Datasets:
akumar33
/
manufacturing

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. O
It O
is O
shown O
that O
this O
can O
be S-MATE
avoided O
by O
a O
correction O
strategy O
, O
which O
consists O
in O
manufacturing S-MANP
the O
part O
once O
, O
evaluating O
the O
size O
of O
voids S-CONPRI
in O
the O
junctions S-APPL
, O
and O
computing O
a O
correction O
to O
deposit O
the O
required O
amount O
of O
material S-MATE
into O
the O
center O
of O
the O
junction S-APPL
. O
While O
this O
strategy O
may O
be S-MATE
used O
if O
a O
single O
part O
is O
considered O
, O
it O
is O
shown O
that O
the O
tool B-CONPRI
path E-CONPRI
correction O
to O
be S-MATE
applied O
to O
arbitrary O
junction S-APPL
geometries S-CONPRI
can O
be S-MATE
represented O
by O
a O
neural B-CONPRI
network E-CONPRI
that O
is O
derived O
from O
an O
experimental S-CONPRI
database S-ENAT
consisting O
of O
representative O
junction S-APPL
types O