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Mar 13

Geological Everything Model 3D: A Promptable Foundation Model for Unified and Zero-Shot Subsurface Understanding

Understanding Earth's subsurface is critical for energy transition, natural hazard mitigation, and planetary science. Yet subsurface analysis remains fragmented, with separate models required for structural interpretation, stratigraphic analysis, geobody segmentation, and property modeling-each tightly coupled to specific data distributions and task formulations. We introduce the Geological Everything Model 3D (GEM), a unified generative architecture that reformulates all these tasks as prompt-conditioned inference along latent structural frameworks derived from subsurface imaging. This formulation moves beyond task-specific models by enabling a shared inference mechanism, where GEM propagates human-provided prompts-such as well logs, masks, or structural sketches-along inferred structural frameworks to produce geologically coherent outputs. Through this mechanism, GEM achieves zero-shot generalization across tasks with heterogeneous prompt types, without retraining for new tasks or data sources. This capability emerges from a two-stage training process that combines self-supervised representation learning on large-scale field seismic data with adversarial fine-tuning using mixed prompts and labels across diverse subsurface tasks. GEM demonstrates broad applicability across surveys and tasks, including Martian radar stratigraphy analysis, structural interpretation in subduction zones, full seismic stratigraphic interpretation, geobody segmentation, and property modeling. By bridging expert knowledge with generative reasoning in a structurally aware manner, GEM lays the foundation for scalable, human-in-the-loop geophysical AI-transitioning from fragmented pipelines to a vertically integrated, promptable reasoning system. Project page: https://douyimin.github.io/GEM

  • 7 authors
·
Jul 1, 2025

Deep Open-Set Recognition for Silicon Wafer Production Monitoring

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

  • 5 authors
·
Aug 30, 2022

DRAEM -- A discriminatively trained reconstruction embedding for surface anomaly detection

Visual surface anomaly detection aims to detect local image regions that significantly deviate from normal appearance. Recent surface anomaly detection methods rely on generative models to accurately reconstruct the normal areas and to fail on anomalies. These methods are trained only on anomaly-free images, and often require hand-crafted post-processing steps to localize the anomalies, which prohibits optimizing the feature extraction for maximal detection capability. In addition to reconstructive approach, we cast surface anomaly detection primarily as a discriminative problem and propose a discriminatively trained reconstruction anomaly embedding model (DRAEM). The proposed method learns a joint representation of an anomalous image and its anomaly-free reconstruction, while simultaneously learning a decision boundary between normal and anomalous examples. The method enables direct anomaly localization without the need for additional complicated post-processing of the network output and can be trained using simple and general anomaly simulations. On the challenging MVTec anomaly detection dataset, DRAEM outperforms the current state-of-the-art unsupervised methods by a large margin and even delivers detection performance close to the fully-supervised methods on the widely used DAGM surface-defect detection dataset, while substantially outperforming them in localization accuracy.

  • 3 authors
·
Aug 17, 2021