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Oct 16

Analysis of grid instabilities in particle-in-cell codes based on a meshfree approach

A new method of analyzing grid, or aliasing, instabilities is described, in particle-in-cell (PIC) codes for plasma kinetic theory. It starts with a meshfree approach with N_{p} macroparticles, with N_{p}<infty. Linearization of these equations is done about a uniform density non-drifting equilibrium prescribed by macroparticles on a uniform lattice. Macroparticle positions perturbations are induced about this lattice. The resulting linear equations are analyzed for stability and dispersion relations. The linearized equations are then discretized on a grid of N_{g} points with N_{g} le N_{p}, in both momentum conserving (MCP) and energy conserving (ECP) formulations. For a cold stationary plasma, this leads a dynamical matrix. For ECP, the matrix is symmetric and positive definite (SPD) and immediately shows stability. For MCP, the dynamical matrix is neither symmetric nor positive definite, preventing immediate conclusions on stability. For both MCP and ECP and for a cold stationary plasma, the resulting matrix elements vary relative to the meshfree value, a result of aliasing. This deviation is periodic in the displacement of the particle lattice relative to the grid. In the MCP discretization, eigenvalues occur in complex conjugate pairs for general placement of the particle lattice relative to the grid. These conjugate pairs indicate nonnegative growth rates. The nature of the aliasing is studied and shown to be related to the trapezoidal rule error over the grid. The scaling of the linear growth rates with respect to N_{g} and especially with respect to N_{ppc} is studied. These analytical results are compared with PIC simulations and found to be in excellent agreement. The connection with a cold drifting beam is discussed briefly, specifically, grid-induced instabilities for both the MCP and ECP.

  • 2 authors
·
Sep 30

Impact of local bunching factors in single-pass THz free electron lasers

In simulations for modern free-electron lasers (FEL), shot noise plays a crucial role. While it is inversely proportional to the number of electrons, shot noise is typically modeled using macroparticles, with their bunching factors corresponding to the bunching factors of the much larger number of electrons. For short-wavelength FELs, the macroparticles are assumed to be uniformly distributed on the scale of the resonant wavelength, since shot noise dominates the initial radiation - for instance, in the self-amplified spontaneous emission (SASE) regime. In this paper, we show that this assumption does not hold at longer wavelengths, particularly in the THz range, where the bunch current profile is not uniform even within the length of the resonant wavelength. Instead, the current profile dominates the initial bunching factors, which can be several orders of magnitude higher than shot noise. The slice-based bunching factors and bunching phases are derived for Gaussian distributions and compared with shot noise under the assumption that the current within each slice remains constant. Using the THz FEL at the photoinjector test facility at DESY in Zeuthen (PITZ) as a case study, the influence of the current profile has been benchmarked through simulations under very low bunch charge, where the full number of electrons can be modeled using the Genesis1.3 code. Additional simulations with the nominal working parameters of PITZ THz FEL have been compared with experimental data, indicating better agreement when the actual current profile is taken into account.

  • 2 authors
·
Dec 1, 2025