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1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the Structure of subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6.
For the 1.28 Mcps chip rate TDD option, each TS consists of 864 chips,... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3 Power control dynamic range | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the initial parameters of the transmitted signal according to the following table.
3) Common with the 3.84 Mcps chip rate
4) Common with the 3.84 Mcps chip rate
Table 8.4: Parameters of the transmitted signal for Power control dynamic ran... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.4.2 Procedure | 1) Common with 3.84 Mcps chip rate TDD option.
2) Set the BS tester to produce a sequence of TPC commands related to the active DPCH, with content "Increase Tx power". This sequence shall be sufficiently long so that the transmit output power of the active DPCH is controlled to reach its maximum, and shall be transmitt... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6.
For the 1.28 Mcps chip rate TDD option, each TS consists of 864 ch... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4 Minimum transmit power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
3) Common with the 3.84 Mcps chip rate
4) Common with the 3.84 Mcps chip rate
Table 8.5: Parameters of the transmitted signal for Minimum transmit power test for 1... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.4.2 Procedure | 1) Common with 3.84 Mcps chip rate TDD option.
2) Set the BS tester to produce a sequence of TPC commands related to all active DPCH, with content "Decrease Tx power". This sequence shall be sufficiently long so that the transmit output power of all active DPCH is controlled to reach its minimum, and shall be transmitt... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in Section 7.2.1 of TR 25.928.So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measure... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5 Primary CCPCH power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.1 Definition and applicabilily | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.2 Conformance requirement | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.6: Parameters of the BS transmitted signal for Primary CCPCH power testing for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.4.2 Procedure | 1) Measure the PCCPCH power in TS 0 by applying the global in-channel Tx test method described in Annex H.
2) Reduce the base station output power by 2 dB, 5 dB and 13 dB, without changing the relative powers of the PCCPCH, and repeat step (1) for each output power setting. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.5 Test requirement | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6.
In 1.28 Mcps TDD option, likely scenario is that TS 0 is only used for broad... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5 Transmit ON/OFF power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1 Transmit OFF power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.2 Conformance requirements | The transmit OFF power shall be less than –82 dBm measured with a filter that has a Root-Raised Cosine (RRC) filter response with a roll-off = 0,22 and a bandwidth equal to the chip rate. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4.1 Initial conditions | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.4.1 for initial conditions. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4.2 Procedure | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.4.2 for procedure. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.5 Test requirements | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.5 for test requirements. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2 Transmit ON/OFF time mask | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.1 Definition and applicability | Common with 3.84 Mcps TDD. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.2 Conformance requirements | The transmit power level versus time should meet the mask specified in figure 8.1.
Figure 8.1: Transmit ON/OFF template for 1.28 Mcps TDD
The reference for this requirement is subclause 6.2.5.2 of this Technique Report. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.3 Test purpose | Common with 3.84 Mcps TDD |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4.1 Initial conditions | 1) Connect the power measuring equipment to the BS antenna connector.
2) Set the parameters of the transmitted signal according to table 8.7.
Table 8.7: Parameters of the transmitted signal for transmit ON/OFF time mask test for 1.28 Mcps TDD
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, 4, 5, 6:
tra... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4.2 Procedure | Measure the power of the BS output signal chipwise (i.e. averaged over time intervals of one chip duration) over the transmit off power period starting 11 chips before the start of the receive time slot TS i = UpPCH, and ending 8 chips before the next transmit time slot TS i = 4 starts, and with a measurement filter th... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.5 Test requirements | Each value of the power measured according to subclause 8.3.5.2.4.2 shall be below the limits defined in figure 8.3.5.2.2.1 of subclause 8.3.5.2.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the subframe is shown in section7.2.1 of 3GPP TR 25.928, so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement ch... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6 Output RF spectrum emissions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1 Occupied bandwidth | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.2 Conformance requirements | The occupied bandwidth shall be less than 1,6 MHz based on a chip rate of 1.28 Mcps. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.8: Parameters of the transmitted signal for occupied bandwidth test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i =... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4.2 Procedure | 1) Measure the power of the transmitted signal with a measurement filter of bandwidth 30 kHz. The characteristic of the filter shall be approximately Gaussian (typical spectrum analyzer filter). The center frequency of the filter shall be stepped in contiguous 30 kHz steps from a minimum frequency, which shall be (2,4 ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measur... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2 Out of band emission | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1 Spectrum emission mask | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.1 Definition and applicability | For 1.28 Mcps chip rate TDD option, the spectrum emission mask specifies the limit of the transmitter out of band emissions at frequency offsets from the assigned channel frequency of the wanted signal between 0,8 MHz and 4,0 MHz. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.2 Conformance requirements | Emissions shall not exceed the maximum level specified in tables in Section 6.2.6.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.3 Test purpose | The test purpose is to verify that the BS out of band emissions do not result in undue interference to any other system (wideband, narrowband) operating at frequencies close to the assigned channel bandwidth of the wanted signal.
