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Utilizing_Generative_AI_for_automated_wafer_defect_inspection
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Utilizing_Generative_AI_for_automated_wafer_defect_inspection
760 kB
1 contributor
History:
14 commits
Thien Huynh
update: version 1.1
142c696
almost 2 years ago
app_pages
update: version 1.1
almost 2 years ago
.gitattributes
1.52 kB
initial commit
almost 2 years ago
README.md
298 Bytes
initial commit
almost 2 years ago
Saitama_Team_Presentation_Page1.png
147 kB
update: version 2
almost 2 years ago
Saitama_Team_Presentation_Page2.png
511 kB
update: version 1.1
almost 2 years ago
app.py
449 Bytes
update: version 2
almost 2 years ago
multipage.py
2.34 kB
update: version 2
almost 2 years ago
packages.txt
14 Bytes
add: packages.txt for activate custom package install
almost 2 years ago
requirements.txt
31 Bytes
update: version 2
almost 2 years ago
w3.jpg
95.7 kB
Initialization
almost 2 years ago
