method assigns confidence-based weights to all training data, preserving boundary information while emphasizing prototypical normal patterns. The framework quantifies data uncertainty through IQR-based thresholding and model uncertainty via covariance based regularization within a Model-Agnostic Meta-Learning. Contrastive learning creates discriminative feature spaces where normal patterns form compact clusters, enabling rapid domain adaptation. Comprehensive evaluation across 10 datasets spanning industrial and medical domains demonstrates state-of-the-art performance, outperforming existing methods on 6 out of 7 industrial benchmarks with notable improvements on texture-rich datasets (99.2% I-AUROC on DTD-Synthetic, 97.2% on BTAD) and pixellevel localization (96.3% P-AUROC on MVTec-AD). The framework eliminates dependence on vision-language alignments or model ensembles, making it valuable for resourceconstrained environments requiring rapid deployment.

Printed Circuit Board (PCB) assurance in the optical domain is a crucial field of study. Though there are many existing PCB assurance methods using image processing, computer vision (CV), and machine learning (ML), the PCB field is complex and increasingly evolving so new techniques are required to overcome the emerging problems. Existing ML-based methods outperform traditional CV methods, however they often require more data, have low explainability, and can be difficult to adapt when a new technology arises. To overcome these challenges, CV methods can be used in tandem with ML methods. In particular, human-interpretable CV algorithms such as those that extract color, shape, and texture features increase PCB assurance explainability. This allows for incorporation of prior knowledge, which effectively reduce the number of trainable ML parameters and thus, the amount of data needed to achieve high accuracy when training or retraining an ML model. Hence, this study explores the benefits and limitations of a variety of common computer vision-based features for the task of PCB component detection using semantic data. Results of this study indicate that color features demonstrate promising performance for PCB component detection. The purpose of this paper is to facilitate collaboration between the hardware assurance, computer vision, and machine learning communities.

We introduce a simple and intuitive self-supervision task, Natural Synthetic Anomalies (NSA), for training an end-to-end model for anomaly detection and localization using only normal training data. NSA integrates Poisson image editing to seamlessly blend scaled patches of various sizes from separate images. This creates a wide range of synthetic anomalies which are more similar to natural sub-image irregularities than previous data-augmentation strategies for self-supervised anomaly detection. We evaluate the proposed method using natural and medical images. Our experiments with the MVTec AD dataset show that a model trained to localize NSA anomalies generalizes well to detecting real-world a priori unknown types of manufacturing defects. Our method achieves an overall detection AUROC of 97.2 outperforming all previous methods that learn without the use of additional datasets. Code available at https://github.com/hmsch/natural-synthetic-anomalies.

Printed Circuit Boards are the foundation for the functioning of any electronic device, and therefore are an essential component for various industries such as automobile, communication, computation, etc. However, one of the challenges faced by the PCB manufacturers in the process of manufacturing of the PCBs is the faulty placement of its components including missing components. In the present scenario the infrastructure required to ensure adequate quality of the PCB requires a lot of time and effort. The authors present a novel solution for detecting missing components and classifying them in a resourceful manner. The presented algorithm focuses on pixel theory and object detection, which has been used in combination to optimize the results from the given dataset.

Detecting anomalies in images is an important task, especially in real-time computer vision applications. In this work, we focus on computational efficiency and propose a lightweight feature extractor that processes an image in less than a millisecond on a modern GPU. We then use a student-teacher approach to detect anomalous features. We train a student network to predict the extracted features of normal, i.e., anomaly-free training images. The detection of anomalies at test time is enabled by the student failing to predict their features. We propose a training loss that hinders the student from imitating the teacher feature extractor beyond the normal images. It allows us to drastically reduce the computational cost of the student-teacher model, while improving the detection of anomalous features. We furthermore address the detection of challenging logical anomalies that involve invalid combinations of normal local features, for example, a wrong ordering of objects. We detect these anomalies by efficiently incorporating an autoencoder that analyzes images globally. We evaluate our method, called EfficientAD, on 32 datasets from three industrial anomaly detection dataset collections. EfficientAD sets new standards for both the detection and the localization of anomalies. At a latency of two milliseconds and a throughput of six hundred images per second, it enables a fast handling of anomalies. Together with its low error rate, this makes it an economical solution for real-world applications and a fruitful basis for future research.

In this paper, we study a new problem, Film Removal (FR), which attempts to remove the interference of wrinkled transparent films and reconstruct the original information under films for industrial recognition systems. We first physically model the imaging of industrial materials covered by the film. Considering the specular highlight from the film can be effectively recorded by the polarized camera, we build a practical dataset with polarization information containing paired data with and without transparent film. We aim to remove interference from the film (specular highlights and other degradations) with an end-to-end framework. To locate the specular highlight, we use an angle estimation network to optimize the polarization angle with the minimized specular highlight. The image with minimized specular highlight is set as a prior for supporting the reconstruction network. Based on the prior and the polarized images, the reconstruction network can decouple all degradations from the film. Extensive experiments show that our framework achieves SOTA performance in both image reconstruction and industrial downstream tasks. Our code will be released at https://github.com/jqtangust/FilmRemoval.

