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>> *Subject:* [labnetwork] Strange "sample memory" with LOR 5B |
>> |
>> |
>> |
>> Hello everyone, |
>> |
>> |
>> |
>> While working on a recipe for LOR 5B/AZ 1512 in our automatic development |
>> system, I encountered some intriguing effects when reusing wafers for my |
>> tests. This could be a problem for our users when developing their own |
>> process, so we'd appreciate it if anyone could help us to understand what |
>> is going on. |
>> |
>> |
>> |
>> Below is a picture of a sample right before exposure, taken using our |
>> MLA150. The dark/bright features you see are NOT etched on the wafer (these |
>> wafers were never etched). The marks are from a previous lithography test. |
>> They become apparent after coating the sample with LOR 5B and even more |
>> after adding AZ 1512. And I don't see them when coating only with AZ 1512 |
>> (I reused wafers for that process development without any issues). |
>> |
>> And what is more intriguing is that these features affect |
>> exposure/development of my test mask. For instance, on a virgin sample I |
>> can expose and auto-develop with the same recipe (dose and development |
>> time) I use for the manual process. On a reused sample, the reisst stack |
>> behaves as if it were underexposed (a dose test made this very obvious). |
>> |
>> |
>> |
>> Here are the steps during my tests: |
>> |
>> 1. Piranha clean |
>> 2. HMDS prime on a YES oven |
>> 3. Spin-coat with LOR 5B/AZ 1512 (marks show up on a reused sample) |
>> 4. Expose using either a mask aligner or DWL |
>> 5. Auto-develop in our Laurell EDC-650 (resist seems underexposed |
>> over the marks) |
>> |
>> |
>> 1. AZ Developer 1:1 ? 90 s |
>> 2. Rinse (DI water) and dry (N2+spin) ? 60-120 s |
>> 3. MF-319 ? 5 s |
>> 4. Rinse (DI water) and dry (N2+spin) ? 60-120 s |
>> |
>> |
>> 1. Strip resist with Remover PG |
>> 2. Repeat all steps for every iteration |
>> |
>> At first I thought that this could actually be some etching of my Si |
>> wafers by MF-319, even though unlikely given the low TMAH concentration |
>> (and I'm not sure why that would affect exposure/development). But the |
>> sample in the image above has 2 ?m thermal oxide, so practically impervious |
>> to TMAH. Not to mention that the brightest crossing marks come from testing |
>> a recipe where TMAH was not used at all. This must be some strange |
>> interaction between LOR 5B and the sample surface, which I'd expect to be |
>> practically reset after piranha and HMDS priming. |
>> |
>> |
>> |
>> My search for more information regarding LOR 5B and it's sensitivity to |
>> surface conditions has proven fruitless so far. And requiring a brand new |
>> sample for every iteration can get expensive quite quickly. We'd appreciate |
>> it if you could point us to some references where this was discussed in any |
>> form, or if you know of a method to avoid this from happening. |
>> |
>> |
>> |
>> I'm sorry for the long email, and thank you in advance for any comments. |
>> |
>> |
>> |
>> Best regards, |
>> |
>> -- |
>> Gustavo de Oliveira Luiz, PhD |
>> Applications/Research Specialist |
>> nanoFAB, University of Alberta |
>> +1 (780) 619-1463 |
>> |
> |
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From sostrow at stanford.edu Tue May 9 21:29:56 2023 |
From: sostrow at stanford.edu (Sara Ostrowski) |
Date: Wed, 10 May 2023 01:29:56 +0000 |
Subject: [labnetwork] Stanford University - Job opening - Scanning Probe |
Microscopy Support Scientist |
In-Reply-To: <SN4PR0201MB872656E397A88759E78DE4C5C6779@SN4PR0201MB8726.namprd02.prod.outlook.com> |
References: <BY5PR02MB6883B77BC70855F8C8E738BEA7769@BY5PR02MB6883.namprd02.prod.outlook.com> |
<SN4PR0201MB8726486D092A2DFE7202D8E2C6769@SN4PR0201MB8726.namprd02.prod.outlook.com> |
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