hash stringlengths 32 32 | doc_id stringlengths 5 12 | section stringlengths 5 1.47k | content stringlengths 0 6.67M |
|---|---|---|---|
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.13: Parameters of the transmitted signal for modulation accuracy for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0,... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4.2 Procedure | Common with 3.84 Mcps Chip rate TDD option |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, so the number of timeslot i should be 0, 1,…,6. The structure of subframe is shown in section 7.2.1 of TR 25.928. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2 Peak code domain error | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.14: Parameters of the transmitted signal for Peak code domain error for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i =... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4.2 Procedure | Common with 3.84 Mcps Chip rate TDD option |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4 Receiver characteristics | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.1 General | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2 Reference sensitivity level | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.2 Conformance requirements | For the measurement channel specified in Annex 8.A.2.1, the reference sensitivity level and performance of the BS shall be as specified in table section 6.3.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) Common with the 3.84 Mcps chip rate
3) Common with the 3.84 Mcps chip rate.
4) The level of BS tester output signal measured at the BS antenna connector shall be adjusted to -110 dBm. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4.2 Procedure | Common with 3.84 Mcps chip rate TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.6 Explanation difference | There is no difference in the test method and test procedure between high chip rate TDD and low chip rate TDD, however the requirement is changed according to section 6.3.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3 Dynamic range | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.2 Conformance requirements | The BER shall not exceed 0,001 for the parameters specified in table in section 6.3.3 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) The level of the BS tester output signal measured at the BS antenna connector shall be adjusted as specified in table in subclause 8.4.3.2
3) The power spectral density of the band-limited white noise source measured at the BS antenna connector shall be adjusted as specified in... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.4.2 Procedure | Common with 3.84 Mcps chip rate TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.5 Test requirement | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.6 Explanation difference | Due to the smaller bandwidth in low chip rate TDD the bandwidth of the white noise source is changed. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4 Adjacent Channel Selectivity (ACS) | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.2 Conformance requirements | The BER, measured on the wanted signal in the presence of an interfering signal, shall not exceed 0,001 for the parameters specified in table in section 6.3.4 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.4.1 Initial conditions | Common with the 3.84 Mcps chip rate
Common with the 3.84 Mcps chip rate
Start transmission from the BS tester to the BS using the UL reference measurement channel (12.2 kbps) defined in Annex C.3.The level of the UE simulator signal measured at the BS antenna connector shall be adjusted to the value specified in table ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.4.2 Procedure | 1) Set the center frequency of the interfering signal to 1,6 MHz above the assigned channel frequency of the wanted signal.
2) Measure the BER of the wanted signal at the BS receiver.
3) Set the center frequency of the interfering signal to 1,6 MHz below the assigned channel frequency of the wanted signal.
4) Measure t... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.5 Test requirements | The BER measured according subclause 8.4.4.4.2 to shall not exceed 0,001. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.6 Explanation difference | Because bandwidth of 1.28 Mcps TDD option is 1,6MHz, the frequency offset of the interfering singal should be 1,6MHz. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5 Blocking characteristics | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.1 Definition and applicability | The blocking characteristics is a measure of the receiver ability to receive a wanted signal at its assigned channel frequency in the presence of an unwanted interferer on frequencies other than those of the adjacent channels. The blocking performance shall apply at all frequencies as specified in tables in section 6.3... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.2 Conformance requirements | The static reference performance as specified in the section 6.3.2 of TR 25.945 should be met with a wanted and an interfering signal coupled to the BS antenna input using the parameters specified in tables in section 6.3.5 of TR 25.945 respectively, using a 1 MHz step size.. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.3 Test purpose | The test stresses the ability of the BS receiver to withstand high-level interference from unwanted signals at frequency offsets of 3.2 MHz or more, without undue degradation of its sensitivity. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.4.1 Initial conditions | 1) Connect an UE simulator operating at the assigned channel frequency of the wanted signal and a signal generator to the antenna connector of one Rx port.
2) Terminate or disable any other Rx port not under test.
3) Start transmission from the BS tester to the BS using the UL reference measurement channel (12.2 kbps) ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.4.2 Procedure | 1) Set the signal generator to produce an interfering signal at a frequency offset Fuw from the assigned channel frequency of the wanted signal which is given by
Fuw = (n x 1 MHz),
where n shall be increased in integer steps from n = 10 up to such a value that the center frequency of the interfering signal covers the... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.5 Test requirements | In all measurements made according to subclause 8.4.5.4.2, the BER shall not exceed 0,001. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.6 Explanation difference | Because the chip rate of the wanted signal is 1.28 Mcps, the type of the interfering signal is either equivalent to a continuous narrow band CDMA signal with one code of chip frequency 1.28 Mchip/s. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6 Intermodulation characteristics | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6.2 Conformance requirements | The static reference performance as specified in clause 8.4.2 of TR 25.945 should be met when the following signals are coupled to the BS antenna input.
A wanted signal at the assigned channel frequency, 6 dB above the static reference level.
Two interfering signals with the parameters specified in following table.
Tab... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6.4.1 Initial conditions | 1) Common with 3.84 Mcps chip rate TDD option.
2) Common with 3.84 Mcps chip rate TDD option.
3) Start transmission from the BS tester to the BS using the UL reference measurement channel (12.2 kbps) defined in Annex 8.A.2 of TR 25.945 The level of the UE simulator signal measured at the BS antenna connector shall be s... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6.4.2 Procedure | 1) The frequency of the first and the second signal generator shall be set to 3,2 MHz and 6,4 MHz, respectively, above the assigned channel frequency of the wanted signal.