Industrial Computer-Aided Design (CAD) code generation requires models to produce executable parametric programs from visual or textual inputs. Beyond recognizing the outer shape of a part, this task involves understanding its 3D structure, inferring engineering parameters, and choosing CAD operations that reflect how the part would be designed and manufactured. Despite the promise of Multimodal large language models (MLLMs) for this task, they are rarely evaluated on whether these capabilities jointly hold in realistic industrial CAD settings. We present BenchCAD, a unified benchmark for industrial CAD reasoning. BenchCAD contains 17,900 execution-verified CadQuery programs across 106 industrial part families, including bevel gears, compression springs, twist drills, and other reusable engineering designs. It evaluates models through visual question answering, code question answering, image-to-code generation, and instruction-guided code editing, enabling fine-grained analysis across perception, parametric abstraction, and executable program synthesis. Across 10+ frontier models, BenchCAD shows that current systems often recover coarse outer geometry but fail to produce faithful parametric CAD programs. Common failures include missing fine 3D structure, misinterpreting industrial design parameters, and replacing essential operations such as sweeps, lofts, and twist-extrudes with simpler sketch-and-extrude patterns. Fine-tuning and reinforcement learning improve in-distribution performance, but generalization to unseen part families remains limited. These results position BenchCAD as a benchmark for measuring and improving the industrial readiness of multimodal CAD automation.

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the introduction and comparison of new methods. In this paper, we published a synthesized PCB dataset containing 1386 images with 6 kinds of defects for the use of detection, classification and registration tasks. Besides, we proposed a reference based method to inspect and trained an end-to-end convolutional neural network to classify the defects. Unlike conventional approaches that require pixel-by-pixel processing, our method firstly locate the defects and then classify them by neural networks, which shows superior performance on our dataset.

Visual anomaly detection aims to identify anomalous regions in images through unsupervised learning paradigms, with increasing application demand and value in fields such as industrial inspection and medical lesion detection. Despite significant progress in recent years, there is a lack of comprehensive benchmarks to adequately evaluate the performance of various mainstream methods across different datasets under the practical multi-class setting. The absence of standardized experimental setups can lead to potential biases in training epochs, resolution, and metric results, resulting in erroneous conclusions. This paper addresses this issue by proposing a comprehensive visual anomaly detection benchmark, ADer, which is a modular framework that is highly extensible for new methods. The benchmark includes multiple datasets from industrial and medical domains, implementing fifteen state-of-the-art methods and nine comprehensive metrics. Additionally, we have proposed the GPU-assisted ADEval package to address the slow evaluation problem of metrics like time-consuming mAU-PRO on large-scale data, significantly reducing evaluation time by more than 1000-fold. Through extensive experimental results, we objectively reveal the strengths and weaknesses of different methods and provide insights into the challenges and future directions of multi-class visual anomaly detection. We hope that ADer will become a valuable resource for researchers and practitioners in the field, promoting the development of more robust and generalizable anomaly detection systems. Full codes are open-sourced at https://github.com/zhangzjn/ader.

This paper presents a comprehensive collection of industrial screw driving datasets designed to advance research in manufacturing process monitoring and quality control. The collection comprises six distinct datasets with over 34,000 individual screw driving operations conducted under controlled experimental conditions, capturing the multifaceted nature of screw driving processes in plastic components. Each dataset systematically investigates specific aspects: natural thread degradation patterns through repeated use (s01), variations in surface friction conditions including contamination and surface treatments (s02), diverse assembly faults with up to 27 error types (s03-s04), and fabrication parameter variations in both upper and lower workpieces through modified injection molding settings (s05-s06). We detail the standardized experimental setup used across all datasets, including hardware specifications, process phases, and data acquisition methods. The hierarchical data model preserves the temporal and operational structure of screw driving processes, facilitating both exploratory analysis and the development of machine learning models. To maximize accessibility, we provide dual access pathways: raw data through Zenodo with a persistent DOI, and a purpose-built Python library (PyScrew) that offers consistent interfaces for data loading, preprocessing, and integration with common analysis workflows. These datasets serve diverse research applications including anomaly detection, predictive maintenance, quality control system development, feature extraction methodology evaluation, and classification of specific error conditions. By addressing the scarcity of standardized, comprehensive datasets in industrial manufacturing, this collection enables reproducible research and fair comparison of analytical approaches in an area of growing importance for industrial automation.

Visual surface anomaly detection aims to detect local image regions that significantly deviate from normal appearance. Recent surface anomaly detection methods rely on generative models to accurately reconstruct the normal areas and to fail on anomalies. These methods are trained only on anomaly-free images, and often require hand-crafted post-processing steps to localize the anomalies, which prohibits optimizing the feature extraction for maximal detection capability. In addition to reconstructive approach, we cast surface anomaly detection primarily as a discriminative problem and propose a discriminatively trained reconstruction anomaly embedding model (DRAEM). The proposed method learns a joint representation of an anomalous image and its anomaly-free reconstruction, while simultaneously learning a decision boundary between normal and anomalous examples. The method enables direct anomaly localization without the need for additional complicated post-processing of the network output and can be trained using simple and general anomaly simulations. On the challenging MVTec anomaly detection dataset, DRAEM outperforms the current state-of-the-art unsupervised methods by a large margin and even delivers detection performance close to the fully-supervised methods on the widely used DAGM surface-defect detection dataset, while substantially outperforming them in localization accuracy.