text stringlengths 0 43 |
|---|
i.e. O |
, O |
reduced O |
surface B-PRO |
roughness E-PRO |
) O |
. O |
In O |
addition O |
, O |
the O |
fractographic B-CHAR |
analysis E-CHAR |
of O |
the O |
specimen O |
indicated O |
although O |
the O |
crack O |
tends O |
to O |
initiate O |
in O |
the O |
surface S-CONPRI |
of O |
both O |
as S-MATE |
fabricated O |
and O |
cold O |
sprayed S-MANP |
specimens O |
, O |
the O |
mechanism S-CONPRI |
of O |
crack B-CONPRI |
growth E-CONPRI |
differs O |
notably O |
following O |
the O |
CS O |
coating S-APPL |
. O |
While O |
the O |
cracks O |
tend O |
to O |
propagate O |
in O |
the O |
planes O |
parallel O |
or O |
with O |
a O |
small O |
deviation O |
from O |
the O |
build B-PARA |
layers E-PARA |
of O |
the O |
AM S-MANP |
produced O |
specimens O |
, O |
deposition S-CONPRI |
of O |
CrC-Ni O |
coating S-APPL |
increased O |
the O |
deviation O |
of O |
crack B-CONPRI |
growth E-CONPRI |
plane O |
from O |
the O |
build B-PARA |
layers E-PARA |
of O |
the O |
substrate S-MATE |
. O |
Electromagnetic O |
wave O |
based O |
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