2) Measure the BER of the wanted signal at the BS receiver.
3) The frequency of the first and the second signal generator shall be set to 3,2 MHz an... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6.5 Test requirements | The BER measured according subclause 8.4.6.4.2 to shall not exceed 0,001. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.6.6 Explanation difference | Because the bandwidth of 1.28 Mcps TDD is 1,6MHz, the frequency offsets of first and second interference signal should be 3,2MHz and 6,4MHz respectively. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7 Spurious emissions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7.2 Conformance requirements | The power of any spurious emission shall not exceed the values given in table in section 6.3.7 of TR 25.945 |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7.3 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) Common with the 3.84 Mcps chip rate
3) Common with the 3.84 Mcps chip rate
4) Set the BS to transmit a signal with parameters according to following table.
5) Common with the 3.84 Mcps chip rate
Table 8.16: Parameters of the transmitted signal for Rx spurious emissions test
Par... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7.4.2 Procedure | 1) Measure the power of the spurious emissions by applying the measuring equipment with the settings as specified in following table. The characteristics of the measurement filter with the bandwidth 1.28 MHz shall be RRC with roll-off = 0,22. The characteristics of the measurement filters with bandwidths 100 kHz and ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7.5 Test requirements | The spurious emissions measured according to subclause 8.4.7.4.2 shall not exceed the limits specified in subclause 8.4.7.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.7.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measur... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5 Performance requirements | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.1 General | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2 Demodulation in static propagation conditions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1 Demodulation of DCH | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1.1 Definition and applicability | Common with 3.84 Mcps TDD. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1.2 Conformance requirements | For the parameters specified in table 8.18, the BLER should not exceed the piece-wise linear BLER curve specified in table 8.19.
Table 8.18: Parameters in static propagation conditions for 1.28 Mcps TDD option
Parameters
Unit
Test 1
Test 2
Test 3
Test 4
Number of DPCHo
4
1
1
0
Spread factor of DPCHo
8
8
8
dB
-7
-7
-7
–... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1.4.1 Initial conditions | Connect the BS tester (UE simulator) generating the wanted signal and a set of interference generators to both BS antenna connectors for diversity reception via a combining network. The set of interference generators comprises a number of CDMA generators, each representing an individual intracell interferer (subsequent... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1.4.2 Procedure | 1) Adjust the power of the band-limited white noise source in such a way that its power spectral density measured at the BS antenna connector takes on the value Ioc as specified in table 8.18.
2) For a given test defined by the information data rate and the BLER objective, set the power of each DPCH0 measured at the BS... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1.5 Test requirements | The BLER measured according to subclause 8.5.2.1.4.2 shall not exceed the limits specified in table 8.19. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.2.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928). Considering the chip rate, the burst structure of 1.28 Mcps TDD for normal traffic is different from that of 3.84 Mcps TDD option, (the bur... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3 Demodulation of DCH in multipath fading conditions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1 Multipath fading Case 1 | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1.2 Conformance requirements | For the parameters specified in table 8.21, the BLER should not exceed the piece-wise linear BLER curve specified in table 8.22.
Table 8.21: Parameters multipath Case 1 channel for 1.28 Mcps TDD option
Parameters
Unit
Test 1
Test 2
Test 3
Test 4
Number of DPCHo
4
1
1
0
Spread factor of DPCHo
8
8
8
dB
-7
-7
-7
–
Ioc
dBm... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1.4.1 Initial conditions | 1) Connect the BS tester (UE simulator) generating the wanted signal and a set of interference generators to both BS antenna connectors for diversity reception via a combining network. The set of interference generators comprises a number of CDMA generators, each representing an individual intracell interferer (subsequ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1.4.2 Procedure | 1) Adjust the power of the band-limited white noise source in such a way that its power spectral density measured at the BS antenna connector takes on the value Ioc as specified in table 8.21.
2) For a given test defined by the information data rate and the BLER objective, set the power of each DPCH0 measured at the BS... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1.5 Test requirements | The BLER measured according to subclause 8.5.3.1.4.2 shall not exceed the limits specified in table 8.22. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928). Considering the chip rate, the burst structure of 1.28 Mcps TDD for normal traffic is different from that of 3.84 Mcps TDD option, (the bur... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2 Multipath fading Case 2 | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2.1 Definition and applicabily | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2.2 Conformance requirements | For the parameters specified in table 8.24, the BLER should not exceed the piece-wise linear BLER curve specified in table 8.25.
Table 8.24: Parameters multipath Case 2 channel for 1.28 Mcps TDD option
Parameters
Unit
Test 1
Test 2
Test 3
Test 4
Number of DPCHo
4
1
1
0
Spread factor of DPCHo
8
8
8
dB
-7
-7
-7
–
Ioc
dBm... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2.4.1 Initial conditions | 1) Connect the BS tester (UE simulator) generating the wanted signal and a set of interference generators to both BS antenna connectors for diversity reception via a combining network. The set of interference generators comprises a number of CDMA generators, each representing an individual intracell interferer (subsequ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2.4.2 Procedure | 1) Adjust the power of the band-limited white noise source in such a way that its power spectral density measured at the BS antenna connector takes on the value Ioc as specified in table 8.24.
2) For a given test defined by the information data rate and the BLER objective, set the power of each DPCH0 measured at the BS... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2.5 Test requirements | The BLER measured according to subclause 8.5.3.2.4.2 shall not exceed the limits specified in table 8.25. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.5.3.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928). Considering the chip rate, the burst structure of 1.28 Mcps TDD for normal traffic is different from that of 3.84 Mcps TDD option, (the bur... |
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