This test is independent of the characteristics of possible victim systems and, therefore,... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.9: Parameters of the transmitted signal for spectrum emission mask test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i;... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4.2 Procedure | Measure the power of the BS spectrum emissions by applying measurement filters with bandwidths as specified in the relevant table in subclause 8.3.6.2.1.2. The characteristic of the filters shall be approximately Gaussian (typical spectrum analyzer filters). The center frequency of the filter shall be stepped in contig... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.5 Test requirements | The spectrum emissions measured according to subclause 8.3.6.2.1.4.2 shall be within the mask defined in the relevant table of subclause 8.3.6.2.1.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measur... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2 Adjacent Channel Leakage power Ratio (ACLR) | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.2 Conformance requirements | The ACLR shall be equal to or greater than the limits given in Tables in section 6.2.6.2.2 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.10: Parameters of the transmitted signal for ACLR test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4.2 Procedure | 1) Measure transmitted power over the 848 active chips of the time slots TS i=0,4,5,6 (this excludes the guard period), and with a measurement filter that has a RRC filter response with a roll off = 0,22 and a bandwidth equal to the chip rate. The power is determined by calculating the RMS value of the signal samples... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.5 Test requirements | The ACLR calculated in step (5) of subclause 8.3.6.2.2.4.2 shall be equal or greater than the limits given in table 6.5 in section 6.2.6.2.2. In case of operation in proximity to or co-siting with TDD BS or FDD BS operating on an adjacent frequency, the interference power calculated in (4) shall be equal or less than t... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel f... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3 Spurious emissions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.1 Definition and applicability | Spurious emissions are emissions which are caused by unwanted transmitter effects such as harmonics emission, parasitic emission, intermodulation products and frequency conversion products, but exclude out of band emissions. This is measured at the base station RF output port.
The requirements in this subclause shall a... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.2 Conformance requirements | The requirements of either subclause 6.2.6.3.1 or subclause 6.2.6.3.2 shall apply whatever the type of transmitter considered (single carrier or multi-carrier). It applies for all transmission modes foreseen by the manufacturer.
Either requirement applies at frequencies within the specified frequency ranges which are m... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.3 Test purpose | The test purpose is to verify the ability of the BS to limit the interference caused by unwanted transmitter effects to other systems operating at frequencies which are more than 4 MHz away from of the UTRA band used. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.11: Parameters of the transmitted signal for spurious emissions for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4.2 Procedure | Measure the power of the spurious emissions by applying measurement filters with bandwidths as specified in the relevant tables of 8.3.6.3.2. The characteristic of the filters shall be approximately Gaussian (typical spectrum analyzer filters). The center frequency of the filter shall be stepped in contiguous steps ove... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.5 Test requirements | The spurious emissions measured according to subclause 8.3.6.3.4.2 shall not exceed the limits specified in the relevant tables of 8.3.6.3.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement c... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7 Transmit intermodulation | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.1 Definition and applicability | The transmit intermodulation performance is a measure of the capability of the transmitter to inhibit the generation of signals in its non linear elements caused by presence of the wanted signal and an interfering signal reaching the transmitter via the antenna.
The transmit intermodulation level is the power of the in... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.2 Conformance requirements | The transmit intermodulation level shall not exceed the out of band or the spurious emission requirements of subclause 8.3.6.2 and 8.3.6.3, respectively. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.3 Test purpose | The test purpose is to verify the ability of the BS transmitter to restrict the generation of intermodulation products in its non linear elements caused by presence of the wanted signal and an interfering signal reaching the transmitter via the antenna to below specified levels. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.12: Parameters of the transmitted signal for transmit intermodulation for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4.2 Procedure | Apply the test procedures for out of band and spurious emissions as described in 8.3.6.2 and 8.3.6.3, respectively. The frequency band occupied by the interference signal are excluded from the measurements. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.5 Test requirements | The conformance requirements for out of band and spurious emissions as specified in 8.3.6.2 and 8.3.6.3 shall be met. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL refere... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8 Transmit Modulation | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1 Modulation accuracy | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.1 Definition and applicability | The modulation accuracy is a measure of the difference between the measured waveform and the theoretical modulated waveform (the error vector). A quantitative measure of the modulation accuracy is the error vector magnitude (EVM) which is defined as the square root of the ratio of the mean error vector power to the mea... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4 Method of test |
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